Paul Fewster

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Brighton, GB

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Patents Grantslast 30 patents

Information Patent Grant
Diffractometer
- Patent number 8,488,740
- Issue date Jul 16, 2013
- PANalytical B.V.
- Paul Fewster
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray diffraction apparatus and method
- Patent number 7,242,743
- Issue date Jul 10, 2007
- Panalytical B.V.
- Paul Frederick Fewster
- G01 - MEASURING TESTING
Information Patent Grant
Determination of material parameters
- Patent number 6,823,043
- Issue date Nov 23, 2004
- PANalytical B.V.
- Paul F. Fewster
- G01 - MEASURING TESTING
Information Patent Grant
X-ray diffractometer
- Patent number 6,731,719
- Issue date May 4, 2004
- PANalytical B.V.
- Paul F. Fewster
- G01 - MEASURING TESTING
Information Patent Grant
Analysing a material sample
- Patent number 5,748,509
- Issue date May 5, 1998
- U.S. Philips Corporation
- Paul F. Fewster
- G01 - MEASURING TESTING
Information Patent Grant
Method of determining a given characteristic of a material sample
- Patent number 5,442,676
- Issue date Aug 15, 1995
- U.S. Philips Corporation
- Paul F. Fewster
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DIFFRACTOMETER
- Publication number 20120128128
- Publication date May 24, 2012
- PANALYTICAL B.V.
- Paul Fewster
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
X-ray diffractometer
- Publication number 20040228441
- Publication date Nov 18, 2004
- Paul F. Fewster
- G01 - MEASURING TESTING
Information Patent Application
Determination of material parameters
- Publication number 20030012337
- Publication date Jan 16, 2003
- KONINLIJKE PHILIPS ELECTRONICS N.V.
- Paul F. Fewster
- G01 - MEASURING TESTING
Information Patent Application
X-ray diffractometer
- Publication number 20020075995
- Publication date Jun 20, 2002
- Paul F. Fewster
- G01 - MEASURING TESTING