Prasanti Uppaluri

Person

Saratoga, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
System and method for determining defects using physics-based image...
- Patent number 11,676,264
- Issue date Jun 13, 2023
- KLA Corporation
- Martin Plihal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for generation of wafer inspection critical areas
- Patent number 11,410,291
- Issue date Aug 9, 2022
- KLA Corporation
- Prasanti Uppaluri
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for inspection of semiconductor structures with...
- Patent number 11,379,967
- Issue date Jul 5, 2022
- KLA Corporation
- Jacob George
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for process monitoring with optical inspections
- Patent number 11,379,969
- Issue date Jul 5, 2022
- KLA Corporation
- Martin Plihal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Diagnostic methods for the classifiers and the defects captured by...
- Patent number 11,237,119
- Issue date Feb 1, 2022
- KLA-Tencor Corporation
- Martin Plihal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect candidate generation for inspection
- Patent number 11,114,324
- Issue date Sep 7, 2021
- KLA Corp.
- Martin Plihal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for generation of wafer inspection critical areas
- Patent number 10,706,522
- Issue date Jul 7, 2020
- KLA-Tencor Corporation
- Prasanti Uppaluri
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Mode selection for inspection
- Patent number 10,670,536
- Issue date Jun 2, 2020
- KLA-Tencor Corp.
- Martin Plihal
- G01 - MEASURING TESTING
Information Patent Grant
Creating defect samples for array regions
- Patent number 10,620,134
- Issue date Apr 14, 2020
- KLA-Tencor Corp.
- Vidyasagar Anantha
- G01 - MEASURING TESTING
Information Patent Grant
Optimizing training sets used for setting up inspection-related alg...
- Patent number 10,267,748
- Issue date Apr 23, 2019
- KLA-Tencor Corp.
- Martin Plihal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for defect classification based on electrical des...
- Patent number 10,209,628
- Issue date Feb 19, 2019
- KLA-Tencor Corporation
- Prasanti Uppaluri
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
DEEP LEARNING IMAGE DENOISING FOR SEMICONDUCTOR-BASED APPLICATIONS
- Publication number 20220383456
- Publication date Dec 1, 2022
- KLA Corporation
- Aditya Gulati
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR PROCESS MONITORING WITH OPTICAL INSPECTIONS
- Publication number 20210035282
- Publication date Feb 4, 2021
- KLA Corporation
- Martin Plihal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and Method for Determining Defects Using Physics-Based Image...
- Publication number 20210027445
- Publication date Jan 28, 2021
- KLA Corporation
- Martin Plihal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and Method for Generation of Wafer Inspection Critical Areas
- Publication number 20200334807
- Publication date Oct 22, 2020
- KLA Corporation
- Prasanti Uppaluri
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Defect Candidate Generation for Inspection
- Publication number 20200328104
- Publication date Oct 15, 2020
- KLA Corporation
- Martin Plihal
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods And Systems For Inspection Of Semiconductor Structures With...
- Publication number 20200234428
- Publication date Jul 23, 2020
- KLA Corporation
- Jacob George
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Creating Defect Samples for Array Regions
- Publication number 20190346375
- Publication date Nov 14, 2019
- KLA-Tencor Corporation
- Vidyasagar Anantha
- G01 - MEASURING TESTING
Information Patent Application
Mode Selection for Inspection
- Publication number 20190302031
- Publication date Oct 3, 2019
- KLA-Tencor Corporation
- Martin Plihal
- G01 - MEASURING TESTING
Information Patent Application
Diagnostic Methods for the Classifiers and the Defects Captured by...
- Publication number 20180197714
- Publication date Jul 12, 2018
- KLA-Tencor Corporation
- Martin Plihal
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and Method for Generation of Wafer Inspection Critical Areas
- Publication number 20180130195
- Publication date May 10, 2018
- KLA-Tencor Corporation
- Prasanti Uppaluri
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Optimizing Training Sets Used for Setting Up Inspection-Related Alg...
- Publication number 20180106732
- Publication date Apr 19, 2018
- KLA-Tencor Corporation
- Martin Plihal
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Defect Classification Based on Electrical Des...
- Publication number 20170344695
- Publication date Nov 30, 2017
- KLA-Tencor Corporation
- Prasanti Uppaluri
- G06 - COMPUTING CALCULATING COUNTING

Prasanti Uppaluri

Person

Patents Grantslast 30 patents

System and method for determining defects using physics-based image...

System and method for generation of wafer inspection critical areas

Methods and systems for inspection of semiconductor structures with...

Method for process monitoring with optical inspections

Diagnostic methods for the classifiers and the defects captured by...

Defect candidate generation for inspection

System and method for generation of wafer inspection critical areas

Mode selection for inspection

Creating defect samples for array regions

Optimizing training sets used for setting up inspection-related alg...

System and method for defect classification based on electrical des...

Patents Applicationslast 30 patents

DEEP LEARNING IMAGE DENOISING FOR SEMICONDUCTOR-BASED APPLICATIONS

METHOD FOR PROCESS MONITORING WITH OPTICAL INSPECTIONS

System and Method for Determining Defects Using Physics-Based Image...

System and Method for Generation of Wafer Inspection Critical Areas

Defect Candidate Generation for Inspection

Methods And Systems For Inspection Of Semiconductor Structures With...

Creating Defect Samples for Array Regions

Mode Selection for Inspection

Diagnostic Methods for the Classifiers and the Defects Captured by...

System and Method for Generation of Wafer Inspection Critical Areas

Optimizing Training Sets Used for Setting Up Inspection-Related Alg...

System and Method for Defect Classification Based on Electrical Des...