R. Stephen Speer

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Sachse, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
Methods and apparatus for device testing at the wafer level
- Patent number 7,482,828
- Issue date Jan 27, 2009
- Finisar Corporation
- Andre Richard Lalonde
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
WAFER LEVEL AC AND/OR DC TESTING
- Publication number 20070013400
- Publication date Jan 18, 2007
- Finisar Corporation
- Andre Richard Lalonde
- G01 - MEASURING TESTING