Richard A. Lawrence

Follow

Person

Wylie, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method for test data-driven statistical detection of outlier semico...
- Patent number 7,129,735
- Issue date Oct 31, 2006
- Texas Instruments Incorporated
- Suresh Subramaniam
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method for test data-driven statistical detection of outlier semico...
- Publication number 20060028229
- Publication date Feb 9, 2006
- TEXAS INSTRUMENTS INCORPORATED
- Suresh Subramaniam
- G01 - MEASURING TESTING