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Richard J. Tansey
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Half Moon Bay, CA, US
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last 30 patents
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Patent Grant
Adaptive optics systems using pixelated spatial phase shifters
Patent number
8,022,345
Issue date
Sep 20, 2011
Lockheed Martin Corporation
Peter Chang
G01 - MEASURING TESTING
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Patent Grant
Spectrum analyzer device on a chip
Patent number
7,531,780
Issue date
May 12, 2009
Lockheed Martin Corporation
Richard J. Tansey
G01 - MEASURING TESTING
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Patent Grant
Black fringe wavefront sensor
Patent number
7,283,251
Issue date
Oct 16, 2007
Lockheed Martin Corporation
Richard J. Tansey
G01 - MEASURING TESTING