San Jose, CA, US
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Patent Grant
The United States of America as represented by the administrator of the Natio...
Sateesh Bajikar
G01 - MEASURING TESTING
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Patent Grant
Armand P. Neukermans
G02 - OPTICS
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Patent Grant
Xros, Inc.
Armand P. Neukermans
G02 - OPTICS
Information
Patent Grant
The United States of America as represented by the United States Department o...
Sateesh S. Bajikar
Y10 - TECHNICAL SUBJECTS COVERED BY FORMER USPC
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Patent Grant
The United States of America as represented by the United States Department o...
Sateesh S. Bajikar
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
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Patent Application
MAUI IMAGING, INC.
Sateesh BAJIKAR
G01 - MEASURING TESTING
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Patent Application
United States of America as represented by the Administrator of the National...
Sateesh Bajikar
G01 - MEASURING TESTING
Information
Patent Application
Xros, Inc., a California corporation
Armand P. Neukermans
G02 - OPTICS
Information
Patent Application
Xros, Inc.
Armand P. Neukermans
G02 - OPTICS
