Shan Yuan

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Measuring device defect sensitization in transistor-level circuits
- Patent number 12,332,301
- Issue date Jun 17, 2025
- Synopsys, Inc.
- Mayukh Bhattacharya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Finding equivalent classes of hard defects in stacked MOSFET arrays
- Patent number 12,271,668
- Issue date Apr 8, 2025
- Synopsys, Inc.
- Mayukh Bhattacharya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Finding equivalent classes of hard defects in stacked MOSFET arrays
- Patent number 11,797,737
- Issue date Oct 24, 2023
- Synopsys, Inc.
- Mayukh Bhattacharya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Electronic circuit simulation method with adaptive iteration
- Patent number 9,002,692
- Issue date Apr 7, 2015
- Synopsys, Inc.
- He Dong
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
MEASURING DEVICE DEFECT SENSITIZATION IN TRANSISTOR-LEVEL CIRCUITS
- Publication number 20240061035
- Publication date Feb 22, 2024
- Synopsys, Inc.
- Mayukh BHATTACHARYA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FINDING EQUIVALENT CLASSES OF HARD DEFECTS IN STACKED MOSFET ARRAYS
- Publication number 20210374313
- Publication date Dec 2, 2021
- Synopsys, Inc.
- Mayukh BHATTACHARYA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR FINDING EQUIVALENT CLASSES OF HARD DEFECTS IN STACKED MO...
- Publication number 20210312113
- Publication date Oct 7, 2021
- Synopsys, Inc.
- Mayukh BHATTACHARYA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Electronic Circuit Simulation Method With Adaptive Iteration
- Publication number 20130246015
- Publication date Sep 19, 2013
- Synopsys, Inc.
- He Dong
- G06 - COMPUTING CALCULATING COUNTING