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Shigenori Morishima
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Fujisawa, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Analyzing apparatus and fine particle collecting apparatus
Patent number
7,275,453
Issue date
Oct 2, 2007
Hitachi, Ltd.
Masanori Ishikawa
G01 - MEASURING TESTING
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Patent Grant
Explosive detection system
Patent number
6,844,546
Issue date
Jan 18, 2005
Hitachi, Ltd.
Hisashi Nagano
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
Analyzing apparatus and fine particle collecting apparatus
Publication number
20050058575
Publication date
Mar 17, 2005
Hitachi, Ltd
Masanori Ishikawa
G01 - MEASURING TESTING
Information
Patent Application
Substance detection method and substance detection apparatus
Publication number
20040028560
Publication date
Feb 12, 2004
Katsumi Nagumo
G01 - MEASURING TESTING
Information
Patent Application
Explosive detection system
Publication number
20030193019
Publication date
Oct 16, 2003
Hisashi Nagano
H01 - BASIC ELECTRIC ELEMENTS