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Shinji Miyaki
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Tokushima, JP
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last 30 patents
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Patent Grant
Charged particle beam exposure system using line beams
Patent number
4,980,567
Issue date
Dec 25, 1990
Fujitsu Limited
Hiroshi Yasuda
B82 - NANO-TECHNOLOGY
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Patent Grant
Electron beam exposure method and apparatus
Patent number
4,950,910
Issue date
Aug 21, 1990
Fujitsu Limited
Hiroshi Yasuda
B82 - NANO-TECHNOLOGY