Shintaro TAMURA

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Kamisato, JP

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Patents Grantslast 30 patents

Information Patent Grant
Optical surface defect inspection apparatus and optical surface def...
- Patent number 8,547,547
- Issue date Oct 1, 2013
- Hitachi High-Technologies Corporation
- Shintaro Tamura
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL SURFACE DEFECT INSPECTION APPARATUS AND OPTICAL SURFACE DEF...
- Publication number 20120075625
- Publication date Mar 29, 2012
- Shintaro TAMURA
- G01 - MEASURING TESTING