Soshi NARISHIGE

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Inspection device and inspection method
- Patent number 9,410,929
- Issue date Aug 9, 2016
- Hitachi, Ltd.
- Hisashi Endo
- G01 - MEASURING TESTING
Information Patent Grant
Eddy current flaw detection sensor and method
- Patent number 7,358,721
- Issue date Apr 15, 2008
- Hitachi, Ltd.
- Soshi Narishige
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Inspection Device and Inspection Method
- Publication number 20140225606
- Publication date Aug 14, 2014
- Hitachi, Ltd
- Hisashi ENDO
- G01 - MEASURING TESTING
Information Patent Application
EDDY CURRENT TESTING METHOD AND EDDY CURRENT TESTING APPARATUS
- Publication number 20090102473
- Publication date Apr 23, 2009
- Soshi NARISHIGE
- G01 - MEASURING TESTING
Information Patent Application
EDDY CURRENT FLAW DETECTION SENSOR AND METHOD
- Publication number 20070229066
- Publication date Oct 4, 2007
- Soshi Narishige
- G01 - MEASURING TESTING