Sumio Kumashiro

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Nakagyo-ku, JP

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Patents Grantslast 30 patents

Information Patent Grant
Mass analyser and method of mass analysis
- Patent number 9,997,343
- Issue date Jun 12, 2018
- Shimadzu Corporation
- Li Ding
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass analyser and method of mass analysis
- Patent number 9,691,596
- Issue date Jun 27, 2017
- Shimadzu Corporation
- Li Ding
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass analyser and method of mass analysis
- Patent number 9,159,544
- Issue date Oct 13, 2015
- Shimadzu Corporation
- Li Ding
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for generating and analyzing ions
- Patent number 8,704,170
- Issue date Apr 22, 2014
- Shimadzu Research Laboratory (Shanghai) Co. Ltd.
- Sumio Kumashiro
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-reflecting ion optical device
- Patent number 8,237,111
- Issue date Aug 7, 2012
- Shimadzu Corporation
- Uriy Golikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion-scattering spectrometer
- Patent number 5,166,521
- Issue date Nov 24, 1992
- Shimadzu Corporation
- Shigeki Hayashi
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MASS ANALYSER AND METHOD OF MASS ANALYSIS
- Publication number 20170278689
- Publication date Sep 28, 2017
- Shimadzu Corporation
- Li Ding
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Analyser and Method of Mass Analysis
- Publication number 20160104609
- Publication date Apr 14, 2016
- Shimadzu Corporation
- Li Ding
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Analyser and Method of Mass Analysis
- Publication number 20140217275
- Publication date Aug 7, 2014
- Shimadzu Corporation
- Li Ding
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR GENERATING AND ANALYZING IONS
- Publication number 20130026359
- Publication date Jan 31, 2013
- SHIMADZU RESEARCH LABORATORY (SHANGHAI) CO., LTD.
- Sumio Kumashiro
- G01 - MEASURING TESTING
Information Patent Application
MULTI-REFLECTING ION OPTICAL DEVICE
- Publication number 20100193682
- Publication date Aug 5, 2010
- SHIMADZU CORPORATION
- Uriy Golikov
- H01 - BASIC ELECTRIC ELEMENTS