Taek-Jin Lim

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Hwaseong-si, KR

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Patents Grantslast 30 patents

Information Patent Grant
Method of forming nonvolatile memory device having floating gate an...
- Patent number 8,497,545
- Issue date Jul 30, 2013
- Samsung Electronics Co., Ltd.
- Jung-Geun Jee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of forming nonvolatile memory device having floating gate an...
- Patent number 7,888,204
- Issue date Feb 15, 2011
- Samsung Electronics Co., Ltd.
- Jung-Geun Jee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Methods for exposing device features on a semiconductor device
- Patent number 7,211,460
- Issue date May 1, 2007
- Samsung Electronics Co. Ltd.
- Taek-jin Lim
- B24 - GRINDING POLISHING
Information Patent Grant
Analytical method of auger electron spectroscopy for insulating sample
- Patent number 5,889,282
- Issue date Mar 30, 1999
- Samsung Electronics Co., Ltd.
- Hee Seok Yang
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for estimating performance of gas tube
- Patent number 5,815,253
- Issue date Sep 29, 1998
- Samsung Electronics Co., Ltd.
- Jin-Sung Kim
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD OF FORMING NONVOLATILE MEMORY DEVICE HAVING FLOATING GATE AN...
- Publication number 20110101437
- Publication date May 5, 2011
- Samsung Electronics Co., Ltd.
- Jung-Geun Jee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of forming nonvolatile memory device having floating gate an...
- Publication number 20090108323
- Publication date Apr 30, 2009
- Samsung Electronics Co., Ltd.
- Jung-Geun Jee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods for forming alignment marks on semiconductor devices
- Publication number 20070172977
- Publication date Jul 26, 2007
- SAMSUNG ELECTRONICS CO., LTD.
- Taek-jin Lim
- B24 - GRINDING POLISHING
Information Patent Application
SUBSTRATE PROTECTING MEMBER AND METHOD OF FORMING ANALYSIS SAMPLE U...
- Publication number 20070152168
- Publication date Jul 5, 2007
- Taek-Jin Lim
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor devices having alignment marks aligned with device fe...
- Publication number 20050079689
- Publication date Apr 14, 2005
- Taek-jin Lim
- B24 - GRINDING POLISHING