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Taisuke Minagawa
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Barcelona, ES
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last 30 patents
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Patent Application
Method for Detecting an Anomaly in a Manufacturing Process
Publication number
20250130563
Publication date
Apr 24, 2025
ABB Schweiz AG
Taisuke Minagawa
G05 - CONTROLLING REGULATING
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Patent Application
Outlier Detection Based on Process Fingerprints from Robot Cycle Data
Publication number
20230274189
Publication date
Aug 31, 2023
ABB Schweiz AG
Arzam Muzaffar Kotriwala
G06 - COMPUTING CALCULATING COUNTING