Takuro NISHIKAWA

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device with failure detection function
- Patent number 12,174,691
- Issue date Dec 24, 2024
- Renesas Electronics Corporation
- Takuro Nishikawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Microcontroller with error signal output circuit and control method...
- Patent number 10,915,082
- Issue date Feb 9, 2021
- Renesas Electronics Corporation
- Takuro Nishikawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device, electronic device, and self-diagnosis method...
- Patent number 10,317,466
- Issue date Jun 11, 2019
- Renesas Electronics Corporation
- Takuro Nishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device, electronic device, and self-diagnosis method...
- Patent number 9,797,950
- Issue date Oct 24, 2017
- Renesas Electronics Corporation
- Takuro Nishikawa
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device, radio communication terminal using the same,...
- Patent number 9,632,568
- Issue date Apr 25, 2017
- Renesas Electronics Corporation
- Takuro Nishikawa
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE, CONTROL METHOD FOR SEMICONDUCTOR DEVICE AND C...
- Publication number 20240296901
- Publication date Sep 5, 2024
- RENESAS ELECTRONICS CORPORATION
- Takuro NISHIKAWA
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20230289248
- Publication date Sep 14, 2023
- RENESAS ELECTRONICS CORPORATION
- Takuro NISHIKAWA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MICROCONTROLLER AND CONTROL METHOD OF THE SAME
- Publication number 20190094830
- Publication date Mar 28, 2019
- RENESAS ELECTRONICS CORPORATION
- Takuro NISHIKAWA
- G05 - CONTROLLING REGULATING
Information Patent Application
SEMICONDUCTOR DEVICE, ELECTRONIC DEVICE, AND SELF-DIAGNOSIS METHOD...
- Publication number 20180003771
- Publication date Jan 4, 2018
- Renesas Electronics Corporation
- Takuro NISHIKAWA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE, ELECTRONIC DEVICE, AND SELF-DIAGNOSIS METHOD...
- Publication number 20160274185
- Publication date Sep 22, 2016
- RENESAS ELECTRONICS CORPORATION
- Takuro NISHIKAWA
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE, RADIO COMMUNICATION TERMINAL USING THE SAME,...
- Publication number 20130185574
- Publication date Jul 18, 2013
- Renesas Mobile Corporation
- Takuro NISHIKAWA
- G06 - COMPUTING CALCULATING COUNTING