Todd Murray

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Roslindale, MA, US

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Patents Grantslast 30 patents

Information Patent Grant
Device for laser-ultrasonic detection of flip chip attachment defects
- Patent number 8,269,979
- Issue date Sep 18, 2012
- Optech Ventures, LLC
- Marvin Klein
- G01 - MEASURING TESTING
Information Patent Grant
Non-destructive imaging, characterization or measurement of thin it...
- Patent number 7,798,000
- Issue date Sep 21, 2010
- Trustees of Boston University
- Todd W. Murray
- G01 - MEASURING TESTING
Information Patent Grant
Laser-ultrasonic detection of flip chip attachment defects
- Patent number 7,327,448
- Issue date Feb 5, 2008
- Optech Ventures LLC
- Marvin Klein
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Device for laser-ultrasonic detection of flip chip attachment defects
- Publication number 20080216575
- Publication date Sep 11, 2008
- Marvin Klein
- G01 - MEASURING TESTING
Information Patent Application
Laser-ultrasonic detection of flip chip attachment defects
- Publication number 20060021438
- Publication date Feb 2, 2006
- LASSON TECHNOLOGIES, INC.
- Marvin Klein
- G01 - MEASURING TESTING