Tomokazu Domon

Person

Yokosuka-shi, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Current detection equipment and semiconductor device
- Patent number 7,129,692
- Issue date Oct 31, 2006
- Kabushiki Kaisha Toshiba
- Ichiro Omura
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for reading invisible symbol
- Patent number 6,857,573
- Issue date Feb 22, 2005
- Kabushiki Kaisha Toshiba
- Taeko I. Urano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High power semiconductor device having semiconductor chips
- Patent number 6,759,735
- Issue date Jul 6, 2004
- Kabushiki Kaisha Toshiba
- Ichiro Omura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for reading invisible symbol
- Patent number 6,712,272
- Issue date Mar 30, 2004
- Kabushiki Kaisha Toshiba
- Taeko I. Urano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Press-contact type semiconductor device
- Patent number 6,548,890
- Issue date Apr 15, 2003
- Kabushiki Kaisha Toshiba
- Eitaro Miyake
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for reading invisible symbol
- Patent number 6,471,126
- Issue date Oct 29, 2002
- Kabushiki Kaisha Toshiba
- Taeko I. Urano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor device, drive method, and drive apparatus
- Patent number 6,323,717
- Issue date Nov 27, 2001
- Kabushiki Kaisha Toshiba
- Ichiro Omura
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and apparatus for reading invisible symbol
- Patent number 6,168,081
- Issue date Jan 2, 2001
- Kabushiki Kaisha Toshiba
- Taeko I. Urano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image input apparatus for capturing images of multiple resolutions
- Patent number 5,920,342
- Issue date Jul 6, 1999
- Kabushiki Kaisha Toshiba
- Masafumi Umeda
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Torque sensor for detecting a shaft torque and an electric machine...
- Patent number RE34039
- Issue date Aug 25, 1992
- Kabushiki Kaisha Toshiba
- Tadahiko Kobayashi
- 073 - Measuring and testing
Information Patent Grant
Double gate GTO thyristor
- Patent number 5,132,767
- Issue date Jul 21, 1992
- Kabushiki Kaisha Toshiba
- Tsuneo Ogura
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Thyristor drive system
- Patent number 4,821,083
- Issue date Apr 11, 1989
- Kabushiki Kaisha Toshiba
- Tsuneo Ogura
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Torque sensor for detecting a shaft torque and an electric machine...
- Patent number 4,750,371
- Issue date Jun 14, 1988
- Kabushiki Kaisha Toshiba
- Tadahiko Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Torque sensor of noncontact type
- Patent number 4,590,807
- Issue date May 27, 1986
- Kabushiki Kaisha Toshiba
- Tadahiko Kobayashi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Centrifugal separating-distributing apparatus, centrifugal force ge...
- Publication number 20080081755
- Publication date Apr 3, 2008
- Kabushiki Kaisha Toshiba
- Takeshi Kinpara
- G01 - MEASURING TESTING
Information Patent Application
Current detection equipment and semiconductor device
- Publication number 20060038552
- Publication date Feb 23, 2006
- KABUSHIKI KAISHA TOSHIBA
- Ichiro Omura
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for reading invisible symbol
- Publication number 20040155113
- Publication date Aug 12, 2004
- Kabushiki Kaisha Toshiba
- Taeko I. Urano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for reading invisible symbol
- Publication number 20040046032
- Publication date Mar 11, 2004
- Kabushiki Kaisha Toshiba
- Taeko I. Urano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Current detection equipment and semiconductor device
- Publication number 20030214313
- Publication date Nov 20, 2003
- Kabushiki Kaisha Toshiba
- Ichiro Omura
- G01 - MEASURING TESTING
Information Patent Application
High power semiconductor device having semiconductor chips
- Publication number 20030137037
- Publication date Jul 24, 2003
- Kabushiki Kaisha Toshiba
- Ichiro Omura
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for reading invisible symbol
- Publication number 20020190129
- Publication date Dec 19, 2002
- Kabushiki Kaisha Toshiba
- Taeko Urano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Press - contact type semiconductor device
- Publication number 20020154482
- Publication date Oct 24, 2002
- Eitaro Miyake
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for reading invisible symbol
- Publication number 20010020677
- Publication date Sep 13, 2001
- KABUSHIKI KAISHA TOSHIBA
- Taeko I. Urano
- G06 - COMPUTING CALCULATING COUNTING

Tomokazu Domon

Person

Patents Grantslast 30 patents

Current detection equipment and semiconductor device

Method and apparatus for reading invisible symbol

High power semiconductor device having semiconductor chips

Method and apparatus for reading invisible symbol

Press-contact type semiconductor device

Method and apparatus for reading invisible symbol

Semiconductor device, drive method, and drive apparatus

Method and apparatus for reading invisible symbol

Image input apparatus for capturing images of multiple resolutions

Torque sensor for detecting a shaft torque and an electric machine...

Double gate GTO thyristor

Thyristor drive system

Torque sensor for detecting a shaft torque and an electric machine...

Torque sensor of noncontact type

Patents Applicationslast 30 patents

Centrifugal separating-distributing apparatus, centrifugal force ge...

Current detection equipment and semiconductor device

Method and apparatus for reading invisible symbol

Method and apparatus for reading invisible symbol

Current detection equipment and semiconductor device

High power semiconductor device having semiconductor chips

Method and apparatus for reading invisible symbol

Press - contact type semiconductor device

Method and apparatus for reading invisible symbol