Toshisuke Kitakohji

Person

Kawasaki, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Simplified environmental atmosphere measuring method
- Patent number 5,994,144
- Issue date Nov 30, 1999
- Fujitsu Limited
- Eiichi Nakajima
- G01 - MEASURING TESTING
Information Patent Grant
Simplified environmental atmosphere measuring apparatus
- Patent number 5,985,213
- Issue date Nov 16, 1999
- Fujitsu Limited
- Eiichi Nakajima
- G01 - MEASURING TESTING
Information Patent Grant
Environment monitoring test piece and test method
- Patent number 5,750,406
- Issue date May 12, 1998
- Fujitsu Limited
- Eiichi Nakajima
- G01 - MEASURING TESTING
Information Patent Grant
Patterning process using ladder-type organosiloxane resin and proce...
- Patent number 4,600,685
- Issue date Jul 15, 1986
- Fujitsu Limited
- Toshisuke Kitakohji
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Dry-developing negative resist composition
- Patent number 4,464,455
- Issue date Aug 7, 1984
- Fujitsu Limited
- Yasuhiro Yoneda
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Positive resist polymer composition and method of forming resist pa...
- Patent number 4,345,020
- Issue date Aug 17, 1982
- Fujitsu Limited
- Yasuhiro Yoneda
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Positive resist terpolymer composition and method of forming resist...
- Patent number 4,276,365
- Issue date Jun 30, 1981
- Fujitsu Limited
- Yasuhiro Yoneda
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Positive resist terpolymer composition and method of forming resist...
- Patent number 4,273,856
- Issue date Jun 16, 1981
- Fujitsu Limited
- Yasuhiro Yoneda
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Negative type deep ultraviolet resist
- Patent number 4,267,258
- Issue date May 12, 1981
- Fujitsu Limited
- Yasuhiro Yoneda
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Toshisuke Kitakohji

Person

Patents Grantslast 30 patents

Simplified environmental atmosphere measuring method

Simplified environmental atmosphere measuring apparatus

Environment monitoring test piece and test method

Patterning process using ladder-type organosiloxane resin and proce...

Dry-developing negative resist composition

Positive resist polymer composition and method of forming resist pa...

Positive resist terpolymer composition and method of forming resist...

Positive resist terpolymer composition and method of forming resist...

Negative type deep ultraviolet resist