TREA

Toshitada Takeuchi

Follow

Person

  • Chiba-shi, JP
People

Patents Grantslast 30 patents

  • Information Patent Grant

    Thermal analysis apparatus
    • Patent number 7,500,779
    • Issue date Mar 10, 2009
    • SII NanoTechnology Inc.
    • Toshitada Takeuchi
    • G01 - MEASURING TESTING

Patents Applicationslast 30 patents

  • Information Patent Application

    Thermal analysis apparatus
    • Publication number 20070201533
    • Publication date Aug 30, 2007
    • Toshitada Takeuchi
    • G01 - MEASURING TESTING