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Wakako Suganuma
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Tokyo-to, JP
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last 30 patents
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Patent Grant
Apparatus and methods for patterning a reticle blank by electron-be...
Patent number
6,972,417
Issue date
Dec 6, 2005
Nikon Corporation
Wakako Suganuma
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
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Patent Application
Methods for determining focus and astigmatism in charged-particle-b...
Publication number
20030043358
Publication date
Mar 6, 2003
NIKON CORPORATION
Wakako Suganuma
B82 - NANO-TECHNOLOGY
Information
Patent Application
Apparatus and methods for patterning a reticle blank by electron-be...
Publication number
20020012853
Publication date
Jan 31, 2002
NIKON CORPORATION
Wakako Suganuma
B82 - NANO-TECHNOLOGY