Wayne M. Needham

Follow

Person

Gilbert, AZ, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for controlling the power and heat output in a...
- Patent number 6,617,868
- Issue date Sep 9, 2003
- Intel Corporation
- Wayne M. Needham
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for built in self-test of buffer circuits for...
- Patent number 6,408,410
- Issue date Jun 18, 2002
- Intel Corporation
- Wayne M. Needham
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting opens through time variant current measurement
- Patent number 5,990,699
- Issue date Nov 23, 1999
- Intel Corporation
- Anthony C. Miller
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for system testing of processors and computer...
- Patent number 5,978,946
- Issue date Nov 2, 1999
- Intel Coporation
- Wayne Maurice Needham
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for testing integrated circuits
- Patent number 5,583,786
- Issue date Dec 10, 1996
- Intel Corporation
- Wayne Needham
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Using hall effect to monitor current during IDDQ testing of CMOS in...
- Patent number 5,570,034
- Issue date Oct 29, 1996
- Intel Corporation
- Wayne Needham
- G01 - MEASURING TESTING