William T. Sprague

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Unified apparatus and method to assure probe card-to-wafer parallel...
- Patent number 6,794,889
- Issue date Sep 21, 2004
- Agilent Technologies, Inc.
- Nasser Ali Jafari
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Apparatus for, and method of, positioning an interface unit of an a...
- Publication number 20070213847
- Publication date Sep 13, 2007
- William T. Sprague
- G01 - MEASURING TESTING
Information Patent Application
Unified apparatus and method to assure probe card-to-wafer parallel...
- Publication number 20030201764
- Publication date Oct 30, 2003
- Nasser Ali Jafari
- G01 - MEASURING TESTING