Yasushi Inoue

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Saitama, JP

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Patents Grantslast 30 patents

Information Patent Grant
Probe for near-field microscope, the method for manufacturing the p...
- Patent number 7,241,987
- Issue date Jul 10, 2007
- Riken
- Yuika Saito
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Probe for near-field microscope, the method for manufacturing the p...
- Publication number 20060043276
- Publication date Mar 2, 2006
- Yuika Saito
- G01 - MEASURING TESTING