Yasushi KUSAKABE

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Ibaraki-shi, Osaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
X-ray fluorescence spectrometer
- Patent number 12,235,229
- Issue date Feb 25, 2025
- Rigaku Corporation
- Yoshiyuki Kataoka
- G01 - MEASURING TESTING
Information Patent Grant
Quantitative analysis method, quantitative analysis program, and X-...
- Patent number 11,782,000
- Issue date Oct 10, 2023
- Rigaku Corporation
- Yoshiyuki Kataoka
- G01 - MEASURING TESTING
Information Patent Grant
Quantitative analysis method, quantitative analysis program, and X-...
- Patent number 11,698,353
- Issue date Jul 11, 2023
- Rigaku Corporation
- Yoshiyuki Kataoka
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
X-RAY FLUORESCENCE SPECTROMETER
- Publication number 20240418661
- Publication date Dec 19, 2024
- Rigaku Corporation
- Yoshiyuki KATAOKA
- G01 - MEASURING TESTING
Information Patent Application
QUANTITATIVE ANALYSIS METHOD, QUANTITATIVE ANALYSIS PROGRAM, AND X-...
- Publication number 20230060446
- Publication date Mar 2, 2023
- Rigaku Corporation
- Yoshiyuki KATAOKA
- G01 - MEASURING TESTING