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Tianjin, CN
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Patents Grants
last 30 patents
Information
Patent Grant
FD-SOI device calibration circuit and method therefor
Patent number
10,862,490
Issue date
Dec 8, 2020
NXP USA, INC.
Xiaolei Wu
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
On-chip current test circuit
Patent number
9,726,724
Issue date
Aug 8, 2017
NXP USA, INC.
Xiuqiang Xu
G01 - MEASURING TESTING
Information
Patent Grant
Mixed signal IP core prototyping system
Patent number
8,904,333
Issue date
Dec 2, 2014
FREESCALE SEMICONDUCTOR, INC.
Haifeng Bai
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Voltage level shifter
Patent number
8,643,426
Issue date
Feb 4, 2014
FREESCALE SEMICONDUCTOR, INC.
Wenzhong Zhang
H03 - BASIC ELECTRONIC CIRCUITRY
Patents Applications
last 30 patents
Information
Patent Application
FD-SOI DEVICE CALIBRATION CIRCUIT AND METHOD THEREFOR
Publication number
20200044627
Publication date
Feb 6, 2020
NXP USA, Inc.
Xiaolei Wu
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
PROTECTING EMBEDDED NONVOLATILE MEMORY FROM INTERFERENCE
Publication number
20170139772
Publication date
May 18, 2017
FREESCALE SEMICONDUCTOR, INC.
Zhihong Cheng
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ON-CHIP CURRENT TEST CIRCUIT
Publication number
20150323590
Publication date
Nov 12, 2015
Xiuqiang Xu
G01 - MEASURING TESTING
Information
Patent Application
SPLIT PAD FOR CIRCUIT BOARD
Publication number
20140284092
Publication date
Sep 25, 2014
Jing Bai
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
MIXED SIGNAL IP CORE PROTOTYPING SYSTEM
Publication number
20140109029
Publication date
Apr 17, 2014
Haifeng Bai
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
VOLTAGE LEVEL SHIFTER
Publication number
20130222037
Publication date
Aug 29, 2013
FREESCALE SEMICONDUCTOR, INC.
Wenzhong Zhang
H03 - BASIC ELECTRONIC CIRCUITRY