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Yoshitaka Kodama
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Multicolor detection device
Patent number
10,753,873
Issue date
Aug 25, 2020
HITACHI HIGH-TECH CORPORATION
Takashi Anazawa
G01 - MEASURING TESTING
Information
Patent Grant
Fluorescence spectrometer
Patent number
10,451,553
Issue date
Oct 22, 2019
Hitachi High-Technologies Corporation
Motohiro Yamazaki
G01 - MEASURING TESTING
Information
Patent Grant
Multicolor detection device
Patent number
10,175,172
Issue date
Jan 8, 2019
Hitachi High-Technologies Corporation
Takashi Anazawa
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Grant
Multichannel analysis device
Patent number
9,921,160
Issue date
Mar 20, 2018
Hitachi High-Technologies Corporation
Takashi Anazawa
G01 - MEASURING TESTING
Information
Patent Grant
Nucleic acid analysis device
Patent number
9,770,713
Issue date
Sep 26, 2017
Hitachi High-Technologies Corporation
Takanobu Haga
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Grant
Pre-processing/electrophoresis integrated cartridge, pre-processing...
Patent number
9,657,286
Issue date
May 23, 2017
Hitachi High-Technologies Corporation
Yukari Sahoyama
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Grant
Capillary electrophoresis apparatus
Patent number
8,685,220
Issue date
Apr 1, 2014
Hitachi High-Technologies Corporation
Takeshi Ohura
G01 - MEASURING TESTING
Information
Patent Grant
Capillary electrophoresis apparatus
Patent number
8,252,162
Issue date
Aug 28, 2012
Hitachi High-Technologies Corporation
Takeshi Ohura
G01 - MEASURING TESTING
Information
Patent Grant
Capillary array electrophoresis apparatus
Patent number
7,513,984
Issue date
Apr 7, 2009
Hitachi, Ltd.
Ryoji Inaba
G01 - MEASURING TESTING
Information
Patent Grant
Multi-capillary electrophoresis apparatus
Patent number
7,459,068
Issue date
Dec 2, 2008
Applied Biosystems Inc.
Eric S. Nordman
G01 - MEASURING TESTING
Information
Patent Grant
Capillary array electrophoresis apparatus
Patent number
6,808,610
Issue date
Oct 26, 2004
Hitachi, Ltd.
Ryoji Inaba
G01 - MEASURING TESTING
Information
Patent Grant
Defect inspection method and apparatus for silicon wafer
Patent number
6,683,683
Issue date
Jan 27, 2004
Hitachi, Ltd.
Koji Tomita
G01 - MEASURING TESTING
Information
Patent Grant
Defect inspection method and apparatus for silicon wafer
Patent number
6,384,909
Issue date
May 7, 2002
Hitachi, Ltd.
Koji Tomita
G01 - MEASURING TESTING
Information
Patent Grant
Defect inspection apparatus for silicon wafer
Patent number
6,256,092
Issue date
Jul 3, 2001
Hitachi, Ltd.
Koji Tomita
G01 - MEASURING TESTING
Information
Patent Grant
Method for measuring crystal defect and equipment using the same
Patent number
6,108,079
Issue date
Aug 22, 2000
Hitachi, Ltd.
Muneo Maeshima
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
MULTICOLOR DETECTION DEVICE
Publication number
20190107491
Publication date
Apr 11, 2019
Hitachi High-Technologies Corporation
Takashi ANAZAWA
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Application
MULTICOLOR DETECTION DEVICE
Publication number
20180024061
Publication date
Jan 25, 2018
Hitachi High-Technologies Corporation
Takashi ANAZAWA
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Application
MULTICHANNEL ANALYSIS DEVICE
Publication number
20170212052
Publication date
Jul 27, 2017
Hitachi High-Technologies Corporation
Takashi ANAZAWA
G01 - MEASURING TESTING
Information
Patent Application
DEVICE FOR STORING BIOCHEMICAL REAGENTS, AND BIOCHEMICAL ANALYZER
Publication number
20170138974
Publication date
May 18, 2017
Hitachi High-Technologies Corporation
Taro Nakazawa
G01 - MEASURING TESTING
Information
Patent Application
Fluorescence Spectrometer
Publication number
20170115223
Publication date
Apr 27, 2017
Motohiro YAMAZAKI
G01 - MEASURING TESTING
Information
Patent Application
PRE-PROCESSING/ELECTROPHORESIS INTEGRATED CARTRIDGE, PRE-PROCESSING...
Publication number
20150210999
Publication date
Jul 30, 2015
Hitachi High-Technologies Corporation
Yukari Sahoyama
C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information
Patent Application
NUCLEIC ACID ANALYSIS DEVICE
Publication number
20150202618
Publication date
Jul 23, 2015
Hitachi High-Technologies Corporation
Takanobu Haga
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
CAPILLARY ELECTROPHORESIS APPARATUS
Publication number
20120292189
Publication date
Nov 22, 2012
Hitachi High-Technologies Corporation
Takeshi Ohura
G01 - MEASURING TESTING
Information
Patent Application
CAPILLARY ELECTROPHORESIS APPARATUS
Publication number
20090211911
Publication date
Aug 27, 2009
Hitachi High-Technologies Corporation
Takeshi Ohura
G01 - MEASURING TESTING
Information
Patent Application
Separation column and liquid chromatography system with this column
Publication number
20080245716
Publication date
Oct 9, 2008
Takeshi Ohura
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Capillary array electrophoresis apparatus and electrophoresis method
Publication number
20050133373
Publication date
Jun 23, 2005
Ryoji Inaba
G01 - MEASURING TESTING
Information
Patent Application
Electrophoresis device
Publication number
20050067285
Publication date
Mar 31, 2005
Ryoji Inaba
G01 - MEASURING TESTING
Information
Patent Application
Multi-capillary electrophoresis apparatus
Publication number
20030127328
Publication date
Jul 10, 2003
Eric S. Nordman
G01 - MEASURING TESTING
Information
Patent Application
Multi-capillary electrophoresis apparatus
Publication number
20030102221
Publication date
Jun 5, 2003
Miho Ozawa
G01 - MEASURING TESTING
Information
Patent Application
Defect inspection method and apparatus for silicon wafer
Publication number
20020080344
Publication date
Jun 27, 2002
Koji Tomita
G01 - MEASURING TESTING
Information
Patent Application
Capillary array electrophoresis apparatus and electrophoresis method
Publication number
20010040094
Publication date
Nov 15, 2001
Ryoji Inaba
G01 - MEASURING TESTING
Information
Patent Application
Defect inspection method and apparatus for silicon wafer
Publication number
20010015802
Publication date
Aug 23, 2001
Koji Tomita
G01 - MEASURING TESTING