YoungJung Lee

Follow

Person

Cheonan-Si, KR

People

Patents Grantslast 30 patents

Information Patent Grant
Sample rod growth and resistivity measurement during single crystal...
- Patent number 10,793,969
- Issue date Oct 6, 2020
- GlobalWafers Co., Ltd.
- Carissima Marie Hudson
- C30 - CRYSTAL GROWTH
Information Patent Grant
Methods for determining the resistivity of a polycrystalline silico...
- Patent number 10,781,532
- Issue date Sep 22, 2020
- GlobalWafers Co., Ltd.
- Carissima Marie Hudson
- C30 - CRYSTAL GROWTH

Patents Applicationslast 30 patents

Information Patent Application
Center Slab Lapping and Resistivity Measurement During Single Cryst...
- Publication number 20200199773
- Publication date Jun 25, 2020
- GLOBALWAFERS CO., LTD.
- HyungMin Lee
- C30 - CRYSTAL GROWTH
Information Patent Application
Sample Rod Center Slab Resistivity Measurement With Four-Point Prob...
- Publication number 20200199774
- Publication date Jun 25, 2020
- GLOBALWAFERS CO., LTD.
- HyungMin Lee
- C30 - CRYSTAL GROWTH
Information Patent Application
Sample Rod Center Slab Resistivity Measurement During Single Crysta...
- Publication number 20200199775
- Publication date Jun 25, 2020
- GLOBALWAFERS CO., LTD.
- HyungMin Lee
- C30 - CRYSTAL GROWTH
Information Patent Application
METHODS FOR DETERMINING THE RESISTIVITY OF A POLYCRYSTALLINE SILICO...
- Publication number 20200002835
- Publication date Jan 2, 2020
- Global Wafers Co., Ltd
- Carissima Marie Hudson
- C30 - CRYSTAL GROWTH
Information Patent Application
SAMPLE ROD GROWTH AND RESISTIVITY MEASUREMENT DURING SINGLE CRYSTAL...
- Publication number 20200002836
- Publication date Jan 2, 2020
- Global Wafers Co., Ltd
- Carissima Marie Hudson
- C30 - CRYSTAL GROWTH