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ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
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H01J
Parent Industries
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ELECTRICITY
H01
Electric elements
Current Industry
H01J
ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
Sub Industries
H01J1/00
Details of electrodes, of magnetic control means, of screens, or of the mounting or spacing thereof, common to two or more basic types of discharge tubes or lamps
H01J11/00
Gas-filled discharge tubes with alternating current induction of the discharge
H01J13/00
Discharge tubes with liquid-pool cathodes
H01J15/00
Gas-filled discharge tubes with gaseous cathodes
H01J17/00
Gas-filled discharge tubes with solid cathode
H01J19/00
Details of vacuum tubes of the types covered by group H01J21/00
H01J21/00
Vacuum tubes
H01J2201/00
Electrodes common to discharge tubes
H01J2203/00
Electron or ion optical arrangements common to discharge tubes or lamps
H01J2209/00
Apparatus and processes for manufacture of discharge tubes
H01J2211/00
Plasma display panels with alternate current induction of the discharge
H01J2217/00
Gas-filled discharge tubes
H01J2223/00
Details of transit-time tubes of the types covered by group H01J2225/00
H01J2225/00
Transit-time tubes
H01J2229/00
Details of cathode ray tubes or electron beam tubes
H01J2231/00
Cathode ray tubes or electron beam tubes
H01J2235/00
X-ray tubes
H01J2237/00
Discharge tubes exposing object to beam
H01J2261/00
Gas- or vapour-discharge lamps
H01J23/00
Details of transit-time tubes of the types covered by group H01J25/00
H01J2329/00
Electron emission display panels
H01J25/00
Transit-time tubes
H01J27/00
Ion beam tubes
H01J2893/00
Discharge tubes and lamps
H01J29/00
Details of cathode-ray tubes or of electron-beam tubes of the types covered by group H01J31/00
H01J3/00
Details of electron-optical or ion-optical arrangements or of ion traps common to two or more basic types of discharge tubes or lamps
H01J31/00
Cathode ray tubes Electron beam tubes
H01J33/00
Discharge tubes with provision for emergence of electrons or ions from the vessel Lenard tubes
H01J35/00
X-ray tubes
H01J37/00
Discharge tubes with provision for introducing objects or material to be exposed to the discharge
H01J40/00
Photoelectric discharge tubes not involving the ionisation of a gas
H01J41/00
Discharge tubes for measuring pressure of introduced gas or for detecting presence of gas Discharge tubes for evacuation by diffusion of ions
H01J43/00
Secondary-emission tubes Electron-multiplier tubes
H01J45/00
Discharge tubes functioning as thermionic generators
H01J47/00
Tubes for determining the presence, intensity, density or energy of radiation or particles
H01J49/00
Particle spectrometer or separator tubes
H01J5/00
Details relating to vessels or to leading-in conductors common to two or more basic types of discharge tubes or lamps
H01J61/00
Gas- or vapour-discharge lamps
H01J63/00
Cathode-ray or electron-stream lamps
H01J65/00
Lamps without any electrode inside the vessel Lamps with at least one main electrode outside the vessel
H01J7/00
Details not provided for in the preceding groups and common to two or more basic types of discharge tubes or lamps
H01J9/00
Apparatus or processes specially adapted to the manufacture, installation, removal, maintenance of electric discharge tubes, discharge lamps, or parts thereof Recovery of material from discharge tubes or lamps
H01J99/00
Subject matter not provided for in other groups of this subclass
Industries
Overview
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Stage apparatus
Patent number
11,996,263
Issue date
May 28, 2024
ASML Netherlands B.V.
Jan-Gerard Cornelis Van Der Toorn
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Extremum seeking control apparatuses with online parameter adjustme...
Patent number
11,996,269
Issue date
May 28, 2024
MKS Instruments, Inc.
Aaron Burry
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Device for radical diagnostic in plasma processing chamber, radical...
Patent number
11,996,275
Issue date
May 28, 2024
Samsung Electronics Co., Ltd.
Sungyong Lim
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion collector for use in plasma systems
Patent number
11,996,276
Issue date
May 28, 2024
Taiwan Semiconductor Manufacturing Co., Ltd
Otto Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of gain calibration
Patent number
11,996,277
Issue date
May 28, 2024
Thermo Fisher Scientific (Bremen) GmbH
Hamish Stewart
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods and systems for detecting aerosol particles without using c...
Patent number
11,996,280
Issue date
May 28, 2024
Zeteo Tech, Inc.
Michael Mcloughlin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Gas analysis device and method for detecting sample gas
Patent number
11,994,492
Issue date
May 28, 2024
Nuctech Company Limited
Yan Wang
G01 - MEASURING TESTING
Information
Patent Grant
Carbon hard mask, film forming apparatus, and film forming method
Patent number
11,993,849
Issue date
May 28, 2024
Tokyo Electron Limited
Masaru Hori
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Electron beam probing techniques and related structures
Patent number
11,996,336
Issue date
May 28, 2024
Micron Technology, Inc.
Amitava Majumdar
G11 - INFORMATION STORAGE
Information
Patent Grant
Apparatus and techniques for substrate processing using independent...
Patent number
11,996,266
Issue date
May 28, 2024
Applied Materials, Inc.
Anthony Renau
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Methods and systems for detecting aerosol particles
Patent number
11,996,279
Issue date
May 28, 2024
Zeteo Tech, Inc.
Michael McLoughlin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Substrate processing method and substrate processing system
Patent number
11,996,296
Issue date
May 28, 2024
Tokyo Electron Limited
Kae Kumagai
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Ion propulsion device
Patent number
11,993,402
Issue date
May 28, 2024
Centre National de la Recherche Scientifique
Jacques Gierak
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
RF signal parameter measurement in an integrated circuit fabricatio...
Patent number
11,994,542
Issue date
May 28, 2024
Lam Research Corporation
Sunil Kapoor
G01 - MEASURING TESTING
Information
Patent Grant
Vacuum transfer assembly
Patent number
11,994,663
Issue date
May 28, 2024
HennyZ B.V.
Hendrik Willem Zandbergen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Temperature-tuned ultrafast X-ray shutter using optics-on-a-chip
Patent number
11,996,210
Issue date
May 28, 2024
UChicago Argonne, LLC
Jin Wang
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Fluid transfer system in a charged particle system
Patent number
11,996,262
Issue date
May 28, 2024
ASML Netherlands B.V.
Marcus Adrianus Van De Kerkhof
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Methods of seasoning process chambers
Patent number
11,996,273
Issue date
May 28, 2024
Applied Materials, Inc.
Vinayak Vishwanath Hassan
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Real-time, non-invasive IEDF plasma sensor
Patent number
11,996,274
Issue date
May 28, 2024
MKS Instruments, Inc.
Linnell Martinez
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Silicon precursors for silicon nitride deposition
Patent number
11,996,286
Issue date
May 28, 2024
ASM IP Holding B.V.
Charles Dezelah
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Planar filament with directed electron beam
Patent number
11,996,258
Issue date
May 28, 2024
Moxtek, Inc.
Eric Miller
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Graphite x-ray window
Patent number
11,996,260
Issue date
May 28, 2024
Moxtek, Inc.
Ghazaleh Allaedini
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Sample mount for electron backscatter diffraction
Patent number
11,996,264
Issue date
May 28, 2024
Honeywell Federal Manufacturing & Technologies, LLC
David M. Wieliczka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Particle beam apparatus, defect repair method, lithographic exposur...
Patent number
11,996,267
Issue date
May 28, 2024
ASML Netherlands B.V.
Ruben Cornelis Maas
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Plasma processing apparatus and plasma processing method
Patent number
11,996,268
Issue date
May 28, 2024
Tokyo Electron Limited
Toshihiko Iwao
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Grant
Plasma processing apparatus
Patent number
11,996,271
Issue date
May 28, 2024
Tokyo Electron Limited
Satoshi Tanaka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method for introducing aluminum to an ion source
Patent number
11,996,281
Issue date
May 28, 2024
Applied Materials, Inc.
Graham Wright
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and system for cleaning a field emission cathode device
Patent number
11,996,282
Issue date
May 28, 2024
NCX Corporation
Jian Zhang
B08 - CLEANING
Information
Patent Grant
Member for semiconductor manufacturing apparatus
Patent number
11,996,313
Issue date
May 28, 2024
NGK Insulators, Ltd.
Ryuji Tamura
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Substrate processing apparatus
Patent number
11,993,843
Issue date
May 28, 2024
ASM IP Holding B.V.
Seung Wook Kim
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Patents Applications
last 30 patents
Information
Patent Application
PLASMA PROCESSING APPARATUS
Publication number
20240177973
Publication date
May 30, 2024
TOKYO ELECTRON LIMITED
Koki HIDAKA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
WAFER SUPPORT
Publication number
20240177974
Publication date
May 30, 2024
FERROTEC MATERIAL TECHNOLOGIES CORPORATION
Wataru YAMAGISHI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SUBSTRATE PROCESSING APPARATUS AND CLEANING METHOD
Publication number
20240177978
Publication date
May 30, 2024
TOKYO ELECTRON LIMITED
Masato SHINADA
B08 - CLEANING
Information
Patent Application
Method for Linear Quantitative Dynamic Range Extension
Publication number
20240177982
Publication date
May 30, 2024
DH Technologies Development Pte. Ltd.
Gordana Ivosev
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
WORKFLOW FOR HIGH-THROUGHPUT ANALYSIS OF ANALYTES IN LIQUID SAMPLES
Publication number
20240177984
Publication date
May 30, 2024
DH Technologies Development Pte. Ltd.
Bradley Schneider
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR DESORBING AND IONIZING OF SAMPLE MATERIAL
Publication number
20240177986
Publication date
May 30, 2024
Bruker Daltonics GmbH & Co. KG
Marcel NIEHAUS
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MICROSCOPY IMAGING METHOD AND SYSTEM
Publication number
20240177966
Publication date
May 30, 2024
Fibics Incorporated
Michael William Phaneuf
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD FOR MICROMACHINING A BIOLOGICAL SAMPLE FOR CREATING A LAMELL...
Publication number
20240177967
Publication date
May 30, 2024
FEI Company
Matej Dolník
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MATCHING NETWORK MODULE AND SUBSTRATE PROCESSING APPARATUS INCLUDIN...
Publication number
20240177971
Publication date
May 30, 2024
SEMES CO., LTD.
Sung Suk WI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD FOR ETCHING ATOMIC LAYER
Publication number
20240177972
Publication date
May 30, 2024
Research & Business Foundation SUNGKYUNKWAN UNIVERSITY
Geun Young YEOM
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ONLINE CHROMATOGRAPHY AND ELECTROSPRAY IONIZATION MASS SPECTROMETER
Publication number
20240174737
Publication date
May 30, 2024
Regeneron Pharmaceuticals, Inc.
Qian Zhang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
LARGE AREA MONITORING APPARATUS
Publication number
20240179833
Publication date
May 30, 2024
WIT CORPORATION
Jae Hwan KIM
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Differential Mobility Spectrometer/Mass Spectrometer Interface With...
Publication number
20240175846
Publication date
May 30, 2024
DH Technologies Development Pte. Ltd.
Thomas COVEY
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
COOLING PLATE AND PLASMA PROCESSING CHAMBER INCLUDING THE SAME
Publication number
20240177975
Publication date
May 30, 2024
SEMES CO., LTD.
Yong Jun BAE
F28 - HEAT EXCHANGE IN GENERAL
Information
Patent Application
MASS SPECTROMETER AND MASS SPECTROMETRY METHOD
Publication number
20240177980
Publication date
May 30, 2024
Shimadzu Corporation
Hidenori TAKAHASHI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method for Analyzing Samples Including a High M/Z Cutoff
Publication number
20240177987
Publication date
May 30, 2024
DH Technologies Development Pte. Ltd.
Leigh BEDFORD
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SYSTEM AND METHODS FOR IMPLEMENTING A MICRO PULSING SCHEME USING DU...
Publication number
20240177968
Publication date
May 30, 2024
Applied Materials, Inc.
A N M Wasekul AZAD
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Charged Particle Beam Apparatus
Publication number
20240177963
Publication date
May 30, 2024
HITACHI HIGH-TECH CORPORATION
Yuki UCHIOKE
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SEMICONDUCTOR PROCESSING TOOL CLEANING
Publication number
20240177977
Publication date
May 30, 2024
TEXAS INSTRUMENTS INCORPORATED
Gregory McKee
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MASS SPECTROMETER AND METHOD FOR CONTROLLING SAME
Publication number
20240177983
Publication date
May 30, 2024
HITACHI HIGH-TECH COORPORATION
Masuyuki Sugiyama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of Operating a PVD Apparatus
Publication number
20240177997
Publication date
May 30, 2024
SPTS TECHNOLOGIES LIMITED
Scott Haymore
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
EQUIPMENT FRONT-END MODULES FOR SEMICONDUCTOR PROCESSING SYSTEMS AN...
Publication number
20240178019
Publication date
May 30, 2024
ASM IP HOLDING B.V.
Mandar Deshpande
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
FILM FORMING METHOD AND FILM FORMING APPARATUS
Publication number
20240175117
Publication date
May 30, 2024
TOKYO ELECTRON LIMITED
Ken OKOSHI
C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information
Patent Application
ELECTRON BEAM MODULATION DEVICE AND ELECTRON BEAM MODULATION METHOD
Publication number
20240177961
Publication date
May 30, 2024
Tohoku University
Yuuki UESUGI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SOLID-STATE SWITCH BASED HIGH-SPEED PULSER WITH PLASMA IEDF MODIFIC...
Publication number
20240177969
Publication date
May 30, 2024
Applied Materials, Inc.
Kartik RAMASWAMY
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND DEVICE FOR PROCESSING MASS SPECTROMETRY DATA
Publication number
20240177981
Publication date
May 30, 2024
Shimadzu Corporation
Yoshihiro KUNIMURA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CALCULATE WAFERS THICKNESS OUT OF WAFER MAPPING PROCESS
Publication number
20240178022
Publication date
May 30, 2024
APPLIED MATERIALS ISRAEL LTD.
Ofer Dudovitch
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
CALIBRATION JIG AND CALIBRATION METHOD
Publication number
20240178035
Publication date
May 30, 2024
Applied Materials, Inc.
Andrew MYLES
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Lattice Based Voltage Standoff
Publication number
20240177960
Publication date
May 30, 2024
Applied Materials, Inc.
Adam M. McLaughlin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
USING LASER BEAM FOR SEM BASE TOOLS, WORKING DISTANCE MEASUREMENT A...
Publication number
20240177962
Publication date
May 30, 2024
APPLIED MATERIALS ISRAEL LTD.
Ofer Dudovitch
H01 - BASIC ELECTRIC ELEMENTS