Adjustable illumination

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CPC
G01N2021/8835

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Current Industry

G01N2021/8835Adjustable illumination

Industries

Patents Grantslast 30 patents

Information Patent Grant
Optical inspection device and inspecting method using the same
- Patent number 12,222,294
- Issue date Feb 11, 2025
- Samsung Display Co., Ltd.
- Jeong Moon Lee
- G01 - MEASURING TESTING
Information Patent Grant
Image acquisition method and image acquisition apparatus
- Patent number 12,105,026
- Issue date Oct 1, 2024
- NuFlare Technology, Inc.
- Yasuhiro Yamashita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Tab image acquisition device, system, and method
- Patent number 12,092,583
- Issue date Sep 17, 2024
- CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
- Yinhang Tu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detection and grading of the effect of blue fluorescence on diamond...
- Patent number 11,988,610
- Issue date May 21, 2024
- Gemological Institute of America, Inc. (GIA)
- Yun Luo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device and method for checking for surface defect, using image sensor
- Patent number 11,892,414
- Issue date Feb 6, 2024
- VIEW-ON LTD.
- Young Yeop Yoon
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Testing device and testing method
- Patent number 11,885,751
- Issue date Jan 30, 2024
- Carl Zeiss Vision International GmbH
- Marc Flemming
- G01 - MEASURING TESTING
Information Patent Grant
Nano projection structure inspection apparatus and nano projection...
- Patent number 11,815,467
- Issue date Nov 14, 2023
- PRIME PLANET ENERGY & SOLUTIONS, INC.
- Yuki Sato
- G01 - MEASURING TESTING
Information Patent Grant
Workforce augmenting inspection device
- Patent number 11,754,507
- Issue date Sep 12, 2023
- Lockheed Martin Corporation
- Christopher Lee Colaw
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for producing a prophylactic article
- Patent number 11,697,717
- Issue date Jul 11, 2023
- Semperit Aktiengesellschaft Holding
- Armin Holzner
- A41 - WEARING APPAREL
Information Patent Grant
Macro inspection systems, apparatus and methods
- Patent number 11,656,184
- Issue date May 23, 2023
- Nanotronics Imaging, Inc.
- Matthew C. Putman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image inspection device and lighting device
- Patent number 11,567,013
- Issue date Jan 31, 2023
- Omron Corporation
- Yutaka Kato
- G01 - MEASURING TESTING
Information Patent Grant
Method of fabricating a photomask and method of inspecting a photomask
- Patent number 11,567,400
- Issue date Jan 31, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Tsun-Cheng Tang
- G01 - MEASURING TESTING
Information Patent Grant
Method for minimizing and eliminating sheetrock sanding using an il...
- Patent number 11,543,361
- Issue date Jan 3, 2023
- James Scott Korman
- F21 - LIGHTING
Information Patent Grant
Apparatus for checking the coverslipping quality of samples for mic...
- Patent number 11,519,863
- Issue date Dec 6, 2022
- Leica Biosystems Nussloch GmbH
- Bernhard Neef
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Macro inspection systems, apparatus and methods
- Patent number 11,408,829
- Issue date Aug 9, 2022
- Nanotronics Imaging, Inc.
- Matthew C. Putman
- G01 - MEASURING TESTING
Information Patent Grant
System and method for optical inspection of an object
- Patent number 11,385,184
- Issue date Jul 12, 2022
- IVISYS SWEDEN AB
- Moatasem Chehaiber
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Device for inspecting printed images
- Patent number 11,295,428
- Issue date Apr 5, 2022
- ELEXIS AG
- Stephan Krebs
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for inspection of a film on a substrate
- Patent number 11,237,117
- Issue date Feb 1, 2022
- BWXT Nuclear Operations Group, Inc.
- Aaron C. Havener
- G01 - MEASURING TESTING
Information Patent Grant
Optical detecting device and calibrating method
- Patent number 11,209,371
- Issue date Dec 28, 2021
- CHROMA ATE INC.
- Yu-Hsin Liu
- G01 - MEASURING TESTING
Information Patent Grant
Optically determining the condition of goods
- Patent number 11,204,331
- Issue date Dec 21, 2021
- Chromera, Inc.
- Paul Atkinson
- G01 - MEASURING TESTING
Information Patent Grant
Inspection method of a photomask and an inspection system
- Patent number 11,048,163
- Issue date Jun 29, 2021
- Taiwan Semiconductor Manufacturing Company, Ltd
- Tsun-Cheng Tang
- G01 - MEASURING TESTING
Information Patent Grant
Image inspection device
- Patent number 11,022,560
- Issue date Jun 1, 2021
- Omron Corporation
- Yutaka Kato
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Cylindrical body surface inspection device and cylindrical body sur...
- Patent number 10,955,354
- Issue date Mar 23, 2021
- Toray Industries, Inc.
- Hiroki Sugihara
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Macro inspection systems, apparatus and methods
- Patent number 10,914,686
- Issue date Feb 9, 2021
- Nanotronics Imaging, Inc.
- Matthew C. Putman
- G01 - MEASURING TESTING
Information Patent Grant
Water measurement apparatus
- Patent number 10,823,682
- Issue date Nov 3, 2020
- Samsung Electronics Co., Ltd.
- Takamasa Sugiura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Visual inspection device and illumination condition setting method...
- Patent number 10,805,552
- Issue date Oct 13, 2020
- Omron Corporation
- Shingo Hayashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Appearance inspection device, appearance inspection method and program
- Patent number 10,794,691
- Issue date Oct 6, 2020
- Omron Corporation
- Hiroyuki Hazeyama
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Arbitrary wavefront compensator for deep ultraviolet (DUV) optical...
- Patent number 10,761,031
- Issue date Sep 1, 2020
- KLA-Tencor Corporation
- Qiang Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for inspection of a film on a substrate
- Patent number 10,761,032
- Issue date Sep 1, 2020
- BWXT Nuclear Operations Group, Inc.
- Aaron C. Havener
- G01 - MEASURING TESTING
Information Patent Grant
Automated inspection of foreign materials, cracks and other surface...
- Patent number 10,746,670
- Issue date Aug 18, 2020
- The Boeing Company
- Morteza Safai
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
DUAL LENS INSPECTION DEVICE
- Publication number 20250052690
- Publication date Feb 13, 2025
- SUN YANG OPTICS DEVELOPMENT CO., LTD.
- SHENG CHE WU
- G01 - MEASURING TESTING
Information Patent Application
DEVICE OF INSPECTING DEFECTS OF WAFER DICED OR ALIGNED
- Publication number 20250027885
- Publication date Jan 23, 2025
- YAYATECH CO., LTD.
- Chien-Cheng CHEN
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR MEASURING WAFERS
- Publication number 20240393261
- Publication date Nov 28, 2024
- PRECITEC OPTRONIK GMBH
- Tobias Beck
- G01 - MEASURING TESTING
Information Patent Application
SMART CAMERA AND IMAGE INSPECTION SYSTEM
- Publication number 20240328958
- Publication date Oct 3, 2024
- KEYENCE CORPORATION
- Atsuhito SHIGIYA
- G01 - MEASURING TESTING
Information Patent Application
IMAGING CONDITION SETTING SYSTEM, IMAGING CONDITION SETTING METHOD,...
- Publication number 20240305893
- Publication date Sep 12, 2024
- Omron Corporation
- Yosuke NARUSE
- G01 - MEASURING TESTING
Information Patent Application
OUTDOOR PHOTOLUMINESCENCE IMAGING OF PHOTOVOLTAIC ARRAYS VIA OPTICA...
- Publication number 20240283402
- Publication date Aug 22, 2024
- NewSouth Innovations Pty Limited
- Oliver KUNZ
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD
- Publication number 20240272089
- Publication date Aug 15, 2024
- Samsung Electronics Co., Ltd.
- Minsu Kim
- G01 - MEASURING TESTING
Information Patent Application
MULTI-HEAD OPTICAL INSPECTION SYSTEMS AND TECHNIQUES FOR SEMICONDUC...
- Publication number 20240248046
- Publication date Jul 25, 2024
- Applied Materials, Inc.
- Keith Wells
- G01 - MEASURING TESTING
Information Patent Application
DETECTION AND GRADING OF THE EFFECT OF BLUE FLUORESCENCE ON DIAMOND...
- Publication number 20240241063
- Publication date Jul 18, 2024
- GEMOLOGICAL INSTITUTE OF AMERICA, INC. (GIA)
- Yun LUO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
A METHOD FOR QUALITY ASSESSMENT OF A FOOD PACKAGE AND A PACKAGING S...
- Publication number 20240233116
- Publication date Jul 11, 2024
- Tetra Laval Holdings & Finance S.A.
- Antonio Melandri
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METROLOGY SYSTEM FOR MEASURING EDGE OF CIRCULAR WORKPIECE
- Publication number 20240219316
- Publication date Jul 4, 2024
- MITUTOYO CORPORATION
- Christopher Richard HAMNER
- G01 - MEASURING TESTING
Information Patent Application
APPEARANCE INSPECTION DEVICE AND APPARATUS FOR MANUFACTURING BATTER...
- Publication number 20240192141
- Publication date Jun 13, 2024
- Contemporary Amperex Technology Co., Limited
- Lin MA
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS AND METHOD FOR ROUGHNESS AND/OR DEFECT MEASUREM...
- Publication number 20240183655
- Publication date Jun 6, 2024
- ASML NETHERLANDS B.V.
- Alexander VON FINCK
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL APPARATUS AND EXAMINATION APPARATUS
- Publication number 20240159684
- Publication date May 16, 2024
- Lasertec Corporation
- Ko GONDAIRA
- G01 - MEASURING TESTING
Information Patent Application
GLASS INSPECTION
- Publication number 20240085342
- Publication date Mar 14, 2024
- PILKINGTON GROUP LIMITED
- Simon CHERRY
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20240011915
- Publication date Jan 11, 2024
- SEMES CO., LTD.
- Hark Ryong KIM
- G01 - MEASURING TESTING
Information Patent Application
TESTING DEVICE AND TESTING METHOD
- Publication number 20240003829
- Publication date Jan 4, 2024
- CARL ZEISS VISION INTERNATIONAL GMBH
- Marc Flemming
- G01 - MEASURING TESTING
Information Patent Application
TAB IMAGE ACQUISITION DEVICE, SYSTEM, AND METHOD
- Publication number 20240003822
- Publication date Jan 4, 2024
- Contemporary Amperex Technology Co., Limited
- Yinhang TU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEFECT REMOVAL DEVICE, DEFECT REMOVAL METHOD, PATTERN FORMING METHO...
- Publication number 20230395366
- Publication date Dec 7, 2023
- FUJIFILM CORPORATION
- Akihiko OHTSU
- G01 - MEASURING TESTING
Information Patent Application
DYNAMIC ILLUMINATION INSPECTION TUNNEL
- Publication number 20230304939
- Publication date Sep 28, 2023
- VIRELUX INSPECTION SYSTEMS SARL
- Tom REICHERT
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL DETECTION APPARATUS, OPTICAL DETECTING METHOD, AND IMAGE PR...
- Publication number 20230204517
- Publication date Jun 29, 2023
- HONGFUJIN PRECISION ELECTRONICS (ZHENGZHOU) CO., LTD.
- TIAN-TIAN FAN
- G01 - MEASURING TESTING
Information Patent Application
3D IMAGE ACQUISITION SYSTEM FOR OPTICAL INSPECTION AND METHOD FOR O...
- Publication number 20230204519
- Publication date Jun 29, 2023
- Scuola universitaria professionale della Svizzera italiana (SUPSI)
- Daniele Guido ALLEGRI
- G01 - MEASURING TESTING
Information Patent Application
WAFER INSPECTION APPARATUS USING THREE-DIMENSIONAL IMAGE AND METHOD...
- Publication number 20230184691
- Publication date Jun 15, 2023
- Samsung Electronics Co., Ltd.
- Yusin YANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LUMINAIRE ELEMENT FOR AN INSPECTION TUNNEL, LUMINAIRE STRIP, AND IN...
- Publication number 20230160833
- Publication date May 25, 2023
- Dürr Systems AG
- Dietmar WIELAND
- F21 - LIGHTING
Information Patent Application
COMBINED OCD AND PHOTOREFLECTANCE METHOD AND SYSTEM
- Publication number 20230035404
- Publication date Feb 2, 2023
- NOVA LTD
- Yonatan OREN
- G01 - MEASURING TESTING
Information Patent Application
IMAGE ACQUISITION METHOD AND IMAGE ACQUISITION APPARATUS
- Publication number 20230009656
- Publication date Jan 12, 2023
- NuFlare Technology, Inc.
- Yasuhiro YAMASHITA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR ILLUMINATION AND SYSTEM FOR DETERMINING SPECTRAL DISTRIB...
- Publication number 20230003662
- Publication date Jan 5, 2023
- NALUX CO., LTD.
- Michitomo ISHII
- G01 - MEASURING TESTING
Information Patent Application
Workforce Augmenting Inspection Device
- Publication number 20220317053
- Publication date Oct 6, 2022
- Lockheed Martin Corporation
- Christopher Lee Colaw
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NANO PROJECTION STRUCTURE INSPECTION APPARATUS AND NANO PROJECTION...
- Publication number 20220260501
- Publication date Aug 18, 2022
- Prime Planet Energy & Solutions, Inc.
- Yuki SATO
- G01 - MEASURING TESTING
Information Patent Application
GEMSTONE BLUE FLUORESCENCE DETECTION AND GRADING
- Publication number 20220196565
- Publication date Jun 23, 2022
- GEMOLOGICAL INSTITUTE OF AMERICA, INC. (GIA)
- Yun LUO
- G06 - COMPUTING CALCULATING COUNTING

Adjustable illumination

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Optical inspection device and inspecting method using the same

Image acquisition method and image acquisition apparatus

Tab image acquisition device, system, and method

Detection and grading of the effect of blue fluorescence on diamond...

Device and method for checking for surface defect, using image sensor

Testing device and testing method

Nano projection structure inspection apparatus and nano projection...

Workforce augmenting inspection device

Method for producing a prophylactic article

Macro inspection systems, apparatus and methods

Image inspection device and lighting device

Method of fabricating a photomask and method of inspecting a photomask

Method for minimizing and eliminating sheetrock sanding using an il...

Apparatus for checking the coverslipping quality of samples for mic...

Macro inspection systems, apparatus and methods

System and method for optical inspection of an object

Device for inspecting printed images

Apparatus and method for inspection of a film on a substrate

Optical detecting device and calibrating method

Optically determining the condition of goods

Inspection method of a photomask and an inspection system

Image inspection device

Cylindrical body surface inspection device and cylindrical body sur...

Macro inspection systems, apparatus and methods

Water measurement apparatus

Visual inspection device and illumination condition setting method...

Appearance inspection device, appearance inspection method and program

Arbitrary wavefront compensator for deep ultraviolet (DUV) optical...

Apparatus and method for inspection of a film on a substrate

Automated inspection of foreign materials, cracks and other surface...

Patents Applicationslast 30 patents

DUAL LENS INSPECTION DEVICE

DEVICE OF INSPECTING DEFECTS OF WAFER DICED OR ALIGNED

APPARATUS AND METHOD FOR MEASURING WAFERS

SMART CAMERA AND IMAGE INSPECTION SYSTEM

IMAGING CONDITION SETTING SYSTEM, IMAGING CONDITION SETTING METHOD,...

OUTDOOR PHOTOLUMINESCENCE IMAGING OF PHOTOVOLTAIC ARRAYS VIA OPTICA...

DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD

MULTI-HEAD OPTICAL INSPECTION SYSTEMS AND TECHNIQUES FOR SEMICONDUC...

DETECTION AND GRADING OF THE EFFECT OF BLUE FLUORESCENCE ON DIAMOND...

A METHOD FOR QUALITY ASSESSMENT OF A FOOD PACKAGE AND A PACKAGING S...

METROLOGY SYSTEM FOR MEASURING EDGE OF CIRCULAR WORKPIECE

APPEARANCE INSPECTION DEVICE AND APPARATUS FOR MANUFACTURING BATTER...

MEASURING APPARATUS AND METHOD FOR ROUGHNESS AND/OR DEFECT MEASUREM...

OPTICAL APPARATUS AND EXAMINATION APPARATUS

GLASS INSPECTION

INSPECTION APPARATUS AND INSPECTION METHOD

TESTING DEVICE AND TESTING METHOD

TAB IMAGE ACQUISITION DEVICE, SYSTEM, AND METHOD

DEFECT REMOVAL DEVICE, DEFECT REMOVAL METHOD, PATTERN FORMING METHO...

DYNAMIC ILLUMINATION INSPECTION TUNNEL

OPTICAL DETECTION APPARATUS, OPTICAL DETECTING METHOD, AND IMAGE PR...

3D IMAGE ACQUISITION SYSTEM FOR OPTICAL INSPECTION AND METHOD FOR O...

WAFER INSPECTION APPARATUS USING THREE-DIMENSIONAL IMAGE AND METHOD...

LUMINAIRE ELEMENT FOR AN INSPECTION TUNNEL, LUMINAIRE STRIP, AND IN...

COMBINED OCD AND PHOTOREFLECTANCE METHOD AND SYSTEM

IMAGE ACQUISITION METHOD AND IMAGE ACQUISITION APPARATUS

METHOD FOR ILLUMINATION AND SYSTEM FOR DETERMINING SPECTRAL DISTRIB...

Workforce Augmenting Inspection Device

NANO PROJECTION STRUCTURE INSPECTION APPARATUS AND NANO PROJECTION...

GEMSTONE BLUE FLUORESCENCE DETECTION AND GRADING