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G01N2021/8835
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PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
Current Industry
G01N2021/8835
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Patents Grants
last 30 patents
Information
Patent Grant
Detection and grading of the effect of blue fluorescence on diamond...
Patent number
11,988,610
Issue date
May 21, 2024
Gemological Institute of America, Inc. (GIA)
Yun Luo
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Device and method for checking for surface defect, using image sensor
Patent number
11,892,414
Issue date
Feb 6, 2024
VIEW-ON LTD.
Young Yeop Yoon
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Testing device and testing method
Patent number
11,885,751
Issue date
Jan 30, 2024
Carl Zeiss Vision International GmbH
Marc Flemming
G01 - MEASURING TESTING
Information
Patent Grant
Nano projection structure inspection apparatus and nano projection...
Patent number
11,815,467
Issue date
Nov 14, 2023
PRIME PLANET ENERGY & SOLUTIONS, INC.
Yuki Sato
G01 - MEASURING TESTING
Information
Patent Grant
Workforce augmenting inspection device
Patent number
11,754,507
Issue date
Sep 12, 2023
Lockheed Martin Corporation
Christopher Lee Colaw
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for producing a prophylactic article
Patent number
11,697,717
Issue date
Jul 11, 2023
Semperit Aktiengesellschaft Holding
Armin Holzner
A41 - WEARING APPAREL
Information
Patent Grant
Macro inspection systems, apparatus and methods
Patent number
11,656,184
Issue date
May 23, 2023
Nanotronics Imaging, Inc.
Matthew C. Putman
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Image inspection device and lighting device
Patent number
11,567,013
Issue date
Jan 31, 2023
Omron Corporation
Yutaka Kato
G01 - MEASURING TESTING
Information
Patent Grant
Method of fabricating a photomask and method of inspecting a photomask
Patent number
11,567,400
Issue date
Jan 31, 2023
Taiwan Semiconductor Manufacturing Company, Ltd
Tsun-Cheng Tang
G01 - MEASURING TESTING
Information
Patent Grant
Method for minimizing and eliminating sheetrock sanding using an il...
Patent number
11,543,361
Issue date
Jan 3, 2023
James Scott Korman
F21 - LIGHTING
Information
Patent Grant
Apparatus for checking the coverslipping quality of samples for mic...
Patent number
11,519,863
Issue date
Dec 6, 2022
Leica Biosystems Nussloch GmbH
Bernhard Neef
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Macro inspection systems, apparatus and methods
Patent number
11,408,829
Issue date
Aug 9, 2022
Nanotronics Imaging, Inc.
Matthew C. Putman
G01 - MEASURING TESTING
Information
Patent Grant
System and method for optical inspection of an object
Patent number
11,385,184
Issue date
Jul 12, 2022
IVISYS SWEDEN AB
Moatasem Chehaiber
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Device for inspecting printed images
Patent number
11,295,428
Issue date
Apr 5, 2022
ELEXIS AG
Stephan Krebs
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatus and method for inspection of a film on a substrate
Patent number
11,237,117
Issue date
Feb 1, 2022
BWXT Nuclear Operations Group, Inc.
Aaron C. Havener
G01 - MEASURING TESTING
Information
Patent Grant
Optical detecting device and calibrating method
Patent number
11,209,371
Issue date
Dec 28, 2021
CHROMA ATE INC.
Yu-Hsin Liu
G01 - MEASURING TESTING
Information
Patent Grant
Optically determining the condition of goods
Patent number
11,204,331
Issue date
Dec 21, 2021
Chromera, Inc.
Paul Atkinson
G01 - MEASURING TESTING
Information
Patent Grant
Inspection method of a photomask and an inspection system
Patent number
11,048,163
Issue date
Jun 29, 2021
Taiwan Semiconductor Manufacturing Company, Ltd
Tsun-Cheng Tang
G01 - MEASURING TESTING
Information
Patent Grant
Image inspection device
Patent number
11,022,560
Issue date
Jun 1, 2021
Omron Corporation
Yutaka Kato
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Cylindrical body surface inspection device and cylindrical body sur...
Patent number
10,955,354
Issue date
Mar 23, 2021
Toray Industries, Inc.
Hiroki Sugihara
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Macro inspection systems, apparatus and methods
Patent number
10,914,686
Issue date
Feb 9, 2021
Nanotronics Imaging, Inc.
Matthew C. Putman
G01 - MEASURING TESTING
Information
Patent Grant
Water measurement apparatus
Patent number
10,823,682
Issue date
Nov 3, 2020
Samsung Electronics Co., Ltd.
Takamasa Sugiura
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Visual inspection device and illumination condition setting method...
Patent number
10,805,552
Issue date
Oct 13, 2020
Omron Corporation
Shingo Hayashi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Appearance inspection device, appearance inspection method and program
Patent number
10,794,691
Issue date
Oct 6, 2020
Omron Corporation
Hiroyuki Hazeyama
B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information
Patent Grant
Arbitrary wavefront compensator for deep ultraviolet (DUV) optical...
Patent number
10,761,031
Issue date
Sep 1, 2020
KLA-Tencor Corporation
Qiang Zhang
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for inspection of a film on a substrate
Patent number
10,761,032
Issue date
Sep 1, 2020
BWXT Nuclear Operations Group, Inc.
Aaron C. Havener
G01 - MEASURING TESTING
Information
Patent Grant
Automated inspection of foreign materials, cracks and other surface...
Patent number
10,746,670
Issue date
Aug 18, 2020
The Boeing Company
Morteza Safai
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inspection system and inspection method
Patent number
10,739,272
Issue date
Aug 11, 2020
The University of Tokyo
Toru Kurihara
G01 - MEASURING TESTING
Information
Patent Grant
Method and device for focusing in an inspection system
Patent number
10,724,961
Issue date
Jul 28, 2020
ASML Holding N.V.
Yevgeniy Konstantinovich Shmarev
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information
Patent Grant
Installation for the optical inspection of surface regions of objects
Patent number
10,634,617
Issue date
Apr 28, 2020
EISENMANN SE
Jürgen Röckle
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
APPEARANCE INSPECTION DEVICE AND APPARATUS FOR MANUFACTURING BATTER...
Publication number
20240192141
Publication date
Jun 13, 2024
Contemporary Amperex Technology Co., Limited
Lin MA
G01 - MEASURING TESTING
Information
Patent Application
MEASURING APPARATUS AND METHOD FOR ROUGHNESS AND/OR DEFECT MEASUREM...
Publication number
20240183655
Publication date
Jun 6, 2024
ASML NETHERLANDS B.V.
Alexander VON FINCK
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL APPARATUS AND EXAMINATION APPARATUS
Publication number
20240159684
Publication date
May 16, 2024
Lasertec Corporation
Ko GONDAIRA
G01 - MEASURING TESTING
Information
Patent Application
GLASS INSPECTION
Publication number
20240085342
Publication date
Mar 14, 2024
PILKINGTON GROUP LIMITED
Simon CHERRY
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
Publication number
20240011915
Publication date
Jan 11, 2024
SEMES CO., LTD.
Hark Ryong KIM
G01 - MEASURING TESTING
Information
Patent Application
TESTING DEVICE AND TESTING METHOD
Publication number
20240003829
Publication date
Jan 4, 2024
CARL ZEISS VISION INTERNATIONAL GMBH
Marc Flemming
G01 - MEASURING TESTING
Information
Patent Application
TAB IMAGE ACQUISITION DEVICE, SYSTEM, AND METHOD
Publication number
20240003822
Publication date
Jan 4, 2024
Contemporary Amperex Technology Co., Limited
Yinhang TU
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
DEFECT REMOVAL DEVICE, DEFECT REMOVAL METHOD, PATTERN FORMING METHO...
Publication number
20230395366
Publication date
Dec 7, 2023
FUJIFILM CORPORATION
Akihiko OHTSU
G01 - MEASURING TESTING
Information
Patent Application
DYNAMIC ILLUMINATION INSPECTION TUNNEL
Publication number
20230304939
Publication date
Sep 28, 2023
VIRELUX INSPECTION SYSTEMS SARL
Tom REICHERT
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL DETECTION APPARATUS, OPTICAL DETECTING METHOD, AND IMAGE PR...
Publication number
20230204517
Publication date
Jun 29, 2023
HONGFUJIN PRECISION ELECTRONICS (ZHENGZHOU) CO., LTD.
TIAN-TIAN FAN
G01 - MEASURING TESTING
Information
Patent Application
3D IMAGE ACQUISITION SYSTEM FOR OPTICAL INSPECTION AND METHOD FOR O...
Publication number
20230204519
Publication date
Jun 29, 2023
Scuola universitaria professionale della Svizzera italiana (SUPSI)
Daniele Guido ALLEGRI
G01 - MEASURING TESTING
Information
Patent Application
WAFER INSPECTION APPARATUS USING THREE-DIMENSIONAL IMAGE AND METHOD...
Publication number
20230184691
Publication date
Jun 15, 2023
Samsung Electronics Co., Ltd.
Yusin YANG
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
LUMINAIRE ELEMENT FOR AN INSPECTION TUNNEL, LUMINAIRE STRIP, AND IN...
Publication number
20230160833
Publication date
May 25, 2023
Dürr Systems AG
Dietmar WIELAND
F21 - LIGHTING
Information
Patent Application
COMBINED OCD AND PHOTOREFLECTANCE METHOD AND SYSTEM
Publication number
20230035404
Publication date
Feb 2, 2023
NOVA LTD
Yonatan OREN
G01 - MEASURING TESTING
Information
Patent Application
IMAGE ACQUISITION METHOD AND IMAGE ACQUISITION APPARATUS
Publication number
20230009656
Publication date
Jan 12, 2023
NuFlare Technology, Inc.
Yasuhiro YAMASHITA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD FOR ILLUMINATION AND SYSTEM FOR DETERMINING SPECTRAL DISTRIB...
Publication number
20230003662
Publication date
Jan 5, 2023
NALUX CO., LTD.
Michitomo ISHII
G01 - MEASURING TESTING
Information
Patent Application
Workforce Augmenting Inspection Device
Publication number
20220317053
Publication date
Oct 6, 2022
Lockheed Martin Corporation
Christopher Lee Colaw
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
NANO PROJECTION STRUCTURE INSPECTION APPARATUS AND NANO PROJECTION...
Publication number
20220260501
Publication date
Aug 18, 2022
Prime Planet Energy & Solutions, Inc.
Yuki SATO
G01 - MEASURING TESTING
Information
Patent Application
GEMSTONE BLUE FLUORESCENCE DETECTION AND GRADING
Publication number
20220196565
Publication date
Jun 23, 2022
GEMOLOGICAL INSTITUTE OF AMERICA, INC. (GIA)
Yun LUO
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Large-Particle Monitoring with Laser Power Control for Defect Inspe...
Publication number
20220091047
Publication date
Mar 24, 2022
KLA Corporation
Anatoly Romanovsky
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
OPTICAL STATE MONITOR WITH AN INDICATOR-SENSOR
Publication number
20220057335
Publication date
Feb 24, 2022
Paul Atkinson
G08 - SIGNALLING
Information
Patent Application
MULTI-SOURCE ILLUMINATION UNIT AND METHOD OF OPERATING THE SAME
Publication number
20210396683
Publication date
Dec 23, 2021
ASML NETHERLANDS B.V.
Jian ZHANG
G01 - MEASURING TESTING
Information
Patent Application
DEVICE AND METHOD FOR CHECKING FOR SURFACE DEFECT, USING IMAGE SENSOR
Publication number
20210302324
Publication date
Sep 30, 2021
VIEW-ON LTD.
Young Yeop YOON
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD OF FABRICATING A PHOTOMASK AND METHOD OF INSPECTING A PHOTOMASK
Publication number
20210278760
Publication date
Sep 9, 2021
Taiwan Semiconductor Manufacturing Company, Ltd.
Tsun-Cheng Tang
G01 - MEASURING TESTING
Information
Patent Application
MACRO INSPECTION SYSTEMS, APPARATUS AND METHODS
Publication number
20210181121
Publication date
Jun 17, 2021
Nanotronics Imaging, Inc.
Matthew C. Putman
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR INSPECTION OF A FILM ON A SUBSTRATE
Publication number
20200400585
Publication date
Dec 24, 2020
BWXT Nuclear Operations Group, Inc.
Aaron C. Havener
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR OPTICAL INSPECTION OF AN OBJECT
Publication number
20200340929
Publication date
Oct 29, 2020
IVISYS SWEDEN AB
Moatasem CHEHAIBER
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
OPTICALLY DETERMINING THE CONDITION OF GOODS
Publication number
20200309712
Publication date
Oct 1, 2020
Paul Atkinson
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR INSPECTION OF A FILM ON A SUBSTRATE
Publication number
20200271591
Publication date
Aug 27, 2020
Aaron C. Havener
G01 - MEASURING TESTING
Information
Patent Application
MACRO INSPECTION SYSTEMS, APPARATUS AND METHODS
Publication number
20200240925
Publication date
Jul 30, 2020
Nanotronics Imaging, Inc.
MATTHEW C. PUTMAN
G01 - MEASURING TESTING