Adjusting baseline or gain (also for web inspection)

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CPC
G01N2021/933

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Current Industry

G01N2021/933Adjusting baseline or gain (also for web inspection)

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Optical device
- Patent number 11,921,038
- Issue date Mar 5, 2024
- Asahi Kasei Microdevices Corporation
- Kengo Sasayama
- G01 - MEASURING TESTING
Information Patent Grant
System and method for material characterization
- Patent number 11,796,479
- Issue date Oct 24, 2023
- Southern Innovation International Pty Ltd
- Paul Scoullar
- E21 - EARTH DRILLING MINING
Information Patent Grant
System and method for material characterization
- Patent number 11,243,327
- Issue date Feb 8, 2022
- Southern Innovation International Pty Ltd
- Paul Scoullar
- G01 - MEASURING TESTING
Information Patent Grant
System and method for material characterization
- Patent number 10,962,485
- Issue date Mar 30, 2021
- Southern Innovation International Pty Ltd
- Paul Scoullar
- E21 - EARTH DRILLING MINING
Information Patent Grant
Method and apparatus for inspecting hot hollow articles that are tr...
- Patent number 7,098,440
- Issue date Aug 29, 2006
- Tiama
- Guillaume Bathelet
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Light scanner web profile measurement apparatus and method
- Patent number 5,073,712
- Issue date Dec 17, 1991
- ABB Process Automation, Inc.
- Ake A. Hellstrom
- G01 - MEASURING TESTING
Information Patent Grant
Roll mark inspection apparatus
- Patent number 4,958,307
- Issue date Sep 18, 1990
- Kabushiki Kaisha Toshiba
- Seikichi Nishimura
- G01 - MEASURING TESTING
Information Patent Grant
Flaw detector for detecting flaws in a sheet
- Patent number 4,724,481
- Issue date Feb 9, 1988
- Futec Inc.
- Shizuo Nishioka
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL DEVICE
- Publication number 20240159662
- Publication date May 16, 2024
- ASAHI KASEI MICRODEVICES CORPORATION
- Kengo SASAYAMA
- G02 - OPTICS
Information Patent Application
SYSTEM AND METHOD FOR MATERIAL CHARACTERIZATION
- Publication number 20210199592
- Publication date Jul 1, 2021
- Southern Innovation International Pty Ltd
- Paul Scoullar
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR MATERIAL CHARACTERIZATION
- Publication number 20190212273
- Publication date Jul 11, 2019
- Paul SCOULLAR
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR MATERIAL CHARACTERIZATION
- Publication number 20190212272
- Publication date Jul 11, 2019
- Paul SCOULLAR
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for inspecting hot hollow articles that are tr...
- Publication number 20040262523
- Publication date Dec 30, 2004
- Guillaume Bathelet
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL

Adjusting baseline or gain (also for web inspection)

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Optical device

System and method for material characterization

System and method for material characterization

System and method for material characterization

Method and apparatus for inspecting hot hollow articles that are tr...

Light scanner web profile measurement apparatus and method

Roll mark inspection apparatus

Flaw detector for detecting flaws in a sheet

Patents Applicationslast 30 patents

OPTICAL DEVICE

SYSTEM AND METHOD FOR MATERIAL CHARACTERIZATION

SYSTEM AND METHOD FOR MATERIAL CHARACTERIZATION

SYSTEM AND METHOD FOR MATERIAL CHARACTERIZATION

Method and apparatus for inspecting hot hollow articles that are tr...