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Contour measuring probe
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Patent number 7,650,701
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Issue date Jan 26, 2010
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Hong Fu Jin Precision Industry (ShenZhen) Co., Ltd.
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Qing Liu
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G01 - MEASURING TESTING
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Height gauge
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Patent number 6,357,134
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Issue date Mar 19, 2002
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Mitutoyo Corporation
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Nobuyuki Hama
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G01 - MEASURING TESTING
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Air chuck with measuring function
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Patent number 6,308,431
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Issue date Oct 30, 2001
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SMC Corporation
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Seiji Takanashi
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B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
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Stage apparatus having rotary table
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Patent number 6,082,010
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Issue date Jul 4, 2000
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Samsung Aerospace Industries, Ltd.
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Hyung-seok Lee
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B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
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Wheel alignment apparatus
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Patent number 6,070,332
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Issue date Jun 6, 2000
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AIM Automotive Integrated Manufacturing, Inc.
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John Kane
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G01 - MEASURING TESTING
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Tool presetting device
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Patent number 6,061,917
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Issue date May 16, 2000
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PWB AG
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Helmuth Graf
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B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
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Air bearing control system
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Patent number 5,347,723
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Issue date Sep 20, 1994
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Brown & Sharpe Mfg. Co.
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Gary W. Russell
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B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
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Modular gage
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Patent number 5,193,286
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Issue date Mar 16, 1993
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Kevin E. Collier
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G01 - MEASURING TESTING
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Semiconductor lead planarity checker
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Patent number 5,163,232
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Issue date Nov 17, 1992
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Texas Instruments Incorporated
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David Gonzales
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H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
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Magnetic compass
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Patent number 5,107,597
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Issue date Apr 28, 1992
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Takeshi Kato
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G01 - MEASURING TESTING
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