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G01N2021/9563
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PHYSICS
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Measuring instruments
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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G01N2021/9563
and suppressing pattern images
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Patents Grants
last 30 patents
Information
Patent Grant
Inspection apparatus and inspection method
Patent number
12,013,349
Issue date
Jun 18, 2024
Hamamatsu Photonics K.K.
Tomonori Nakamura
G01 - MEASURING TESTING
Information
Patent Grant
Modular optical inspection station
Patent number
11,989,872
Issue date
May 21, 2024
Instrumental, Inc.
Samuel Bruce Weiss
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Multimodality multiplexed illumination for optical inspection systems
Patent number
11,974,046
Issue date
Apr 30, 2024
Yigal Katzir
G01 - MEASURING TESTING
Information
Patent Grant
Measurement machine and method for detecting a defect in solder joints
Patent number
11,927,436
Issue date
Mar 12, 2024
Hewlett Packard Enterprise Development LP
Jaime E. Llinas
G01 - MEASURING TESTING
Information
Patent Grant
System and method for rapid inspection of printed circuit board usi...
Patent number
11,906,578
Issue date
Feb 20, 2024
Battelle Memorial Institute
Thomas F. Kent
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of automatically setting optical parameters and automated op...
Patent number
11,788,972
Issue date
Oct 17, 2023
Industrial Technology Research Institute
Chi-Chun Hsia
G01 - MEASURING TESTING
Information
Patent Grant
Fiber weave skew assessment for printed circuit boards
Patent number
11,781,858
Issue date
Oct 10, 2023
Cisco Technology, Inc.
Amendra Koul
G01 - MEASURING TESTING
Information
Patent Grant
Fiber weave skew assessment for printed circuit boards
Patent number
11,761,755
Issue date
Sep 19, 2023
Cisco Technology, Inc.
Amendra Koul
G01 - MEASURING TESTING
Information
Patent Grant
Circuit board anomaly indication
Patent number
11,435,298
Issue date
Sep 6, 2022
Hewlett Packard Enterprise Development LP
David A. Moore
G01 - MEASURING TESTING
Information
Patent Grant
Printed circuit board assembly defect detection
Patent number
11,423,577
Issue date
Aug 23, 2022
International Business Machines Corporation
Matthew S. Kelly
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for inspecting mounting state of component, printed circuit...
Patent number
11,328,407
Issue date
May 10, 2022
Koh Young Technology Inc.
Se Rin Lee
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Modular optical inspection station
Patent number
11,321,824
Issue date
May 3, 2022
Instrumental, Inc.
Samuel Bruce Weiss
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Fiber weave skew assessment for printed circuit boards
Patent number
11,293,752
Issue date
Apr 5, 2022
Cisco Technology, Inc.
Amendra Koul
G01 - MEASURING TESTING
Information
Patent Grant
Fiber weave skew assessment for printed circuit boards
Patent number
11,287,245
Issue date
Mar 29, 2022
Cisco Technology, Inc.
Amendra Koul
G01 - MEASURING TESTING
Information
Patent Grant
Method for inspecting mounting state of component, printed circuit...
Patent number
11,244,436
Issue date
Feb 8, 2022
Koh Young Technology Inc.
Se Rin Lee
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Image inspecting apparatus, image inspecting method and image inspe...
Patent number
11,080,843
Issue date
Aug 3, 2021
Omron Corporation
Shingo Inazumi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Board inspecting apparatus and board inspecting method using the same
Patent number
10,986,761
Issue date
Apr 20, 2021
Koh Young Technology Inc.
Seung Won Jung
G01 - MEASURING TESTING
Information
Patent Grant
System and method for the positioning and optical inspection of an...
Patent number
10,928,333
Issue date
Feb 23, 2021
VIT
Nicolas Guillot
G01 - MEASURING TESTING
Information
Patent Grant
Inspection management system, inspection management apparatuses, an...
Patent number
10,876,977
Issue date
Dec 29, 2020
Omron Corporation
Hiroyuki Mori
G01 - MEASURING TESTING
Information
Patent Grant
Three-dimensional shape measurement apparatus
Patent number
10,788,318
Issue date
Sep 29, 2020
Koh Young Technology Inc.
Moon Young Jeon
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Board inspecting apparatus and method of compensating board distort...
Patent number
10,791,661
Issue date
Sep 29, 2020
Koh Young Technology Inc.
Seung Won Jung
G01 - MEASURING TESTING
Information
Patent Grant
Modular optical inspection station
Patent number
10,783,624
Issue date
Sep 22, 2020
Instrumental, Inc.
Samuel Bruce Weiss
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of inspecting foreign substance on substrate
Patent number
10,705,028
Issue date
Jul 7, 2020
Koh Young Technology Inc.
Hyun-Seok Lee
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Fiber weave skew assessment for printed circuit boards
Patent number
10,684,123
Issue date
Jun 16, 2020
Cisco Technology, Inc.
Amendra Koul
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Solder printing inspection device
Patent number
10,679,332
Issue date
Jun 9, 2020
CKD Corporation
Manabu Okuda
G01 - MEASURING TESTING
Information
Patent Grant
Substrate inspection method and system
Patent number
10,672,116
Issue date
Jun 2, 2020
Koh Young Technology Inc.
Seung Ae Seo
G01 - MEASURING TESTING
Information
Patent Grant
Substrate inspection apparatus and method
Patent number
10,650,510
Issue date
May 12, 2020
Koh Young Technology Inc.
Seung Ae Seo
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Dye and pry process for removing quad flat no-lead packages and bot...
Patent number
10,593,601
Issue date
Mar 17, 2020
International Business Machines Corporation
Tim A. Bartsch
G01 - MEASURING TESTING
Information
Patent Grant
Method for checking an electronic component
Patent number
10,571,413
Issue date
Feb 25, 2020
YXLON International GmbH
Keith Bryant
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Optical inspection system for printed circuit board or the like
Patent number
10,527,559
Issue date
Jan 7, 2020
Robert Scott Simmons
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
MODULAR OPTICAL INSPECTION STATION
Publication number
20240265518
Publication date
Aug 8, 2024
Instrumental, Inc.
Samuel Bruce Weiss
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
BOARD TESTING APPARATUS AND BOARD TESTING METHOD
Publication number
20240201106
Publication date
Jun 20, 2024
CKD CORPORATION
Kazuyoshi Kikuchi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEM AND METHOD FOR RAPID INSPECTION OF PRINTED CIRCUIT BOARD USI...
Publication number
20240142516
Publication date
May 2, 2024
Battelle Memorial Institute
Thomas F. Kent
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
3D IMAGE ACQUISITION SYSTEM FOR OPTICAL INSPECTION AND METHOD FOR O...
Publication number
20230204519
Publication date
Jun 29, 2023
Scuola universitaria professionale della Svizzera italiana (SUPSI)
Daniele Guido ALLEGRI
G01 - MEASURING TESTING
Information
Patent Application
System and Method for Inspection of Multiple Features of Patterned...
Publication number
20230105983
Publication date
Apr 6, 2023
ORBOTECH LTD.
Vered Gatt
G01 - MEASURING TESTING
Information
Patent Application
EXTERNAL APPEARANCE INSPECTION APPARATUS AND EXTERNAL APPEARANCE IN...
Publication number
20220381700
Publication date
Dec 1, 2022
Omron Corporation
Shingo HAYASHI
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
Publication number
20220373480
Publication date
Nov 24, 2022
Hamamatsu Photonics K.K.
Tomonori NAKAMURA
G01 - MEASURING TESTING
Information
Patent Application
FIBER WEAVE SKEW ASSESSMENT FOR PRINTED CIRCUIT BOARDS
Publication number
20220128350
Publication date
Apr 28, 2022
Cisco Technology, Inc.
Amendra Koul
G01 - MEASURING TESTING
Information
Patent Application
FIBER WEAVE SKEW ASSESSMENT FOR PRINTED CIRCUIT BOARDS
Publication number
20220120558
Publication date
Apr 21, 2022
Cisco Technology, Inc.
Amendra Koul
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
METHODS AND APPARATUS FOR DETECTING DEFECTS IN SEMICONDUCTOR SYSTEMS
Publication number
20220120699
Publication date
Apr 21, 2022
Axiomatique Technologies, Inc.
Trevor A. NORMAN
G01 - MEASURING TESTING
Information
Patent Application
CIRCUIT BOARD ANOMALY INDICATION
Publication number
20220026375
Publication date
Jan 27, 2022
HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP
David A. Moore
G01 - MEASURING TESTING
Information
Patent Application
PRINTED CIRCUIT BOARD ASSEMBLY DEFECT DETECTION
Publication number
20220012917
Publication date
Jan 13, 2022
International Business Machines Corporation
Matthew S. Kelly
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
MULTIMODALITY MULTIPLEXED ILLUMINATION FOR OPTICAL INSPECTION SYSTEMS
Publication number
20210360140
Publication date
Nov 18, 2021
ORBOTECH LTD.
Yigal KATZIR
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR RAPID INSPECTION OF PRINTED CIRCUIT BOARD USI...
Publication number
20210082101
Publication date
Mar 18, 2021
Battelle Memorial Institute
Thomas F. Kent
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD FOR INSPECTING MOUNTING STATE OF COMPONENT, PRINTED CIRCUIT...
Publication number
20210042910
Publication date
Feb 11, 2021
KOH YOUNG TECHNOLOGY INC.
Se Rin LEE
G01 - MEASURING TESTING
Information
Patent Application
FIBER WEAVE SKEW ASSESSMENT FOR PRINTED CIRCUIT BOARDS
Publication number
20200263976
Publication date
Aug 20, 2020
Cisco Technology, Inc.
Amendra Koul
G01 - MEASURING TESTING
Information
Patent Application
FIBER WEAVE SKEW ASSESSMENT FOR PRINTED CIRCUIT BOARDS
Publication number
20200263977
Publication date
Aug 20, 2020
Cisco Technology, Inc.
Amendra Koul
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR THE POSITIONING AND OPTICAL INSPECTION OF AN...
Publication number
20200057004
Publication date
Feb 20, 2020
VIT
Nicolas GUILLOT
G01 - MEASURING TESTING
Information
Patent Application
BOARD INSPECTING APPARATUS AND METHOD OF COMPENSATING BOARD DISTORT...
Publication number
20200045862
Publication date
Feb 6, 2020
KOH YOUNG TECHNOLOGY INC.
Seung Won JUNG
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
REMOTE VIDEO INSPECTION SYSTEM
Publication number
20190349511
Publication date
Nov 14, 2019
FRONTIER ELECTRONIC SYSTEMS CORP.
Kurt Ashley McLain
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
THREE-DIMENSIONAL SHAPE MEASUREMENT APPARATUS
Publication number
20190226837
Publication date
Jul 25, 2019
KOH YOUNG TECHNOLOGY INC.
Moon Young JEON
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
INSPECTION MANAGEMENT SYSTEM, INSPECTION MANAGEMENT APPARATUSES, AN...
Publication number
20190219521
Publication date
Jul 18, 2019
Omron Corporation
Hiroyuki MORI
G01 - MEASURING TESTING
Information
Patent Application
FIBER WEAVE SKEW ASSESSMENT FOR PRINTED CIRCUIT BOARDS
Publication number
20190219385
Publication date
Jul 18, 2019
Cisco Technology, Inc.
Amendra Koul
G01 - MEASURING TESTING
Information
Patent Application
Inspection Apparatus For Inspecting Electronic Components Of Circui...
Publication number
20190172190
Publication date
Jun 6, 2019
INVENTEC (PUDONG) TECHNOLOGY CORPORATION
Hao Liu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
AUTOMATIC OPTICAL INSPECTION SYSTEM AND OPERATING METHOD THEREOF
Publication number
20180276811
Publication date
Sep 27, 2018
Test Research, Inc.
Kuang-Pu WEN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
OPTICAL INSPECTION SYSTEM FOR PRINTED CIRCUIT BOARD OR THE LIKE
Publication number
20180209917
Publication date
Jul 26, 2018
Robert Scott SIMMONS
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS OF INSPECTING A SUBSTRATE WITH A COMPONENT MOU...
Publication number
20170363548
Publication date
Dec 21, 2017
KOH YOUNG TECHNOLOGY INC.
Joong-Ki JEONG
G01 - MEASURING TESTING
Information
Patent Application
HIGH SPEED AUTOFOCUS SYSTEM
Publication number
20160352997
Publication date
Dec 1, 2016
RUDOLPH TECHNOLOGIES, INC.
Robert Bishop
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF MANUFACTURING PRINTED CIRCUIT BOARD AND METHOD OF INSPECT...
Publication number
20160266050
Publication date
Sep 15, 2016
Nitto Denko Corporation
Yoshihiro TOYODA
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF GENERATING A COMPENSATION MATRIX DURING A SUBSTRATE INSPE...
Publication number
20160223468
Publication date
Aug 4, 2016
KOH YOUNG TECHNOLOGY INC.
Seungwon JUNG
G01 - MEASURING TESTING