and using two light sources

Follow

Industry

CPC
G01N2021/1753

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Current Industry

G01N2021/1753and using two light sources

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Spectrometry device and spectrometry method
- Patent number 11,555,782
- Issue date Jan 17, 2023
- Yokogawa Electric Corporation
- Masanori Okada
- G01 - MEASURING TESTING
Information Patent Grant
Data processing apparatus, optical detection system, data processin...
- Patent number 10,228,327
- Issue date Mar 12, 2019
- Sony Corporation
- Naoki Morimoto
- G01 - MEASURING TESTING
Information Patent Grant
Defect detection by thermal frequency imaging
- Patent number 9,000,790
- Issue date Apr 7, 2015
- STMicroelectronics S.A.
- Guillaume Celi
- G01 - MEASURING TESTING
Information Patent Grant
Authentication system, data device, and methods for using the same
- Patent number 7,175,086
- Issue date Feb 13, 2007
- General Electric Company
- David Gascoyne
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
CONE PENETROMETER AND METHOD FOR DETECTING MULTI-POLLUTANTS BASED O...
- Publication number 20240230616
- Publication date Jul 11, 2024
- ZHEJIANG UNIVERSITY
- Liangtong ZHAN
- G01 - MEASURING TESTING
Information Patent Application
Defect Detection by Thermal Frequency Imaging
- Publication number 20130002283
- Publication date Jan 3, 2013
- STMicroelectronics S.A.
- Guillaume Celi
- G01 - MEASURING TESTING
Information Patent Application
AUTHENTICATION SYSTEM, DATA DEVICE, AND METHODS FOR USING THE SAME
- Publication number 20050236481
- Publication date Oct 27, 2005
- General Electric Company
- David Gascoyne
- G01 - MEASURING TESTING