Ann, neural base quality management

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G05B2219/32193

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GPHYSICS G05Controlling systems G05BCONTROL OR REGULATING SYSTEMS IN GENERAL FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS G05B2219/00Program-control systems

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G05B2219/32193Ann, neural base quality management

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Patents Grantslast 30 patents

Information Patent Grant
Predictive process control for a manufacturing process
- Patent number 12,153,412
- Issue date Nov 26, 2024
- Nanotronics Imaging, Inc.
- Matthew C. Putman
- G05 - CONTROLLING REGULATING
Information Patent Grant
Predictive process control for a manufacturing process
- Patent number 12,153,411
- Issue date Nov 26, 2024
- Nanotronics Imaging, Inc.
- Matthew C. Putman
- G05 - CONTROLLING REGULATING
Information Patent Grant
Predictive process control for a manufacturing process
- Patent number 12,117,814
- Issue date Oct 15, 2024
- Nanotronics Imaging, Inc.
- Matthew C. Putman
- G05 - CONTROLLING REGULATING
Information Patent Grant
Predictive process control for a manufacturing process
- Patent number 12,111,645
- Issue date Oct 8, 2024
- Nanotronics Imaging, Inc.
- Matthew C. Putman
- G05 - CONTROLLING REGULATING
Information Patent Grant
Predictive process control for a manufacturing process
- Patent number 12,072,691
- Issue date Aug 27, 2024
- Nanotronics Imaging, Inc.
- Matthew C. Putman
- G05 - CONTROLLING REGULATING
Information Patent Grant
Predictive process control for a manufacturing process
- Patent number 12,038,743
- Issue date Jul 16, 2024
- Nanotronics Imaging, Inc.
- Matthew C. Putman
- G05 - CONTROLLING REGULATING
Information Patent Grant
Predictive process control for a manufacturing process
- Patent number 12,032,365
- Issue date Jul 9, 2024
- Nanotronics Imaging, Inc.
- Matthew C. Putman
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and apparatus for configuring processing parameters of produ...
- Patent number 11,982,996
- Issue date May 14, 2024
- Siemens Aktiengesellschaft
- Cheng Feng
- G05 - CONTROLLING REGULATING
Information Patent Grant
Predictive process control for a manufacturing process
- Patent number 11,953,893
- Issue date Apr 9, 2024
- Nanotronics Imaging, Inc.
- Matthew C. Putman
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for determining root cause affecting yield in a semiconducto...
- Patent number 11,803,127
- Issue date Oct 31, 2023
- ASML Netherlands B.V.
- Chenxi Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Real-time AI-based quality assurance for semiconductor production m...
- Patent number 11,720,088
- Issue date Aug 8, 2023
- LYNCEUS SAS
- David Meyer
- G05 - CONTROLLING REGULATING
Information Patent Grant
Predictive process control for a manufacturing process
- Patent number 11,709,483
- Issue date Jul 25, 2023
- Nanotronics Imaging, Inc.
- Matthew C. Putman
- G05 - CONTROLLING REGULATING
Information Patent Grant
Dimension tolerance determining method and dimension tolerance dete...
- Patent number 11,703,840
- Issue date Jul 18, 2023
- Jhong-Yi Lin
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for enhancing the semiconductor manufacturing yield
- Patent number 11,681,279
- Issue date Jun 20, 2023
- ASML Netherlands B.V.
- Wei Fang
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
System and method for controlling semiconductor manufacturing appar...
- Patent number 11,675,340
- Issue date Jun 13, 2023
- NANYA TECHNOLOGY CORPORATION
- Wen-Hsiang Lai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Predictive process control for a manufacturing process
- Patent number 11,669,078
- Issue date Jun 6, 2023
- Nanotronics Imaging, Inc.
- Matthew C. Putman
- G05 - CONTROLLING REGULATING
Information Patent Grant
Real-time anomaly detection and classification during semiconductor...
- Patent number 11,556,117
- Issue date Jan 17, 2023
- Applied Materials, Inc.
- Shahab Arabshahi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Characterizing and monitoring electrical components of manufacturin...
- Patent number 11,513,504
- Issue date Nov 29, 2022
- Applied Materials, Inc.
- David John Paul
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data driven method for automated detection of anomalous work pieces...
- Patent number 11,468,274
- Issue date Oct 11, 2022
- Siemens Aktiengesellschaft
- Denis Krompaß
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Predictive process control for a manufacturing process
- Patent number 11,156,991
- Issue date Oct 26, 2021
- Nanotronics Imaging, Inc.
- Matthew C. Putman
- G05 - CONTROLLING REGULATING
Information Patent Grant
Predictive process control for a manufacturing process
- Patent number 11,156,992
- Issue date Oct 26, 2021
- Nanotronics Imaging, Inc.
- Matthew C. Putman
- G05 - CONTROLLING REGULATING
Information Patent Grant
Combined feature creation to increase data mining signal in hybrid...
- Patent number 7,953,689
- Issue date May 31, 2011
- International Business Machines Corporation
- Steven George Barbee
- G05 - CONTROLLING REGULATING
Information Patent Grant
Process control system using spatially dependent data for controlli...
- Patent number 7,882,049
- Issue date Feb 1, 2011
- Rockwell Automation Technologies, Inc.
- L. Paul Collette, III
- G05 - CONTROLLING REGULATING
Information Patent Grant
Neural network using spatially dependent data for controlling a web...
- Patent number 7,526,463
- Issue date Apr 28, 2009
- Rockwell Automation Technologies, Inc.
- L. Paul Collette, III
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and system for virtual metrology in semiconductor manufacturing
- Patent number 7,359,759
- Issue date Apr 15, 2008
- Taiwan Semiconductor Manufacturing Company
- Chang Yung Cheng
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Control apparatus for injection molding machine
- Patent number 7,216,005
- Issue date May 8, 2007
- Nissei Plastic Industrial Co., Ltd.
- Takayoshi Shioiri
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Large scale process control by driving factor identification
- Patent number 6,904,328
- Issue date Jun 7, 2005
- Ibex Process Technology, Inc.
- Edward A. Rietman
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and device for determining relevant variables in the process...
- Patent number 6,263,257
- Issue date Jul 17, 2001
- Peter F. Aemmer
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
PREDICTIVE PROCESS CONTROL FOR A MANUFACTURING PROCESS
- Publication number 20240329625
- Publication date Oct 3, 2024
- Nanotronics Imaging, Inc.
- Matthew C. Putman
- G05 - CONTROLLING REGULATING
Information Patent Application
AUTOMATED SIMULATION METHOD BASED ON DATABASE IN SEMICONDUCTOR DES...
- Publication number 20240142960
- Publication date May 2, 2024
- Samsung Electronics Co., Ltd.
- SONGYI HAN
- G05 - CONTROLLING REGULATING
Information Patent Application
FAILURE PREDICTION IN SURFACE TREATMENT PROCESSES USING ARTIFICIAL...
- Publication number 20240012400
- Publication date Jan 11, 2024
- Siemens Corporation
- Shashank Tamaskar
- G05 - CONTROLLING REGULATING
Information Patent Application
Real-time AI-based quality assurance for semiconductor production m...
- Publication number 20230384775
- Publication date Nov 30, 2023
- LYNCEUS SAS
- David Meyer
- G05 - CONTROLLING REGULATING
Information Patent Application
PREDICTIVE PROCESS CONTROL FOR A MANUFACTURING PROCESS
- Publication number 20230367301
- Publication date Nov 16, 2023
- Nanotronics Imaging, Inc.
- Matthew C. Putman
- G05 - CONTROLLING REGULATING
Information Patent Application
PREDICTIVE PROCESS CONTROL FOR A MANUFACTURING PROCESS
- Publication number 20230315071
- Publication date Oct 5, 2023
- Nanotronics Imaging, Inc.
- Matthew C. Putman
- G05 - CONTROLLING REGULATING
Information Patent Application
DIAGNOSTIC TOOL TO TOOL MATCHING AND FULL-TRACE DRILL-DOWN ANALYASI...
- Publication number 20230236586
- Publication date Jul 27, 2023
- Applied Materials, Inc.
- Sejune Cheon
- G05 - CONTROLLING REGULATING
Information Patent Application
Real-time AI-based quality assurance for semiconductor production m...
- Publication number 20220308566
- Publication date Sep 29, 2022
- LYNCEUS SAS
- David Meyer
- G05 - CONTROLLING REGULATING
Information Patent Application
Control Device for Use on a Numerically Controlled Machine Tool, an...
- Publication number 20220244701
- Publication date Aug 4, 2022
- DECKEL MAHO SEEBACH GMBH
- Matthias BRAND
- G05 - CONTROLLING REGULATING
Information Patent Application
CONTROL AND/OR IDENTIFICATION METHOD IN AN AUTOMATIC MACHINE FOR TH...
- Publication number 20220212826
- Publication date Jul 7, 2022
- G.D SOCIETA' PER AZIONI
- Maria Eleonora Cesarini
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD AND APPARATUS FOR CONFIGURING PROCESSING PARAMETERS OF PRODU...
- Publication number 20220206469
- Publication date Jun 30, 2022
- Siemens Aktiengesellschaft
- Cheng FENG
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD AND SYSTEM FOR QUALITY CONTROL IN INDUSTRIAL MANUFACTURING
- Publication number 20220147871
- Publication date May 12, 2022
- Ahmed Frikha
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR DETERMINING ROOT CAUSE AFFECTING YIELD IN A SEMICONDUCTO...
- Publication number 20210389677
- Publication date Dec 16, 2021
- ASML NETHERLANDS B.V.
- Chenxi LIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
In-Situ Inspection Method Based on Digital Data Model of Weld
- Publication number 20210318673
- Publication date Oct 14, 2021
- BWXT Advanced Technologies LLC
- Ryan Scott KITCHEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR CONTROLLING SEMICONDUCTOR MANUFACTURING APPAR...
- Publication number 20210320021
- Publication date Oct 14, 2021
- NANYA TECHNOLOGY CORPORATION
- WEN-HSIANG LAI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PREDICTIVE PROCESS CONTROL FOR A MANUFACTURING PROCESS
- Publication number 20210318674
- Publication date Oct 14, 2021
- Nanotronics Imaging, Inc.
- Matthew C. Putman
- G05 - CONTROLLING REGULATING
Information Patent Application
PREDICTIVE PROCESS CONTROL FOR A MANUFACTURING PROCESS
- Publication number 20210311465
- Publication date Oct 7, 2021
- Nanotronics Imaging, Inc.
- Matthew C. Putman
- G05 - CONTROLLING REGULATING
Information Patent Application
DIMENSION TOLERANCE DETERMINING METHOD AND DIMENSION TOLERANCE DETE...
- Publication number 20210294313
- Publication date Sep 23, 2021
- JHONG-YI LIN
- G05 - CONTROLLING REGULATING
Information Patent Application
REAL-TIME ANOMALY DETECTION AND CLASSIFICATION DURING SEMICONDUCTOR...
- Publication number 20210116896
- Publication date Apr 22, 2021
- Applied Materials, Inc.
- Shahab Arabshahi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PREDICTIVE PROCESS CONTROL FOR A MANUFACTURING PROCESS
- Publication number 20200401119
- Publication date Dec 24, 2020
- Nanotronics Imaging, Inc.
- Matthew C. Putman
- G05 - CONTROLLING REGULATING
Information Patent Application
PREDICTIVE PROCESS CONTROL FOR A MANUFACTURING PROCESS
- Publication number 20200401120
- Publication date Dec 24, 2020
- Nanotronics Imaging, Inc.
- Matthew C. Putman
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD FOR ENHANCING THE SEMICONDUCTOR MANUFACTURING YIELD
- Publication number 20190187670
- Publication date Jun 20, 2019
- ASML Netherlands B.V.
- Wei FANG
- G05 - CONTROLLING REGULATING
Information Patent Application
Combined Feature Creation to Increase Data Mining Signal in Hybrid...
- Publication number 20090157594
- Publication date Jun 18, 2009
- Steven George Barbee
- G05 - CONTROLLING REGULATING
Information Patent Application
PROCESS CONTROL SYSTEM USING SPATIALLY DEPENDENT DATA FOR CONTROLLI...
- Publication number 20080300709
- Publication date Dec 4, 2008
- Rockwell Automation Technologies, Inc.
- L. Paul Collette, III
- G05 - CONTROLLING REGULATING
Information Patent Application
Method and system for virtual metrology in semiconductor manufacturing
- Publication number 20070100487
- Publication date May 3, 2007
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chang Yung Cheng
- G05 - CONTROLLING REGULATING
Information Patent Application
Neural network using spatially dependent data for controlling a web...
- Publication number 20070005525
- Publication date Jan 4, 2007
- L. Paul Collette
- G05 - CONTROLLING REGULATING
Information Patent Application
Control apparatus for injection molding machine
- Publication number 20060224540
- Publication date Oct 5, 2006
- NISSEI PLASTIC INDUSTRIAL CO., LTD.
- Takayoshi Shioiri
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
Large scale process control by driving factor identification
- Publication number 20030093762
- Publication date May 15, 2003
- Edward A. Rietman
- G05 - CONTROLLING REGULATING
Information Patent Application
Production pattern-recognition artificial neural net (ANN) with eve...
- Publication number 20030028353
- Publication date Feb 6, 2003
- Brian Gventer
- G06 - COMPUTING CALCULATING COUNTING

Ann, neural base quality management

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Predictive process control for a manufacturing process

Predictive process control for a manufacturing process

Predictive process control for a manufacturing process

Predictive process control for a manufacturing process

Predictive process control for a manufacturing process

Predictive process control for a manufacturing process

Predictive process control for a manufacturing process

Method and apparatus for configuring processing parameters of produ...

Predictive process control for a manufacturing process

Method for determining root cause affecting yield in a semiconducto...

Real-time AI-based quality assurance for semiconductor production m...

Predictive process control for a manufacturing process

Dimension tolerance determining method and dimension tolerance dete...

Method for enhancing the semiconductor manufacturing yield

System and method for controlling semiconductor manufacturing appar...

Predictive process control for a manufacturing process

Real-time anomaly detection and classification during semiconductor...

Characterizing and monitoring electrical components of manufacturin...

Data driven method for automated detection of anomalous work pieces...

Predictive process control for a manufacturing process

Predictive process control for a manufacturing process

Combined feature creation to increase data mining signal in hybrid...

Process control system using spatially dependent data for controlli...

Neural network using spatially dependent data for controlling a web...

Method and system for virtual metrology in semiconductor manufacturing

Control apparatus for injection molding machine

Large scale process control by driving factor identification

Method and device for determining relevant variables in the process...

Patents Applicationslast 30 patents

PREDICTIVE PROCESS CONTROL FOR A MANUFACTURING PROCESS

AUTOMATED SIMULATION METHOD BASED ON DATABASE IN SEMICONDUCTOR DES...

FAILURE PREDICTION IN SURFACE TREATMENT PROCESSES USING ARTIFICIAL...

Real-time AI-based quality assurance for semiconductor production m...

PREDICTIVE PROCESS CONTROL FOR A MANUFACTURING PROCESS

PREDICTIVE PROCESS CONTROL FOR A MANUFACTURING PROCESS

DIAGNOSTIC TOOL TO TOOL MATCHING AND FULL-TRACE DRILL-DOWN ANALYASI...

Real-time AI-based quality assurance for semiconductor production m...

Control Device for Use on a Numerically Controlled Machine Tool, an...

CONTROL AND/OR IDENTIFICATION METHOD IN AN AUTOMATIC MACHINE FOR TH...

METHOD AND APPARATUS FOR CONFIGURING PROCESSING PARAMETERS OF PRODU...

METHOD AND SYSTEM FOR QUALITY CONTROL IN INDUSTRIAL MANUFACTURING

METHOD FOR DETERMINING ROOT CAUSE AFFECTING YIELD IN A SEMICONDUCTO...

In-Situ Inspection Method Based on Digital Data Model of Weld

SYSTEM AND METHOD FOR CONTROLLING SEMICONDUCTOR MANUFACTURING APPAR...

PREDICTIVE PROCESS CONTROL FOR A MANUFACTURING PROCESS

PREDICTIVE PROCESS CONTROL FOR A MANUFACTURING PROCESS

DIMENSION TOLERANCE DETERMINING METHOD AND DIMENSION TOLERANCE DETE...

REAL-TIME ANOMALY DETECTION AND CLASSIFICATION DURING SEMICONDUCTOR...

PREDICTIVE PROCESS CONTROL FOR A MANUFACTURING PROCESS

PREDICTIVE PROCESS CONTROL FOR A MANUFACTURING PROCESS

METHOD FOR ENHANCING THE SEMICONDUCTOR MANUFACTURING YIELD

Combined Feature Creation to Increase Data Mining Signal in Hybrid...

PROCESS CONTROL SYSTEM USING SPATIALLY DEPENDENT DATA FOR CONTROLLI...

Method and system for virtual metrology in semiconductor manufacturing

Neural network using spatially dependent data for controlling a web...

Control apparatus for injection molding machine

Large scale process control by driving factor identification

Production pattern-recognition artificial neural net (ANN) with eve...