Arrangement with total internal reflection

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G01N2021/212

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

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G01N2021/212Arrangement with total internal reflection

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Patents Grantslast 30 patents

Information Patent Grant
Single ion detection method and device
- Patent number 11,808,695
- Issue date Nov 7, 2023
- INSTITUTE OF MECHANICS, CHINESE ACADEMY OF SCIENCES
- Wei Liu
- G01 - MEASURING TESTING
Information Patent Grant
Total internal reflection enabled wide-field Coherent anti-Stokes R...
- Patent number 11,604,144
- Issue date Mar 14, 2023
- UT-Battelle, LLC
- Benjamin L. Doughty
- G01 - MEASURING TESTING
Information Patent Grant
Total internal reflection and transmission illumination fluorescenc...
- Patent number 10,908,072
- Issue date Feb 2, 2021
- The Board of Regents of the University of Texas System
- Reto P Fiolka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Differential polarisation imaging and imaging precision ellipsometry
- Patent number 10,809,182
- Issue date Oct 20, 2020
- Agency for Science, Technology and Research
- Nikolai Leopoldovich Yakovlev
- G01 - MEASURING TESTING
Information Patent Grant
Optical sensing device, method of manufacturing the same, and optic...
- Patent number 10,690,595
- Issue date Jun 23, 2020
- Agency for Science, Technology and Research
- Chi Lok Wong
- G01 - MEASURING TESTING
Information Patent Grant
Integrated vacuum-ultraviolet, mid and near-ultraviolet, visible, n...
- Patent number 10,073,120
- Issue date Sep 11, 2018
- Board of Regents for the University of Nebraska
- Tino Hofmann
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for carrying out multiple binding reactions in an...
- Patent number 9,175,421
- Issue date Nov 3, 2015
- Bio-Rad Haifa Ltd.
- Ariel Notcovich
- G01 - MEASURING TESTING
Information Patent Grant
Birefringence correction for imaging ellipsometric bioassay system...
- Patent number 9,063,072
- Issue date Jun 23, 2015
- Maven Technologies, LLC
- Claudia Yi-Chen Lee
- G01 - MEASURING TESTING
Information Patent Grant
Intra-cavity ellipsometer system and method
- Patent number 8,941,831
- Issue date Jan 27, 2015
- Theodore Peter Rakitzis
- G01 - MEASURING TESTING
Information Patent Grant
Polarization based interferometric detector
- Patent number 8,830,481
- Issue date Sep 9, 2014
- Bioptix LLC
- John Hall
- G01 - MEASURING TESTING
Information Patent Grant
Surface plasmon resonance sensor using vertical illuminating focuse...
- Patent number 8,705,039
- Issue date Apr 22, 2014
- Korea Research Institute of Standards and Science
- Hyun Mo Cho
- G01 - MEASURING TESTING
Information Patent Grant
Multi-channel surface plasmon resonance sensor using beam profile e...
- Patent number 8,705,033
- Issue date Apr 22, 2014
- Korea Research Institute of Standards and Science
- Hyun Mo Cho
- G01 - MEASURING TESTING
Information Patent Grant
Polarization based interferometric detector
- Patent number 8,488,120
- Issue date Jul 16, 2013
- Bioptix Diagnostics, Inc.
- John Hall
- G01 - MEASURING TESTING
Information Patent Grant
Fast sample height, AOI and POI alignment in mapping ellipsometer o...
- Patent number 8,436,994
- Issue date May 7, 2013
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Method of optimising the sensitivity of a surface plasmon ellipsome...
- Patent number 8,436,995
- Issue date May 7, 2013
- Attomarker Limited
- Ian Richard Hooper
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring optical extinction in a thin fil...
- Patent number 8,139,234
- Issue date Mar 20, 2012
- George Dube'
- G01 - MEASURING TESTING
Information Patent Grant
System and method for carrying out multiple binding reactions in an...
- Patent number 8,105,845
- Issue date Jan 31, 2012
- Bio-Rad Haifa Ltd.
- Ariel Notcovich
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for performing ligand binding assays on microa...
- Patent number 8,039,270
- Issue date Oct 18, 2011
- Maven Technologies, LLC
- Shane C Dultz
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting analytes using surface plasmon resonance
- Patent number 8,004,676
- Issue date Aug 23, 2011
- The Research Foundation of State University of New York
- Paras N. Prasad
- G01 - MEASURING TESTING
Information Patent Grant
Horizontal attenuated total reflection system
- Patent number 7,920,264
- Issue date Apr 5, 2011
- J. A. Woollam Co., Inc.
- Thomas F. Tiwald
- G01 - MEASURING TESTING
Information Patent Grant
Fast sample height, AOI and POI alignment in mapping ellipsometer o...
- Patent number 7,872,751
- Issue date Jan 18, 2011
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Measurement systems configured to perform measurements of a specime...
- Patent number 7,869,040
- Issue date Jan 11, 2011
- KLA-Tencor Technologies Corp.
- Hidong Kwak
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for performing ligand binding assays on microa...
- Patent number 7,867,783
- Issue date Jan 11, 2011
- Maven Technologies, LLC
- Shane C. Dultz
- G01 - MEASURING TESTING
Information Patent Grant
Automated ellipsometer and the like systems
- Patent number 7,746,472
- Issue date Jun 29, 2010
- J. A. Woollam Co., Inc.
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Grant
Flying mobile on-board ellipsometer, polarimeter, reflectometer and...
- Patent number 7,746,471
- Issue date Jun 29, 2010
- J. A. Woollam Co., Inc.
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Grant
Image acquisition, processing, and display
- Patent number 7,518,724
- Issue date Apr 14, 2009
- Maven Technologies
- William R. Rassman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated ellipsometer and the like systems
- Patent number 7,505,134
- Issue date Mar 17, 2009
- J. A. Woollam Co., Inc.
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Grant
Analytical method and apparatus
- Patent number 7,460,236
- Issue date Dec 2, 2008
- GE Healthcare Bio-Sciences AB
- Bengt Ivarsson
- G01 - MEASURING TESTING
Information Patent Grant
Measurement systems configured to perform measurements of a specime...
- Patent number 7,408,641
- Issue date Aug 5, 2008
- KLA-Tencor Technologies Corp.
- Hidong Kwak
- G01 - MEASURING TESTING
Information Patent Grant
System and method for nonlinear optical null ellipsometry
- Patent number 7,336,359
- Issue date Feb 26, 2008
- Purdue Research Foundation
- Garth J. Simpson
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SINGLE ION DETECTION METHOD AND DEVICE
- Publication number 20230228673
- Publication date Jul 20, 2023
- Institute of mechanics, Chinese academy of sciences
- Wei LIU
- G01 - MEASURING TESTING
Information Patent Application
TOTAL INTERNAL REFLECTION ENABLED WIDE-FIELD COHERENT ANTI-STOKES R...
- Publication number 20210381986
- Publication date Dec 9, 2021
- UT-Battelle, LLC
- Benjamin L. Doughty
- G01 - MEASURING TESTING
Information Patent Application
Differential Polarisation Imaging and Imaging Precision Ellipsometry
- Publication number 20190353584
- Publication date Nov 21, 2019
- Agency for Science, Technology and Research
- Nikolai Leopoldovich Yakovlev
- G01 - MEASURING TESTING
Information Patent Application
TOTAL INTERNAL REFLECTION AND TRANSMISSION ILLUMINATION FLUORESCENC...
- Publication number 20180172578
- Publication date Jun 21, 2018
- The Board of Regents of the University of Texas System
- Reto P. FIOLKA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Polarization Based Interferometric Detector
- Publication number 20130335741
- Publication date Dec 19, 2013
- John Hall
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR CARRYING OUT MULTIPLE BINDING REACTIONS IN AN...
- Publication number 20120129723
- Publication date May 24, 2012
- BIO-RAD HAIFA LTD.
- Ariel NOTCOVICH
- C40 - COMBINATORIAL CHEMISTRY
Information Patent Application
INTRA-CAVITY ELLIPSOMETER SYSTEM AND METHOD
- Publication number 20120069336
- Publication date Mar 22, 2012
- Theodore Peter Rakitzis
- G01 - MEASURING TESTING
Information Patent Application
SURFACE PLASMON RESONANCE SENSOR USING BEAM PROFILE ELLIPSOMETRY
- Publication number 20120057146
- Publication date Mar 8, 2012
- Korea Research Institute of Standards and Science
- Hyun Mo Cho
- G01 - MEASURING TESTING
Information Patent Application
MULTI-CHANNEL SURFACE PLASMON RESONANCE SENSOR USING BEAM PROFILE E...
- Publication number 20110216320
- Publication date Sep 8, 2011
- Korea Research Institute of Standards and Science
- Hyun Mo Cho
- G01 - MEASURING TESTING
Information Patent Application
Fast sample height, AOI and POI alignment in mapping ellipsometer o...
- Publication number 20110109906
- Publication date May 12, 2011
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF OPTIMISING THE SENSITIVITY OF A SURFACE PLASMON ELLIPSOME...
- Publication number 20100259754
- Publication date Oct 14, 2010
- ATTOMARKER LIMITED
- Ian Richard Hooper
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MEASURING OPTICAL EXTINCTION IN A THIN FIL...
- Publication number 20100183800
- Publication date Jul 22, 2010
- George Dube
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR PERFORMING LIGAND BINDING ASSAYS ON MICROA...
- Publication number 20090290157
- Publication date Nov 26, 2009
- Maven Technologies, LLC
- Shane C. Dultz
- G02 - OPTICS
Information Patent Application
Fast sample height, AOI and POI alignment in mapping ellipsometer o...
- Publication number 20090103093
- Publication date Apr 23, 2009
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR PERFORMING LIGAND BINDING ASSAYS ON MICROA...
- Publication number 20080207463
- Publication date Aug 28, 2008
- Shane C. Dultz
- C40 - COMBINATORIAL CHEMISTRY
Information Patent Application
IMAGE ACQUISITION, PROCESSING, AND DISPLAY
- Publication number 20080204750
- Publication date Aug 28, 2008
- MAVEN TECHNOLOGIES, INC.
- William R Rassman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ANALYTICAL METHOD AND APPARATUS
- Publication number 20080030738
- Publication date Feb 7, 2008
- Biacore AB
- Bengt Ivarsson
- G01 - MEASURING TESTING
Information Patent Application
Polarization Based Interferometric Detector
- Publication number 20080002202
- Publication date Jan 3, 2008
- John Hall
- G01 - MEASURING TESTING
Information Patent Application
System and method for carrying out multiple binding reactions in an...
- Publication number 20070087348
- Publication date Apr 19, 2007
- Ariel G. Notcovich
- C40 - COMBINATORIAL CHEMISTRY
Information Patent Application
Image acquisition, processing, and display
- Publication number 20070058166
- Publication date Mar 15, 2007
- Maven Technologies, LLC
- William R. Rassman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Analytical method and apparatus
- Publication number 20070013912
- Publication date Jan 18, 2007
- Biacore AB
- Bengt Ivarsson
- G01 - MEASURING TESTING
Information Patent Application
System and method of measuring molecular interactions
- Publication number 20060127278
- Publication date Jun 15, 2006
- Alice P. Gast
- G01 - MEASURING TESTING
Information Patent Application
Analytical method and apparatus
- Publication number 20060072115
- Publication date Apr 6, 2006
- Biacore AB
- Bengt Ivarsson
- G01 - MEASURING TESTING
Information Patent Application
Method and system for interaction analysis
- Publication number 20050131650
- Publication date Jun 16, 2005
- Biacore AB
- Karl Andersson
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for imaging
- Publication number 20050105091
- Publication date May 19, 2005
- Robert A. Lieberman
- G01 - MEASURING TESTING
Information Patent Application
Microarray scanning
- Publication number 20050030535
- Publication date Feb 10, 2005
- William Rassman
- G01 - MEASURING TESTING
Information Patent Application
Imaging method and apparatus
- Publication number 20050024642
- Publication date Feb 3, 2005
- William Rassman
- G01 - MEASURING TESTING
Information Patent Application
Analytical method and apparatus
- Publication number 20050007605
- Publication date Jan 13, 2005
- Biacore AB
- Bengt Ivarsson
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and method for imaging
- Publication number 20040207846
- Publication date Oct 21, 2004
- William Rassman
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for recognizing molecular compounds
- Publication number 20030224370
- Publication date Dec 4, 2003
- William Rassman
- C40 - COMBINATORIAL CHEMISTRY

Arrangement with total internal reflection

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Single ion detection method and device

Total internal reflection enabled wide-field Coherent anti-Stokes R...

Total internal reflection and transmission illumination fluorescenc...

Differential polarisation imaging and imaging precision ellipsometry

Optical sensing device, method of manufacturing the same, and optic...

Integrated vacuum-ultraviolet, mid and near-ultraviolet, visible, n...

System and method for carrying out multiple binding reactions in an...

Birefringence correction for imaging ellipsometric bioassay system...

Intra-cavity ellipsometer system and method

Polarization based interferometric detector

Surface plasmon resonance sensor using vertical illuminating focuse...

Multi-channel surface plasmon resonance sensor using beam profile e...

Polarization based interferometric detector

Fast sample height, AOI and POI alignment in mapping ellipsometer o...

Method of optimising the sensitivity of a surface plasmon ellipsome...

Method and apparatus for measuring optical extinction in a thin fil...

System and method for carrying out multiple binding reactions in an...

Apparatus and method for performing ligand binding assays on microa...

Method for detecting analytes using surface plasmon resonance

Horizontal attenuated total reflection system

Fast sample height, AOI and POI alignment in mapping ellipsometer o...

Measurement systems configured to perform measurements of a specime...

Apparatus and method for performing ligand binding assays on microa...

Automated ellipsometer and the like systems

Flying mobile on-board ellipsometer, polarimeter, reflectometer and...

Image acquisition, processing, and display

Automated ellipsometer and the like systems

Analytical method and apparatus

Measurement systems configured to perform measurements of a specime...

System and method for nonlinear optical null ellipsometry

Patents Applicationslast 30 patents

SINGLE ION DETECTION METHOD AND DEVICE

TOTAL INTERNAL REFLECTION ENABLED WIDE-FIELD COHERENT ANTI-STOKES R...

Differential Polarisation Imaging and Imaging Precision Ellipsometry

TOTAL INTERNAL REFLECTION AND TRANSMISSION ILLUMINATION FLUORESCENC...

Polarization Based Interferometric Detector

SYSTEM AND METHOD FOR CARRYING OUT MULTIPLE BINDING REACTIONS IN AN...

INTRA-CAVITY ELLIPSOMETER SYSTEM AND METHOD

SURFACE PLASMON RESONANCE SENSOR USING BEAM PROFILE ELLIPSOMETRY

MULTI-CHANNEL SURFACE PLASMON RESONANCE SENSOR USING BEAM PROFILE E...

Fast sample height, AOI and POI alignment in mapping ellipsometer o...

METHOD OF OPTIMISING THE SENSITIVITY OF A SURFACE PLASMON ELLIPSOME...

METHOD AND APPARATUS FOR MEASURING OPTICAL EXTINCTION IN A THIN FIL...

APPARATUS AND METHOD FOR PERFORMING LIGAND BINDING ASSAYS ON MICROA...

Fast sample height, AOI and POI alignment in mapping ellipsometer o...

APPARATUS AND METHOD FOR PERFORMING LIGAND BINDING ASSAYS ON MICROA...

IMAGE ACQUISITION, PROCESSING, AND DISPLAY

ANALYTICAL METHOD AND APPARATUS

Polarization Based Interferometric Detector

System and method for carrying out multiple binding reactions in an...

Image acquisition, processing, and display

Analytical method and apparatus

System and method of measuring molecular interactions

Analytical method and apparatus

Method and system for interaction analysis

Apparatus and method for imaging

Microarray scanning

Imaging method and apparatus

Analytical method and apparatus

Apparatus and method for imaging

Method and apparatus for recognizing molecular compounds