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Survey system
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Patent number 12,228,401
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Issue date Feb 18, 2025
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Topcon Corporation
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Takeshi Kikuchi
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G06 - COMPUTING CALCULATING COUNTING
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Surveying instrument
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Patent number 11,385,052
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Issue date Jul 12, 2022
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TOPCON Corporation
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Nobuyuki Nishita
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G01 - MEASURING TESTING
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Artificial horizon device
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Patent number 4,397,555
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Issue date Aug 9, 1983
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Her Majesty the Queen in right of Canada, as represented by the Minister of N...
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Richard E. Malcolm
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G01 - MEASURING TESTING
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Attitude indicator for divers
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Patent number 4,283,798
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Issue date Aug 18, 1981
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Her Majesty the Queen in right of Canada, as represented by the Minister of N...
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Lorne A. Kuehn
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G01 - MEASURING TESTING
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Attitude indicator for divers
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Patent number 4,172,327
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Issue date Oct 30, 1979
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Her Majesty the Queen in right of Canada as represented by the Minister of Na...
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Lorne A. Kuehn
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G01 - MEASURING TESTING
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3891328
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Patent number 3,891,328
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Issue date Jun 24, 1975
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G01 - MEASURING TESTING
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3280691
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Patent number 3,280,691
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Issue date Oct 25, 1966
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G01 - MEASURING TESTING
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2995992
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Patent number 2,995,992
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Issue date Aug 15, 1961
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G02 - OPTICS
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2782675
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Patent number 2,782,675
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Issue date Feb 26, 1957
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G01 - MEASURING TESTING
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2758500
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Patent number 2,758,500
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Issue date Aug 14, 1956
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G01 - MEASURING TESTING
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2475366
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Patent number 2,475,366
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Issue date Jul 5, 1949
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G01 - MEASURING TESTING
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2413399
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Patent number 2,413,399
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Issue date Dec 31, 1946
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G01 - MEASURING TESTING
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2375356
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Patent number 2,375,356
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Issue date May 8, 1945
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G01 - MEASURING TESTING
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2298010
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Patent number 2,298,010
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Issue date Oct 6, 1942
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G01 - MEASURING TESTING
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2118045
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Patent number 2,118,045
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Issue date May 24, 1938
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G01 - MEASURING TESTING
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1912358
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Patent number 1,912,358
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Issue date Jun 6, 1933
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G01 - MEASURING TESTING
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1705146
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Patent number 1,705,146
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Issue date Mar 12, 1929
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G01 - MEASURING TESTING
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1409938
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Patent number 1,409,938
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Issue date Mar 21, 1922
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G01 - MEASURING TESTING
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1386695
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Patent number 1,386,695
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Issue date Aug 9, 1921
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G01 - MEASURING TESTING