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Analysis device
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Patent number 12,332,259
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Issue date Jun 17, 2025
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Shimadzu Corporation
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Kazuya Takahashi
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G06 - COMPUTING CALCULATING COUNTING
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Image-based deck verification
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Patent number 12,259,398
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Issue date Mar 25, 2025
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Beckman Coulter, Inc.
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Timothy P. Sherrill
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G06 - COMPUTING CALCULATING COUNTING
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Coverslipping machine
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Patent number 11,774,331
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Issue date Oct 3, 2023
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Leica Biosystems Nussloch GmbH
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Benjamin Siehl
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G01 - MEASURING TESTING
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Automatic analysis apparatus
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Patent number 11,467,174
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Issue date Oct 11, 2022
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HITACHI HIGH-TECH CORPORATION
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Yoshihiro Kabe
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G01 - MEASURING TESTING
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Automatic analysis device
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Patent number 11,320,443
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Issue date May 3, 2022
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HITACHI HIGH-TECH CORPORATION
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Hiroya Umeki
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G01 - MEASURING TESTING
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Coverslipping machine
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Patent number 11,280,709
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Issue date Mar 22, 2022
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Leica Biosystems Nussloch GmbH
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Benjamin Siehl
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G01 - MEASURING TESTING
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Automatic analyzer
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Patent number 11,085,940
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Issue date Aug 10, 2021
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HITACHI HIGH-TECH CORPORATION
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Takayuki Noda
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G01 - MEASURING TESTING
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Photometric cuvette mapping
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Patent number 11,047,870
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Issue date Jun 29, 2021
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Siemens Healthcare Diagnostics Inc.
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Joson K. Joseph
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G01 - MEASURING TESTING
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Sample analyzing system
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Patent number 10,788,799
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Issue date Sep 29, 2020
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Shimadzu Corporation
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Yusuke Yokoi
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G05 - CONTROLLING REGULATING
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Automated analysis device
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Patent number 10,591,498
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Issue date Mar 17, 2020
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Hitachi High-Technologies Corporation
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Koichi Nishimura
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G01 - MEASURING TESTING
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Automatic analysis apparatus
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Patent number 10,537,893
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Issue date Jan 21, 2020
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Hitachi High-Technologies Corporation
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Teruhiro Yamano
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G01 - MEASURING TESTING
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Automatic analyzer and method
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Patent number 10,345,321
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Issue date Jul 9, 2019
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Endress + Hauser Conducta GmbH + Co. KG
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Anja Gerlinger
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G01 - MEASURING TESTING
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Automatic analysis device
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Patent number 10,234,472
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Issue date Mar 19, 2019
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Hitachi High-Technologies Corporation
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Hirofumi Sasaki
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G01 - MEASURING TESTING
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