Averaging on a zone

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CPC
G01N2021/5934

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

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G01N2021/5934Averaging on a zone

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Patents Grantslast 30 patents

Information Patent Grant
Reflectometry system with compensation for specimen holder topograp...
- Patent number 7,031,508
- Issue date Apr 18, 2006
- E-Y Laboratories, Inc.
- John L. Lawless
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Reflectometry system with compensation for specimen holder topograp...
- Patent number 6,584,217
- Issue date Jun 24, 2003
- E-Y Laboratories, Inc.
- John L. Lawless
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical specimen analysis system and method
- Patent number 6,249,593
- Issue date Jun 19, 2001
- EY Laboratories, Inc.
- Albert E. Chu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical specimen analysis system and method
- Patent number 5,717,778
- Issue date Feb 10, 1998
- Albert E. Chu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and device for monitoring the transparency of a laminated pane
- Patent number 5,363,188
- Issue date Nov 8, 1994
- Saint-Gobain Virtage International
- Claude Didelot
- B32 - LAYERED PRODUCTS
Information Patent Grant
Method and apparatus for measuring concentration of a material in a...
- Patent number 5,110,213
- Issue date May 5, 1992
- R. J. Reynolds Tobacco Company
- Sydney K. Seymour
- G01 - MEASURING TESTING
Information Patent Grant
Process and device for the detection and quantification of agglutin...
- Patent number 4,575,492
- Issue date Mar 11, 1986
- Le Materiel Biomedical
- Pierre David
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR DETERMINING HEMOGLOBIN BASED PARAMETERS IN...
- Publication number 20170059588
- Publication date Mar 2, 2017
- Abbott Point of Care, Inc.
- Cord Mueller
- G01 - MEASURING TESTING
Information Patent Application
Reflectometry system with compensation for specimen holder topograp...
- Publication number 20040071331
- Publication date Apr 15, 2004
- EY Laboratories, Inc.
- John L. Lawless
- G06 - COMPUTING CALCULATING COUNTING

Averaging on a zone

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Reflectometry system with compensation for specimen holder topograp...

Reflectometry system with compensation for specimen holder topograp...

Optical specimen analysis system and method

Optical specimen analysis system and method

Method and device for monitoring the transparency of a laminated pane

Method and apparatus for measuring concentration of a material in a...

Process and device for the detection and quantification of agglutin...

Patents Applicationslast 30 patents

METHOD AND APPARATUS FOR DETERMINING HEMOGLOBIN BASED PARAMETERS IN...

Reflectometry system with compensation for specimen holder topograp...