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G11C2229/746

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GPHYSICS G11Information storage G11CSTATIC STORES G11C2229/00Indexing scheme relating to checking stores for correct operation, subsequent repair or testing stores during standby or offline operation

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G11C2229/746Before packaging

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Patents Grantslast 30 patents

Information Patent Grant
Semiconductor package including stacked chips and method of fabrica...
- Patent number 9,424,954
- Issue date Aug 23, 2016
- Samsung Electronics Co., Ltd.
- Taek-Sung Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device and defective cell relieving method
- Patent number 8,837,240
- Issue date Sep 16, 2014
- Kabushiki Kaisha Toshiba
- Takayuki Iwai
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory circuit comprising redundant memory areas
- Patent number 7,373,562
- Issue date May 13, 2008
- Infineon Technologies AG
- Peter Poechmueller
- G11 - INFORMATION STORAGE
Information Patent Grant
Semiconductor memory device with test circuit
- Patent number 7,263,010
- Issue date Aug 28, 2007
- Kabushiki Kaisha Toshiba
- Hitoshi Iwai
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR PACKAGE INCLUDING STACKED CHIPS AND METHOD OF FABRICA...
- Publication number 20140347943
- Publication date Nov 27, 2014
- Samsung Electronics Co., Ltd.
- Taek-Sung KIM
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR MEMORY DEVICE AND DEFECTIVE CELL RELIEVING METHOD
- Publication number 20130077420
- Publication date Mar 28, 2013
- Kabushiki Kaisha Toshiba
- Takayuki Iwai
- G11 - INFORMATION STORAGE
Information Patent Application
Semiconductor memory device
- Publication number 20060221729
- Publication date Oct 5, 2006
- Kabushiki Kaisha Toshiba
- Hitoshi Iwai
- G11 - INFORMATION STORAGE
Information Patent Application
Memory circuit comprising redundant memory areas
- Publication number 20050281076
- Publication date Dec 22, 2005
- Peter Poechmueller
- G11 - INFORMATION STORAGE