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G01N2021/215

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

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G01N2021/215Brewster incidence arrangement

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Patents Grantslast 30 patents

Information Patent Grant
Concentration measuring method of optically active substance and co...
- Patent number 12,158,412
- Issue date Dec 3, 2024
- FUJIFILM Corporation
- Yujiro Yanai
- G01 - MEASURING TESTING
Information Patent Grant
Angle independent optical surface inspector
- Patent number 12,130,243
- Issue date Oct 29, 2024
- Lumina Instruments Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Reflectometer, spectrophotometer, ellipsometer or polarimeter syste...
- Patent number 11,885,738
- Issue date Jan 30, 2024
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Biomarker detection apparatus
- Patent number 11,499,917
- Issue date Nov 15, 2022
- Causeway Sensors Limited
- Robert Pollard
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
High-sensitive biosensor chip using high extinction coefficient mar...
- Patent number 11,402,321
- Issue date Aug 2, 2022
- KOREA RESEARCH INSTITUTE OF STANDARD AND SCIENCE
- Hyun-mo Cho
- G01 - MEASURING TESTING
Information Patent Grant
Multiple wavelength ellipsometer system and related method
- Patent number 9,354,118
- Issue date May 31, 2016
- Film Sense, LLC
- Blaine D. Johs
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring a tissue analyte such as bilirub...
- Patent number 9,265,457
- Issue date Feb 23, 2016
- Koninklijke Philips N.V.
- Srinivas Rao Kudavelly
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Transforming metrology data from a semiconductor treatment system u...
- Patent number 8,346,506
- Issue date Jan 1, 2013
- Tokyo Electron Limited
- Vi Vuong
- G01 - MEASURING TESTING
Information Patent Grant
Transforming metrology data from a semiconductor treatment system u...
- Patent number 8,170,833
- Issue date May 1, 2012
- Tokyo Electron Limited
- Vi Vuong
- G01 - MEASURING TESTING
Information Patent Grant
Polishing end point detection method, polishing end point detection...
- Patent number 8,115,912
- Issue date Feb 14, 2012
- Ebara Corporation
- Toshifumi Kimba
- B24 - GRINDING POLISHING
Information Patent Grant
Polishing end point detection method, polishing end point detection...
- Patent number 8,045,142
- Issue date Oct 25, 2011
- Ebara Corporation
- Toshifumi Kimba
- B24 - GRINDING POLISHING
Information Patent Grant
Processing substrates using direct and recycled radiation
- Patent number 7,947,968
- Issue date May 24, 2011
- Ultratech, Inc.
- David A. Markle
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Transforming metrology data from a semiconductor treatment system u...
- Patent number 7,467,064
- Issue date Dec 16, 2008
- Timbre Technologies, Inc.
- Vi Vuong
- G01 - MEASURING TESTING
Information Patent Grant
Analytical method and apparatus
- Patent number 7,460,236
- Issue date Dec 2, 2008
- GE Healthcare Bio-Sciences AB
- Bengt Ivarsson
- G01 - MEASURING TESTING
Information Patent Grant
Rotating or rotatable compensator system providing aberation correc...
- Patent number 7,304,737
- Issue date Dec 4, 2007
- J. A. Woollam Co., Inc.
- Martin M. Liphardt
- G01 - MEASURING TESTING
Information Patent Grant
Analytical method and apparatus
- Patent number 7,262,866
- Issue date Aug 28, 2007
- Biacore AB
- Bengt Ivarsson
- G01 - MEASURING TESTING
Information Patent Grant
High-sensitivity reflection measurement apparatus
- Patent number 7,209,233
- Issue date Apr 24, 2007
- Jasco Corporation
- Noriaki Soga
- G01 - MEASURING TESTING
Information Patent Grant
Analytical method and apparatus
- Patent number 7,081,958
- Issue date Jul 25, 2006
- Biacore AB
- Bengt Ivarsson
- G01 - MEASURING TESTING
Information Patent Grant
Analytical method and apparatus
- Patent number 6,999,175
- Issue date Feb 14, 2006
- Biacore AB
- Bengt Ivarsson
- G01 - MEASURING TESTING
Information Patent Grant
Analytical method and apparatus
- Patent number 6,714,303
- Issue date Mar 30, 2004
- Biacore AB
- Bengt Ivarsson
- G01 - MEASURING TESTING
Information Patent Grant
Analytical method and apparatus
- Patent number 6,493,097
- Issue date Dec 10, 2002
- Biacore AB
- Bengt Ivarsson
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MUELLER MATRIX ELLIPSOMETER
- Publication number 20240011894
- Publication date Jan 11, 2024
- Government of the United States of America, as Represented by the Secretary o...
- Thomas Avery Germer
- G01 - MEASURING TESTING
Information Patent Application
CONCENTRATION MEASURING METHOD OF OPTICALLY ACTIVE SUBSTANCE AND CO...
- Publication number 20230213436
- Publication date Jul 6, 2023
- FUJIFILM CORPORATION
- Yujiro YANAI
- G01 - MEASURING TESTING
Information Patent Application
HIGH-SENSITIVE BIOSENSOR CHIP USING HIGH EXTINCTION COEFFICIENT MAR...
- Publication number 20210072149
- Publication date Mar 11, 2021
- KOREA RESEARCH INSTITUTE OF STANDARD AND SCIENCE
- Hyun-mo CHO
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE ANALYSIS TOOL EMPLOYING A BROADBAND ANGLE-SELECTIVE FILTER
- Publication number 20180100799
- Publication date Apr 12, 2018
- Halliburton Energy Services, Inc.
- James M. Price
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR MEASURING A TISSUE ANALYTE SUCH AS BILIRUB...
- Publication number 20130085351
- Publication date Apr 4, 2013
- KONINKLIJKE PHILPS ELECTRONICS N.V.
- Srinivas Rao Kudavelly
- G01 - MEASURING TESTING
Information Patent Application
PRESSURE CONTROL IN CONTINUOUS PLASMA DEPOSITION PROCESSES
- Publication number 20130055818
- Publication date Mar 7, 2013
- United Solar Ovonic LLC
- Joachim Doehler
- G01 - MEASURING TESTING
Information Patent Application
TRANSFORMING METROLOGY DATA FROM A SEMICONDUCTOR TREATMENT SYSTEM U...
- Publication number 20120199287
- Publication date Aug 9, 2012
- TOKYO ELECTRON LIMITED
- Vi Vuong
- G01 - MEASURING TESTING
Information Patent Application
POLISHING END POINT DETECTION METHOD, POLISHING END POINT DETECTION...
- Publication number 20120009849
- Publication date Jan 12, 2012
- Toshifumi Kimba
- B24 - GRINDING POLISHING
Information Patent Application
Method and apparatus for optically characterizing the doping of a s...
- Publication number 20100012031
- Publication date Jan 21, 2010
- Frank Torregrosa
- G01 - MEASURING TESTING
Information Patent Application
Polishing end point detection method, polishing end point detection...
- Publication number 20090153859
- Publication date Jun 18, 2009
- Toshifumi Kimba
- B24 - GRINDING POLISHING
Information Patent Application
TRANSFORMING METROLOGY DATA FROM A SEMICONDUCTOR TREATMENT SYSTEM U...
- Publication number 20090094001
- Publication date Apr 9, 2009
- Timbre Technologies, Inc.
- Vi Vuong
- G01 - MEASURING TESTING
Information Patent Application
Surface defect inspection apparatus
- Publication number 20080094616
- Publication date Apr 24, 2008
- OLYMPUS CORPORATION
- Toshihiko Tanaka
- G01 - MEASURING TESTING
Information Patent Application
ANALYTICAL METHOD AND APPARATUS
- Publication number 20080030738
- Publication date Feb 7, 2008
- Biacore AB
- Bengt Ivarsson
- G01 - MEASURING TESTING
Information Patent Application
Transforming metrology data from a semiconductor treatment system u...
- Publication number 20070185684
- Publication date Aug 9, 2007
- Timbre Technologies, Inc.
- Vi Vuong
- G01 - MEASURING TESTING
Information Patent Application
Analytical method and apparatus
- Publication number 20070013912
- Publication date Jan 18, 2007
- Biacore AB
- Bengt Ivarsson
- G01 - MEASURING TESTING
Information Patent Application
Analytical method and apparatus
- Publication number 20060072115
- Publication date Apr 6, 2006
- Biacore AB
- Bengt Ivarsson
- G01 - MEASURING TESTING
Information Patent Application
High-sensitivity reflection measurement apparatus
- Publication number 20050195395
- Publication date Sep 8, 2005
- JASCO CORPORATION
- Noriaki Soga
- G01 - MEASURING TESTING
Information Patent Application
Analytical method and apparatus
- Publication number 20050007605
- Publication date Jan 13, 2005
- Biacore AB
- Bengt Ivarsson
- G01 - MEASURING TESTING
Information Patent Application
Analytical method and apparatus
- Publication number 20030067612
- Publication date Apr 10, 2003
- Biacore AB
- Bengt Ivarsson
- G01 - MEASURING TESTING

Brewster incidence arrangement

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Concentration measuring method of optically active substance and co...

Angle independent optical surface inspector

Reflectometer, spectrophotometer, ellipsometer or polarimeter syste...

Biomarker detection apparatus

High-sensitive biosensor chip using high extinction coefficient mar...

Multiple wavelength ellipsometer system and related method

Apparatus and method for measuring a tissue analyte such as bilirub...

Transforming metrology data from a semiconductor treatment system u...

Transforming metrology data from a semiconductor treatment system u...

Polishing end point detection method, polishing end point detection...

Polishing end point detection method, polishing end point detection...

Processing substrates using direct and recycled radiation

Transforming metrology data from a semiconductor treatment system u...

Analytical method and apparatus

Rotating or rotatable compensator system providing aberation correc...

Analytical method and apparatus

High-sensitivity reflection measurement apparatus

Analytical method and apparatus

Analytical method and apparatus

Analytical method and apparatus

Analytical method and apparatus

Patents Applicationslast 30 patents

MUELLER MATRIX ELLIPSOMETER

CONCENTRATION MEASURING METHOD OF OPTICALLY ACTIVE SUBSTANCE AND CO...

HIGH-SENSITIVE BIOSENSOR CHIP USING HIGH EXTINCTION COEFFICIENT MAR...

SAMPLE ANALYSIS TOOL EMPLOYING A BROADBAND ANGLE-SELECTIVE FILTER

APPARATUS AND METHOD FOR MEASURING A TISSUE ANALYTE SUCH AS BILIRUB...

PRESSURE CONTROL IN CONTINUOUS PLASMA DEPOSITION PROCESSES

TRANSFORMING METROLOGY DATA FROM A SEMICONDUCTOR TREATMENT SYSTEM U...

POLISHING END POINT DETECTION METHOD, POLISHING END POINT DETECTION...

Method and apparatus for optically characterizing the doping of a s...

Polishing end point detection method, polishing end point detection...

TRANSFORMING METROLOGY DATA FROM A SEMICONDUCTOR TREATMENT SYSTEM U...

Surface defect inspection apparatus

ANALYTICAL METHOD AND APPARATUS

Transforming metrology data from a semiconductor treatment system u...

Analytical method and apparatus

Analytical method and apparatus

High-sensitivity reflection measurement apparatus

Analytical method and apparatus

Analytical method and apparatus