Build statistical model of past normal proces, compare with actual process

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G05B2219/32201

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GPHYSICS G05Controlling systems G05BCONTROL OR REGULATING SYSTEMS IN GENERAL FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS G05B2219/00Program-control systems

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G05B2219/32201Build statistical model of past normal proces, compare with actual process

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Prognostic and health management system for precision ball grinding...
- Patent number 11,883,920
- Issue date Jan 30, 2024
- Tan Kong Precision Tech Co., Ltd.
- Ya-Chen Hsu
- B24 - GRINDING POLISHING
Information Patent Grant
Analysis of anomalies in a facility
- Patent number 11,748,632
- Issue date Sep 5, 2023
- SENSAI NETWORKS LTD
- Refael Horev
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Material processing optimization
- Patent number 11,681,280
- Issue date Jun 20, 2023
- ANDRITZ INC.
- Neeraj Nagpal
- G05 - CONTROLLING REGULATING
Information Patent Grant
Sensor metrology data integration
- Patent number 11,592,812
- Issue date Feb 28, 2023
- Applied Materials, Inc.
- Sidharth Bhatia
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Characterizing and monitoring electrical components of manufacturin...
- Patent number 11,513,504
- Issue date Nov 29, 2022
- Applied Materials, Inc.
- David John Paul
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Prediction model creation apparatus, production facility monitoring...
- Patent number 11,106,197
- Issue date Aug 31, 2021
- Omron Corporation
- Reiko Hattori
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Component failure prediction
- Patent number 11,003,518
- Issue date May 11, 2021
- Hewlett-Packard Development Company, L.P.
- Marlon Gomes Lopez
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Facility diagnosis device, facility diagnosis method, and facility...
- Patent number 11,003,178
- Issue date May 11, 2021
- Yokogawa Electric Corporation
- Sho Fujita
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for manufacturing parts based on analysis of weighted statis...
- Patent number 10,656,633
- Issue date May 19, 2020
- SAFRAN AIRCRAFT ENGINES
- Olivier Ferry
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Building a workpiece quality prediction model
- Patent number 10,579,026
- Issue date Mar 3, 2020
- Industrial Technology Research Institute
- Chung-Wei Lin
- G05 - CONTROLLING REGULATING
Information Patent Grant
Methods and apparatus to define stages for multi-variate batch cont...
- Patent number 10,503,156
- Issue date Dec 10, 2019
- Fisher-Rosemount Systems, Inc.
- Steve Murray
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and system for monitoring sensor data of rotating equipment
- Patent number 10,339,784
- Issue date Jul 2, 2019
- Siemens Aktiengesellschaft
- Felix Borutta
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Insitu tool health and recipe quality monitoring on a CDSEM
- Patent number 10,185,312
- Issue date Jan 22, 2019
- GLOBALFOUNDRIES Inc.
- Daniel Fischer
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and computer program for the monitoring of a thrust reverser...
- Patent number 10,147,245
- Issue date Dec 4, 2018
- SAFRAN AIRCRAFT ENGINES
- Josselin Coupard
- F05 - INDEXING SCHEMES RELATING TO ENGINES OR PUMPS IN VARIOUS SUBCLASSES OF...
Information Patent Grant
Systems and methods for retraining outlier detection limits in a bu...
- Patent number 10,120,375
- Issue date Nov 6, 2018
- Johnson Controls Technology Company
- Andrew J. Przybylski
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for the quality assessment of a component produced by means...
- Patent number 9,964,496
- Issue date May 8, 2018
- MTU Aero Engines AG
- Thomas Hess
- G05 - CONTROLLING REGULATING
Information Patent Grant
System and method for equipment monitoring using a group candidate...
- Patent number 9,915,932
- Issue date Mar 13, 2018
- Applied Materials, Inc.
- Paul Alexander Llanos
- G05 - CONTROLLING REGULATING
Information Patent Grant
Bi-directional association and graphical acquisition of time-based...
- Patent number 9,915,940
- Issue date Mar 13, 2018
- Applied Materials, LLC
- Brad Schulze
- G05 - CONTROLLING REGULATING
Information Patent Grant
System and method for monitoring a process
- Patent number 9,892,238
- Issue date Feb 13, 2018
- Scientific Design Company, Inc.
- Sandip K. Lahiri
- G05 - CONTROLLING REGULATING
Information Patent Grant
Facility state monitoring method and device for same
- Patent number 9,659,250
- Issue date May 23, 2017
- Hitachi Power Solutions Co., Ltd.
- Hisae Shibuya
- G05 - CONTROLLING REGULATING
Information Patent Grant
Manufacturing control apparatus and manufacturing control system
- Patent number 9,442,483
- Issue date Sep 13, 2016
- Kabushiki Kaisha Toshiba
- Linting Huang
- G05 - CONTROLLING REGULATING
Information Patent Grant
Identifying failures in an aeroengine
- Patent number 8,682,616
- Issue date Mar 25, 2014
- SNECMA
- Jérôme Lacaille
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method for controlling critical dimension in semiconductor producti...
- Patent number 8,392,010
- Issue date Mar 5, 2013
- Samsung Display Co., Ltd.
- Eugene Kang
- G05 - CONTROLLING REGULATING
Information Patent Grant
Temporary expanding integrated monitoring network
- Patent number 8,352,049
- Issue date Jan 8, 2013
- Smiths Detection Inc.
- Chang-Meng B. Hsiung
- G05 - CONTROLLING REGULATING
Information Patent Grant
Specification establishing method for controlling semiconductor pro...
- Patent number 8,332,416
- Issue date Dec 11, 2012
- Inotera Memories, Inc.
- Cheng-Hao Chen
- G05 - CONTROLLING REGULATING
Information Patent Grant
Process control using process data and yield data
- Patent number 8,271,122
- Issue date Sep 18, 2012
- MKS Instruments, Inc.
- Tamara Byrne
- G05 - CONTROLLING REGULATING
Information Patent Grant
Automated model building and model updating
- Patent number 8,271,103
- Issue date Sep 18, 2012
- MKS Instruments, Inc.
- Lawrence Hendler
- G05 - CONTROLLING REGULATING
Information Patent Grant
Hierarchical and incremental multivariate analysis for process control
- Patent number 8,233,494
- Issue date Jul 31, 2012
- International Business Machines Corporation
- Lisa Amini
- G05 - CONTROLLING REGULATING
Information Patent Grant
System and method for advanced condition monitoring of an asset system
- Patent number 8,144,005
- Issue date Mar 27, 2012
- General Electric Company
- Xiao Hu
- G05 - CONTROLLING REGULATING
Information Patent Grant
Systems and methods for offline and/or online batch monitoring usin...
- Patent number 8,078,434
- Issue date Dec 13, 2011
- Honeywell International Inc.
- Ramprasad Yelchuru
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
MATERIAL PROCESSING OPTIMIZATION
- Publication number 20240272629
- Publication date Aug 15, 2024
- Andritz Inc.
- Neeraj Nagpal
- G05 - CONTROLLING REGULATING
Information Patent Application
INSPECTION RATE ADAPTATION
- Publication number 20230273607
- Publication date Aug 31, 2023
- Marcel Rothering
- G05 - CONTROLLING REGULATING
Information Patent Application
MATERIAL PROCESSING OPTIMIZATION
- Publication number 20230273608
- Publication date Aug 31, 2023
- Andritz Inc.
- Neeraj Nagpal
- G05 - CONTROLLING REGULATING
Information Patent Application
Prognostic and Health Management System for Precision Ball Grinding...
- Publication number 20220395954
- Publication date Dec 15, 2022
- TAN KONG PRECISION TECH CO., LTD.
- Ya-Chen Hsu
- B24 - GRINDING POLISHING
Information Patent Application
METHOD AND DEVICE FOR ANALYZING A SEQUENTIAL PROCESS
- Publication number 20220179402
- Publication date Jun 9, 2022
- WAGO VERWALTUNGSGESELLSCHAFT MBH
- Nikolai FALKE
- G05 - CONTROLLING REGULATING
Information Patent Application
ANALYSIS OF ANOMALIES IN A FACILITY
- Publication number 20210133593
- Publication date May 6, 2021
- Refael HOREV
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHARACTERIZING AND MONITORING ELECTRICAL COMPONENTS OF MANUFACTURIN...
- Publication number 20210116895
- Publication date Apr 22, 2021
- Applied Materials, Inc.
- David John Paul
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Material Processing Optimization
- Publication number 20200209839
- Publication date Jul 2, 2020
- ANDRITZ INC.
- Neeraj Nagpal
- G05 - CONTROLLING REGULATING
Information Patent Application
COMPONENT FAILURE PREDICTION
- Publication number 20200026590
- Publication date Jan 23, 2020
- Hewlett-Packard Development Company, L.P.
- Marlon Gomes Lopez
- G05 - CONTROLLING REGULATING
Information Patent Application
FACILITY DIAGNOSIS DEVICE, FACILITY DIAGNOSIS METHOD, AND FACILITY...
- Publication number 20190033840
- Publication date Jan 31, 2019
- YOKOGAWA ELECTRIC CORPORATION
- Sho Fujita
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD OF MANUFACTURING PARTS BASED ON THE ANALYSIS OF CENTRING COE...
- Publication number 20180267519
- Publication date Sep 20, 2018
- SAFRAN AIRCRAFT ENGINES
- Olivier FERRY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR MANUFACTURING PARTS BASED ON SIMULTANEOUS ANALYSIS OF ST...
- Publication number 20180267520
- Publication date Sep 20, 2018
- SAFRAN AIRCRAFT ENGINES
- Olivier FERRY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR MANUFACTURING PARTS BASED ON ANALYSIS OF WEIGHTED STATIS...
- Publication number 20180267521
- Publication date Sep 20, 2018
- SAFRAN AIRCRAFT ENGINES
- Olivier FERRY
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND COMPUTER PROGRAM FOR THE MONITORING OF A THRUST REVERSER...
- Publication number 20160328892
- Publication date Nov 10, 2016
- SNECMA
- Josselin COUPARD
- F02 - COMBUSTION ENGINES HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
Information Patent Application
SYSTEM AND METHOD FOR MONITORING A PROCESS
- Publication number 20140365195
- Publication date Dec 11, 2014
- Scientific Design Company, Inc.
- Sandip K. Lahiri
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Facility State Monitoring Method and Device for Same
- Publication number 20140279795
- Publication date Sep 18, 2014
- Hitachi Power Solutions Co., Ltd.
- Hisae Shibuya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF MAINTAINING A SEMICONDUCTOR PRODUCTION LINE
- Publication number 20140135968
- Publication date May 15, 2014
- Samsung Electronics Co., Ltd.
- Ho-Ki LEE
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
MANUFACTURING CONTROL APPARATUS, MANUFACTURING CONTROL SYSTEM, AND...
- Publication number 20130338810
- Publication date Dec 19, 2013
- Kabushiki Kaisha Toshiba
- Linting HUANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BI-DIRECTIONAL ASSOCIATION AND GRAPHICAL ACQUISITION OF TIME-BASED...
- Publication number 20130110263
- Publication date May 2, 2013
- Applied Materials, Inc.
- Brad Schulze
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
APPARATUS AND METHODS FOR END POINT DETERMINATION IN SEMICONDUCTOR...
- Publication number 20130024019
- Publication date Jan 24, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chien Rhone Wang
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Application
AUTOMATED MODEL BUILDING AND MODEL UPDATING
- Publication number 20120303142
- Publication date Nov 29, 2012
- MKS Instruments Inc.
- Lawrence Hendler
- G05 - CONTROLLING REGULATING
Information Patent Application
PROCESS FOR IMPROVING THE PRODUCTION OF PHOTOVOLTAIC PRODUCTS
- Publication number 20120136470
- Publication date May 31, 2012
- Aurora Control Technologies, Inc.
- Gordon Deans
- G05 - CONTROLLING REGULATING
Information Patent Application
SPECIFICATION ESTABLISHING METHOD FOR CONTROLLING SEMICONDUCTOR PRO...
- Publication number 20120102052
- Publication date Apr 26, 2012
- INOTERA MEMORIES, INC.
- CHENG-HAO CHEN
- G05 - CONTROLLING REGULATING
Information Patent Application
TEMPORARY EXPANDING INTEGRATED MONITORING NETWORK
- Publication number 20120041574
- Publication date Feb 16, 2012
- SMITHS DETECTION, INC.
- Chang-Meng B. Hsiung
- G05 - CONTROLLING REGULATING
Information Patent Application
PROCESS CONTROL USING PROCESS DATA AND YIELD DATA
- Publication number 20120035755
- Publication date Feb 9, 2012
- MKS Instruments, Inc.
- Tamara Byrne
- G05 - CONTROLLING REGULATING
Information Patent Application
VIRTUAL MEASURING SYSTEM AND METHOD FOR PREDICTING THE QUALITY OF T...
- Publication number 20120016643
- Publication date Jan 19, 2012
- National Tsing-Hua University
- SHI-SHANG JANG
- G05 - CONTROLLING REGULATING
Information Patent Application
IDENTIFYING FAILURES IN AN AEROENGINE
- Publication number 20110307220
- Publication date Dec 15, 2011
- SNECMA
- Jérôme Lacaille
- G05 - CONTROLLING REGULATING
Information Patent Application
METHOD FOR CONTROLLING CRITICAL DIMENSION IN SEMICONDUCTOR PRODUCTI...
- Publication number 20110224819
- Publication date Sep 15, 2011
- Samsung Mobile Display Co., Ltd.
- Eugene Kang
- G05 - CONTROLLING REGULATING
Information Patent Application
PROCESS CONTROL USING PROCESS DATA AND YIELD DATA
- Publication number 20100100223
- Publication date Apr 22, 2010
- MKS Instruments, Inc.
- Lawrence Hendler
- G05 - CONTROLLING REGULATING
Information Patent Application
SYSTEMS AND METHODS FOR OFFLINE AND/OR ONLINE BATCH MONITORING USIN...
- Publication number 20100017008
- Publication date Jan 21, 2010
- Honeywell International Inc.
- Ramprasad Yelchuru
- G05 - CONTROLLING REGULATING

Build statistical model of past normal proces, compare with actual process

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Prognostic and health management system for precision ball grinding...

Analysis of anomalies in a facility

Material processing optimization

Sensor metrology data integration

Characterizing and monitoring electrical components of manufacturin...

Prediction model creation apparatus, production facility monitoring...

Component failure prediction

Facility diagnosis device, facility diagnosis method, and facility...

Method for manufacturing parts based on analysis of weighted statis...

Building a workpiece quality prediction model

Methods and apparatus to define stages for multi-variate batch cont...

Method and system for monitoring sensor data of rotating equipment

Insitu tool health and recipe quality monitoring on a CDSEM

Method and computer program for the monitoring of a thrust reverser...

Systems and methods for retraining outlier detection limits in a bu...

Method for the quality assessment of a component produced by means...

System and method for equipment monitoring using a group candidate...

Bi-directional association and graphical acquisition of time-based...

System and method for monitoring a process

Facility state monitoring method and device for same

Manufacturing control apparatus and manufacturing control system

Identifying failures in an aeroengine

Method for controlling critical dimension in semiconductor producti...

Temporary expanding integrated monitoring network

Specification establishing method for controlling semiconductor pro...

Process control using process data and yield data

Automated model building and model updating

Hierarchical and incremental multivariate analysis for process control

System and method for advanced condition monitoring of an asset system

Systems and methods for offline and/or online batch monitoring usin...

Patents Applicationslast 30 patents

MATERIAL PROCESSING OPTIMIZATION

INSPECTION RATE ADAPTATION

MATERIAL PROCESSING OPTIMIZATION

Prognostic and Health Management System for Precision Ball Grinding...

METHOD AND DEVICE FOR ANALYZING A SEQUENTIAL PROCESS

ANALYSIS OF ANOMALIES IN A FACILITY

CHARACTERIZING AND MONITORING ELECTRICAL COMPONENTS OF MANUFACTURIN...

Material Processing Optimization

COMPONENT FAILURE PREDICTION

FACILITY DIAGNOSIS DEVICE, FACILITY DIAGNOSIS METHOD, AND FACILITY...

METHOD OF MANUFACTURING PARTS BASED ON THE ANALYSIS OF CENTRING COE...

METHOD FOR MANUFACTURING PARTS BASED ON SIMULTANEOUS ANALYSIS OF ST...

METHOD FOR MANUFACTURING PARTS BASED ON ANALYSIS OF WEIGHTED STATIS...

METHOD AND COMPUTER PROGRAM FOR THE MONITORING OF A THRUST REVERSER...

SYSTEM AND METHOD FOR MONITORING A PROCESS

Facility State Monitoring Method and Device for Same

METHOD OF MAINTAINING A SEMICONDUCTOR PRODUCTION LINE

MANUFACTURING CONTROL APPARATUS, MANUFACTURING CONTROL SYSTEM, AND...

BI-DIRECTIONAL ASSOCIATION AND GRAPHICAL ACQUISITION OF TIME-BASED...

APPARATUS AND METHODS FOR END POINT DETERMINATION IN SEMICONDUCTOR...

AUTOMATED MODEL BUILDING AND MODEL UPDATING

PROCESS FOR IMPROVING THE PRODUCTION OF PHOTOVOLTAIC PRODUCTS

SPECIFICATION ESTABLISHING METHOD FOR CONTROLLING SEMICONDUCTOR PRO...

TEMPORARY EXPANDING INTEGRATED MONITORING NETWORK

PROCESS CONTROL USING PROCESS DATA AND YIELD DATA

VIRTUAL MEASURING SYSTEM AND METHOD FOR PREDICTING THE QUALITY OF T...

IDENTIFYING FAILURES IN AN AEROENGINE

METHOD FOR CONTROLLING CRITICAL DIMENSION IN SEMICONDUCTOR PRODUCTI...

PROCESS CONTROL USING PROCESS DATA AND YIELD DATA

SYSTEMS AND METHODS FOR OFFLINE AND/OR ONLINE BATCH MONITORING USIN...