Built-in tests

Industry

CPC
G06F11/27

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Parent Industries

GPHYSICS G06Computing G06FELECTRICAL DIGITAL DATA PROCESSING G06F11/00Error detection Error correction Monitoring

Current Industry

G06F11/27Built-in tests

Industries

Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for reducing error log required space in semico...
- Patent number 12,321,249
- Issue date Jun 3, 2025
- Intelligent Memory Limited
- Mike Hossein Amidi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Hard disk pluggable method and system, and server
- Patent number 12,314,147
- Issue date May 27, 2025
- Fulian Precision Electronics (Tianjin) Co., LTD.
- Jie Yuan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Complex device fault diagnosis method and system based on multi-dim...
- Patent number 12,314,149
- Issue date May 27, 2025
- GUANGDONG UNIVERSITY OF TECHNOLOGY
- Yaohua Deng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Trace buffer data management for emulation systems
- Patent number 12,306,732
- Issue date May 20, 2025
- Synopsys, Inc.
- Chia-Wei Liang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Evaluation of memory device health monitoring logic
- Patent number 12,306,731
- Issue date May 20, 2025
- Micron Technology, Inc.
- Scott E. Schaefer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for performing dataload protocol operation testin...
- Patent number 12,292,807
- Issue date May 6, 2025
- HCL Technologies Limited
- Jignesh Jagdishbhai Trivedi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for simultaneously clearing and installing dat...
- Patent number 12,292,808
- Issue date May 6, 2025
- Communications Test Design, Inc.
- Austin Gunter
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
On-die channel impedance verification
- Patent number 12,292,804
- Issue date May 6, 2025
- Dell Products L.P.
- Sandor Farkas
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High-speed low-latency interconnect interface (HLII) for silicon in...
- Patent number 12,287,748
- Issue date Apr 29, 2025
- WUXI ESIONTECH CO., LTD.
- Xiaojie Ma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Computer and conduit for system testing
- Patent number 12,287,715
- Issue date Apr 29, 2025
- Visa International Service Association
- Yuexi Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Controller, storage device and test system
- Patent number 12,282,401
- Issue date Apr 22, 2025
- SK hynix Inc.
- Seung Hwa Baek
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Component die validation built-in self-test (VBIST) engine
- Patent number 12,282,064
- Issue date Apr 22, 2025
- Ampere Computing LLC
- Sandeep Brahmadathan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for real-time hardware in the loop
- Patent number 12,277,044
- Issue date Apr 15, 2025
- Dana Belgium N.V.
- Tony Libbrecht
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test data authentication and processing using scalable data structures
- Patent number 12,277,043
- Issue date Apr 15, 2025
- NVIDIA Corporation
- Smbat Tonoyan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated GUI-driven OpROM validation
- Patent number 12,272,164
- Issue date Apr 8, 2025
- Micron Technology, Inc.
- Shiva Pahwa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Error rate measurement apparatus and error rate measurement method
- Patent number 12,253,924
- Issue date Mar 18, 2025
- Anritsu Corporation
- Hiroyuki Onuma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems, apparatuses, and methods for autonomous functional testing...
- Patent number 12,253,925
- Issue date Mar 18, 2025
- Intel Corporation
- Michael Mishaeli
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Software defined redundant allocation safety mechanism in an artifi...
- Patent number 12,248,367
- Issue date Mar 11, 2025
- Avi Baum
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Interface mechanism to control and access instrument settings and i...
- Patent number 12,235,746
- Issue date Feb 25, 2025
- K T Anurag
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Integrity check device for safety sensitive data and electronic dev...
- Patent number 12,229,001
- Issue date Feb 18, 2025
- Samsung Electronics Co., Ltd.
- Dongsik Cho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for testing high-speed low-latency interconnec...
- Patent number 12,229,029
- Issue date Feb 18, 2025
- WUXI ESIONTECH CO., LTD.
- Xiaojie Ma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automated functional testing systems and methods of making and usin...
- Patent number 12,222,263
- Issue date Feb 11, 2025
- Myung Ki Kim
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Method and device for determining coverage in HIL testing, and stor...
- Patent number 12,222,833
- Issue date Feb 11, 2025
- SUNGROW POWER SUPPLY CO., LTD.
- Cunhao Gong
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method, computer program product, test signal and test device for t...
- Patent number 12,222,831
- Issue date Feb 11, 2025
- BitifEye Digital Test Solutions GmbH
- Anton Unakafov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for parallel testing of multiple namespaces loc...
- Patent number 12,216,559
- Issue date Feb 4, 2025
- Advantest Corporation
- Srdjan Malisic
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test mode state machine for a memory device
- Patent number 12,210,766
- Issue date Jan 28, 2025
- Micron Technology, Inc.
- Rucha Deepak Geedh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Debug for multi-threaded processing
- Patent number 12,204,425
- Issue date Jan 21, 2025
- Texas Instruments Incorporated
- Niraj Nandan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for testing cxl enabled devices in parallel
- Patent number 12,197,303
- Issue date Jan 14, 2025
- Advantest Corporation
- Srdjan Malisic
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for processor debug using low-bandwidth interface...
- Patent number 12,174,714
- Issue date Dec 24, 2024
- SILICONCH SYSTEMS PVT LTD
- Rakesh Kumar Polasa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Vehicle apparatus including verification apparatus
- Patent number 12,174,726
- Issue date Dec 24, 2024
- Mitsubishi Electric Corporation
- Koji Shimamura
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
NOVEL AUTOMATED FUNCTIONAL TESTING SYSTEMS AND METHODS OF MAKING AN...
- Publication number 20250180439
- Publication date Jun 5, 2025
- Myung Ki KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EVALUATION DEVICE AND EVALUATION METHOD
- Publication number 20250181467
- Publication date Jun 5, 2025
- Panasonic Automotive Systems Co., Ltd.
- Shuya YAMAMOTO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ASSESSING DISPLAY HEALTH IN RESPONSE TO ACCIDENTS
- Publication number 20250173233
- Publication date May 29, 2025
- DELL PRODUCTS, L.P.
- Ibrahim Sayyed
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROPRIETY DETERMINATION DEVICE AND PROPRIETY DETERMINATION METHOD
- Publication number 20250165367
- Publication date May 22, 2025
- SCREEN Holdings Co., Ltd.
- Hiroakira MATSUI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROCESSING INSTRUCTIONS AT A PROCESSING UNIT CONFIGURED TO PERFORM...
- Publication number 20250165368
- Publication date May 22, 2025
- Imagination Technologies Limited
- Daniel Wilkinson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST MODE STATE MACHINE FOR A MEMORY DEVICE
- Publication number 20250138744
- Publication date May 1, 2025
- Micron Technology, Inc.
- Rucha Deepak Geedh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHIP WITH BUILT-IN VERIFICATION AND METHOD FOR BUILT-IN CHIP VERIFI...
- Publication number 20250123935
- Publication date Apr 17, 2025
- Shanghai Zhaoxin Semiconductor Co., Ltd.
- Qunyi YANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CHIP VERIFICATION METHOD BASED ON SPI
- Publication number 20250117302
- Publication date Apr 10, 2025
- IPGoal Microelectronics (Sichuan) Co., Ltd.
- Chuan Yang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY APPARATUS, TEST FIXTURE, AND TEST SYSTEM
- Publication number 20250094301
- Publication date Mar 20, 2025
- Yangtze Memory Technologies Co., Ltd.
- Jie ZHU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FUNCTIONAL TESTING DEVICE AND SYSTEM
- Publication number 20250086081
- Publication date Mar 13, 2025
- INVENTEC (PUDONG) TECHNOLOGY CORPORATION
- Chih-Jen CHIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FUNCTIONAL TESTING METHOD
- Publication number 20250086080
- Publication date Mar 13, 2025
- INVENTEC (PUDONG) TECHNOLOGY CORPORATION
- Chih-Jen CHIN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SERVER TESTING SYSTEM, SERVER TESTING METHOD, AND ELECTRONIC DEVICE
- Publication number 20250068531
- Publication date Feb 27, 2025
- Fulian Precision Electronics (Tianjin) Co., LTD.
- TENG-FEI MA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HARD DISK PLUGGABLE METHOD AND SYSTEM, AND SERVER
- Publication number 20250068528
- Publication date Feb 27, 2025
- Fulian Precision Electronics (Tianjin) Co., LTD.
- JIE YUAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM DIRECTED TESTING
- Publication number 20250036536
- Publication date Jan 30, 2025
- FUTURE DIAL, INC.
- Angel Michelle Anderson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
REMEDIAL ACTION IN AN INTEGRATED CIRCUIT IN RESPONSE TO A MONITOR C...
- Publication number 20250028377
- Publication date Jan 23, 2025
- QUALCOMM Incorporated
- Anatoly GELMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INFORMATION PROCESSING SYSTEM, INFORMATION PROCESSING METHOD, AND N...
- Publication number 20250013547
- Publication date Jan 9, 2025
- FUJIFILM Business Innovation Corp.
- Manabu WADA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STREAMING ENGINE WITH DEFERRED EXCEPTION REPORTING
- Publication number 20250013518
- Publication date Jan 9, 2025
- TEXAS INSTRUMENTS INCORPORATED
- Joseph Zbiciak
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ANOMALY DETECTION PROCESSING METHOD AND DEVICE FOR SOLID-STATE DRIVE
- Publication number 20250013545
- Publication date Jan 9, 2025
- Samsung Electronics Co., Ltd.
- Ni XUE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS TO PROACTIVELY SCREEN HARDWARE ERRORS OF A COM...
- Publication number 20250004896
- Publication date Jan 2, 2025
- Intel Corporation
- Sridharan SAKTHIVELU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HIGH PERFORMANCE TRACE OFFLOAD CIRCUIT ARCHITECTURE
- Publication number 20250004919
- Publication date Jan 2, 2025
- Xilinx, Inc.
- Anurag Dubey
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TRACKING TAINT PROPAGATION IN INTEGRATED CIRCUIT DESIGN
- Publication number 20240427691
- Publication date Dec 26, 2024
- Synopsys, Inc.
- Arturo Salz
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
LEVERAGING LOW POWER STATES FOR FAULT TESTING OF PROCESSING CORES A...
- Publication number 20240419568
- Publication date Dec 19, 2024
- NVIDIA Corporation
- Jonah ALBEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
STRUCTURE DETECTING APPARATUS AND STRUCTURE DETECTING KIT APPLYING...
- Publication number 20240419569
- Publication date Dec 19, 2024
- Industrial Technology Research Institute
- Hung-Chih CHANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DIAGNOSIS OF SOURCE OF ERROR USING CONTROL PANEL
- Publication number 20240403179
- Publication date Dec 5, 2024
- Hewlett-Packard Development Company, L.P.
- Jeongphil KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHODS FOR AUTOMATICALLY CONFIGURING COMPUTING DEVIC...
- Publication number 20240403202
- Publication date Dec 5, 2024
- Communications Test Design, Inc.
- Stephen Tate DiJoseph
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SELECTABLE JTAG OR TRACE ACCESS WITH DATA STORE AND OUTPUT
- Publication number 20240402247
- Publication date Dec 5, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTIMEDIA PRODUCT BURN-IN APPARATUS
- Publication number 20240403180
- Publication date Dec 5, 2024
- AMLOGIC (SHANGHAI) CO., LTD.
- Yuan LUO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ADAPTIVE WORD LINE STRESS FOR LEAK DETECTION IN NON-VOLATILE MEMORY
- Publication number 20240403178
- Publication date Dec 5, 2024
- Western Digital Technologies, Inc.
- Troy Guan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM, APPARATUS AND METHODS FOR AUTOMATICALLY TESTING MOBILE DEVICES
- Publication number 20240394163
- Publication date Nov 28, 2024
- Communications Test Design, Inc.
- Gerald J. PARSONS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ON-DIE CHANNEL IMPEDANCE VERIFICATION
- Publication number 20240385231
- Publication date Nov 21, 2024
- Dell Products L.P.
- Sandor Farkas
- G06 - COMPUTING CALCULATING COUNTING

Built-in tests

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Systems and methods for reducing error log required space in semico...

Hard disk pluggable method and system, and server

Complex device fault diagnosis method and system based on multi-dim...

Trace buffer data management for emulation systems

Evaluation of memory device health monitoring logic

Method and system for performing dataload protocol operation testin...

Apparatus and method for simultaneously clearing and installing dat...

On-die channel impedance verification

High-speed low-latency interconnect interface (HLII) for silicon in...

Computer and conduit for system testing

Controller, storage device and test system

Component die validation built-in self-test (VBIST) engine

System and method for real-time hardware in the loop

Test data authentication and processing using scalable data structures

Automated GUI-driven OpROM validation

Error rate measurement apparatus and error rate measurement method

Systems, apparatuses, and methods for autonomous functional testing...

Software defined redundant allocation safety mechanism in an artifi...

Interface mechanism to control and access instrument settings and i...

Integrity check device for safety sensitive data and electronic dev...

Apparatus and method for testing high-speed low-latency interconnec...

Automated functional testing systems and methods of making and usin...

Method and device for determining coverage in HIL testing, and stor...

Method, computer program product, test signal and test device for t...

Systems and methods for parallel testing of multiple namespaces loc...

Test mode state machine for a memory device

Debug for multi-threaded processing

Systems and methods for testing cxl enabled devices in parallel

System and method for processor debug using low-bandwidth interface...

Vehicle apparatus including verification apparatus

Patents Applicationslast 30 patents

NOVEL AUTOMATED FUNCTIONAL TESTING SYSTEMS AND METHODS OF MAKING AN...

EVALUATION DEVICE AND EVALUATION METHOD

ASSESSING DISPLAY HEALTH IN RESPONSE TO ACCIDENTS

PROPRIETY DETERMINATION DEVICE AND PROPRIETY DETERMINATION METHOD

PROCESSING INSTRUCTIONS AT A PROCESSING UNIT CONFIGURED TO PERFORM...

TEST MODE STATE MACHINE FOR A MEMORY DEVICE

CHIP WITH BUILT-IN VERIFICATION AND METHOD FOR BUILT-IN CHIP VERIFI...

CHIP VERIFICATION METHOD BASED ON SPI

MEMORY APPARATUS, TEST FIXTURE, AND TEST SYSTEM

FUNCTIONAL TESTING DEVICE AND SYSTEM

FUNCTIONAL TESTING METHOD

SERVER TESTING SYSTEM, SERVER TESTING METHOD, AND ELECTRONIC DEVICE

HARD DISK PLUGGABLE METHOD AND SYSTEM, AND SERVER

SYSTEM DIRECTED TESTING

REMEDIAL ACTION IN AN INTEGRATED CIRCUIT IN RESPONSE TO A MONITOR C...

INFORMATION PROCESSING SYSTEM, INFORMATION PROCESSING METHOD, AND N...

STREAMING ENGINE WITH DEFERRED EXCEPTION REPORTING

ANOMALY DETECTION PROCESSING METHOD AND DEVICE FOR SOLID-STATE DRIVE

METHOD AND APPARATUS TO PROACTIVELY SCREEN HARDWARE ERRORS OF A COM...

HIGH PERFORMANCE TRACE OFFLOAD CIRCUIT ARCHITECTURE

TRACKING TAINT PROPAGATION IN INTEGRATED CIRCUIT DESIGN

LEVERAGING LOW POWER STATES FOR FAULT TESTING OF PROCESSING CORES A...

STRUCTURE DETECTING APPARATUS AND STRUCTURE DETECTING KIT APPLYING...

DIAGNOSIS OF SOURCE OF ERROR USING CONTROL PANEL

APPARATUS AND METHODS FOR AUTOMATICALLY CONFIGURING COMPUTING DEVIC...

SELECTABLE JTAG OR TRACE ACCESS WITH DATA STORE AND OUTPUT

MULTIMEDIA PRODUCT BURN-IN APPARATUS

ADAPTIVE WORD LINE STRESS FOR LEAK DETECTION IN NON-VOLATILE MEMORY

SYSTEM, APPARATUS AND METHODS FOR AUTOMATICALLY TESTING MOBILE DEVICES

ON-DIE CHANNEL IMPEDANCE VERIFICATION