-
-
-
Beta particle monitor for surfaces
-
Patent number 5,679,958
-
Issue date Oct 21, 1997
-
The Regents of the University of California
-
Duncan W. MacArthur
-
G01 - MEASURING TESTING
-
Radon detection
-
Patent number 5,281,824
-
Issue date Jan 25, 1994
-
The United States Department of Energy
-
Duncan W. MacArthur
-
G01 - MEASURING TESTING
-
Long range alpha particle detector
-
Patent number 5,184,019
-
Issue date Feb 2, 1993
-
The United States of America as represented by the United States Department o...
-
Duncan W. MacArthur
-
G01 - MEASURING TESTING
-
-
-
-
-
-
Radon detection
-
Patent number 4,297,574
-
Issue date Oct 27, 1981
-
Jeffrey W. Card
-
G01 - MEASURING TESTING
-
3442250
-
Patent number 3,442,250
-
Issue date May 6, 1969
-
G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
-
3413469
-
Patent number 3,413,469
-
Issue date Nov 26, 1968
-
G01 - MEASURING TESTING
-
3387181
-
Patent number 3,387,181
-
Issue date Jun 4, 1968
-
G01 - MEASURING TESTING
-
3290501
-
Patent number 3,290,501
-
Issue date Dec 6, 1966
-
G01 - MEASURING TESTING
-
3289003
-
Patent number 3,289,003
-
Issue date Nov 29, 1966
-
G01 - MEASURING TESTING
-
3200041
-
Patent number 3,200,041
-
Issue date Aug 10, 1965
-
G01 - MEASURING TESTING
-
3174041
-
Patent number 3,174,041
-
Issue date Mar 16, 1965
-
G01 - MEASURING TESTING
-
3166707
-
Patent number 3,166,707
-
Issue date Jan 19, 1965
-
G01 - MEASURING TESTING
-
3145148
-
Patent number 3,145,148
-
Issue date Aug 18, 1964
-
G01 - MEASURING TESTING
-
3138710
-
Patent number 3,138,710
-
Issue date Jun 23, 1964
-
G01 - MEASURING TESTING
-
3136891
-
Patent number 3,136,891
-
Issue date Jun 9, 1964
-
G01 - MEASURING TESTING
-
3116414
-
Patent number 3,116,414
-
Issue date Dec 31, 1963
-
G01 - MEASURING TESTING
-
3110803
-
Patent number 3,110,803
-
Issue date Nov 12, 1963
-
G01 - MEASURING TESTING
-
3109096
-
Patent number 3,109,096
-
Issue date Oct 29, 1963
-
G01 - MEASURING TESTING
-
3089032
-
Patent number 3,089,032
-
Issue date May 7, 1963
-
G01 - MEASURING TESTING
-
3084252
-
Patent number 3,084,252
-
Issue date Apr 2, 1963
-
G01 - MEASURING TESTING
-
3084251
-
Patent number 3,084,251
-
Issue date Apr 2, 1963
-
G01 - MEASURING TESTING
-
3031573
-
Patent number 3,031,573
-
Issue date Apr 24, 1962
-
G01 - MEASURING TESTING
-
3029344
-
Patent number 3,029,344
-
Issue date Apr 10, 1962
-
G01 - MEASURING TESTING