by making use of ionisation effects

Industry

CPC
G01L21/30

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE G01L21/00Vacuum gauges

Current Industry

G01L21/30by making use of ionisation effects

Industries

Patents Grantslast 30 patents

Information Patent Grant
Techniques for measuring collision rate with spatial filtering of s...
- Patent number 11,561,148
- Issue date Jan 24, 2023
- IONQ, INC.
- Neal Pisenti
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Polymer composite vacuum components
- Patent number 11,366,036
- Issue date Jun 21, 2022
- MKS Instruments, Inc.
- Brandon J. Kelly
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Quantum pressure standard and methods for determining and using same
- Patent number 11,221,268
- Issue date Jan 11, 2022
- The University of British Coumbia
- Kirk W. Madison
- G01 - MEASURING TESTING
Information Patent Grant
Fast pressure sensing system
- Patent number 11,101,120
- Issue date Aug 24, 2021
- SRI International
- Ashish Chaudhary
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Polymer composite vacuum components
- Patent number 10,876,917
- Issue date Dec 29, 2020
- MKS Instruments, Inc.
- Brandon J. Kelly
- G01 - MEASURING TESTING
Information Patent Grant
Device for detecting faults in rails by measuring impedance
- Patent number 10,718,729
- Issue date Jul 21, 2020
- Metrolab
- René Tützauer
- B61 - RAILWAYS
Information Patent Grant
Spark gap device and method of measurement of X-ray tube vacuum pre...
- Patent number 10,605,687
- Issue date Mar 31, 2020
- General Electric Company
- Richard Michael Roffers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ground based systems and methods for testing reaction thrusters
- Patent number 10,590,919
- Issue date Mar 17, 2020
- Aerojet Rocketdyne, Inc.
- David Q. King
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for preventing malfunction in an electronic de...
- Patent number 10,539,525
- Issue date Jan 21, 2020
- Samsung Electronics Co., Ltd.
- Hyun-Jong Roh
- G01 - MEASURING TESTING
Information Patent Grant
Polymer composite vacuum components
- Patent number 10,359,332
- Issue date Jul 23, 2019
- MKS Instruments, Inc.
- Brandon J. Kelly
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Cold cathode ionization vacuum gauge with multiple cathodes
- Patent number 10,337,940
- Issue date Jul 2, 2019
- MKS Instruments, Inc.
- Timothy C. Swinney
- G01 - MEASURING TESTING
Information Patent Grant
Ionization gauge for high pressure operation
- Patent number 9,952,113
- Issue date Apr 24, 2018
- MKS Instruments, Inc.
- Gerardo A. Brucker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for preventing malfunction in an electronic de...
- Patent number 9,927,383
- Issue date Mar 27, 2018
- Samsung Electronics Co., Ltd.
- Hyun-Jong Roh
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Ionization pressure gauge with bias voltage and emission current co...
- Patent number 9,927,317
- Issue date Mar 27, 2018
- MKS Instruments, Inc.
- Douglas C. Hansen
- G01 - MEASURING TESTING
Information Patent Grant
Impedance-based measurement device with a two-dimensional array of...
- Patent number 9,804,111
- Issue date Oct 31, 2017
- PROCEQ SA
- Peter Stierli
- G01 - MEASURING TESTING
Information Patent Grant
Vacuum pressure gauge
- Patent number 9,726,566
- Issue date Aug 8, 2017
- Honeywell International Inc.
- Joshua Dorr
- G01 - MEASURING TESTING
Information Patent Grant
Ionized gas detector and ionized gas detecting method
- Patent number 9,645,113
- Issue date May 9, 2017
- TOKYO METROPOLITAN INDUSTRIAL TECHNOLOGY RESEARCH INSTITUTE
- Yoshiaki Haramoto
- G08 - SIGNALLING
Information Patent Grant
System and method for identifying operating temperatures and modify...
- Patent number 9,625,325
- Issue date Apr 18, 2017
- GLOBALFOUNDRIES Inc.
- Jeanne P. Bickford
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ionization gauge for high pressure operation
- Patent number 9,593,996
- Issue date Mar 14, 2017
- MKS Instruments, Inc.
- Gerardo A. Brucker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Long lifetime cold cathode ionization vacuum gauge design
- Patent number 9,588,004
- Issue date Mar 7, 2017
- MKS Instruments, Inc.
- Gerardo A. Brucker
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of assessing vacuum conditions in a mass spectrometer with t...
- Patent number 9,460,905
- Issue date Oct 4, 2016
- Thermo Fisher Scientific (Bremen) GmbH
- Konstantin Aizikov
- G01 - MEASURING TESTING
Information Patent Grant
Ionization gauge with operational parameters and geometry designed...
- Patent number 9,404,827
- Issue date Aug 2, 2016
- MKS Instruments, Inc.
- Gerardo A. Brucker
- G01 - MEASURING TESTING
Information Patent Grant
Ionization gauge with emission current and bias potential control
- Patent number 9,383,286
- Issue date Jul 5, 2016
- MKS Instruments, Inc.
- Larry K. Carmichael
- G01 - MEASURING TESTING
Information Patent Grant
Cold cathode ionization vacuum gauge and inner wall protection member
- Patent number 9,316,555
- Issue date Apr 19, 2016
- Canon Anelva Corporation
- Itaru Enomoto
- G01 - MEASURING TESTING
Information Patent Grant
Ionization vacuum measuring cell
- Patent number 9,116,065
- Issue date Aug 25, 2015
- Inficon GmbH
- Bernhard Andreaus
- G01 - MEASURING TESTING
Information Patent Grant
Ionization gauge with emission current and bias potential control
- Patent number 8,947,098
- Issue date Feb 3, 2015
- MKS Instruments, Inc.
- Larry K. Carmichael
- G01 - MEASURING TESTING
Information Patent Grant
Method for functionally testing a leak detector
- Patent number 8,850,866
- Issue date Oct 7, 2014
- Inficon GmbH
- Randolf Rolff
- G01 - MEASURING TESTING
Information Patent Grant
Ionization gauge with operational parameters and geometry designed...
- Patent number 8,648,604
- Issue date Feb 11, 2014
- Brooks Automation, Inc.
- Gerardo A. Brucker
- G01 - MEASURING TESTING
Information Patent Grant
Ionization vacuum gauge
- Patent number 8,169,223
- Issue date May 1, 2012
- Tsinghua University
- Lin Xiao
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for storing vacuum gauge calibration parameter...
- Patent number 7,921,719
- Issue date Apr 12, 2011
- Brooks Automation, Inc.
- Paul C. Arnold
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CHAMBER FOR AN IONIZATION VACUUM GAUGE
- Publication number 20240194465
- Publication date Jun 13, 2024
- INFICON AG
- Urs WÄLCHLI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CONTROLLING THE RADIOTHERAPY TREATMENT OF CANCER PATIENT...
- Publication number 20230037123
- Publication date Feb 2, 2023
- S.I.T.-SORDINA IORT TECHNOLOGIES SPA
- Giuseppe FELICI
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
TECHNIQUES FOR MEASURING COLLISION RATE WITH SPATIAL FILTERING OF S...
- Publication number 20220120629
- Publication date Apr 21, 2022
- IonQ, Inc.
- Neal PISENTI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Polymer Composite Vacuum Components
- Publication number 20210096035
- Publication date Apr 1, 2021
- Brandon J. Kelly
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
FAST PRESSURE SENSING SYSTEM
- Publication number 20200161109
- Publication date May 21, 2020
- SRI International
- Ashish Chaudhary
- G01 - MEASURING TESTING
Information Patent Application
QUANTUM PRESSURE STANDARD AND METHODS FOR DETERMINING AND USING SAME
- Publication number 20200025639
- Publication date Jan 23, 2020
- The University of British Columbia
- Kirk W. MADISON
- G01 - MEASURING TESTING
Information Patent Application
Polymer Composite Vacuum Components
- Publication number 20190271607
- Publication date Sep 5, 2019
- Brandon J. Kelly
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR PREVENTING MALFUNCTION IN AN ELECTRONIC DE...
- Publication number 20180217077
- Publication date Aug 2, 2018
- Samsung Electronics Co., Ltd.
- Hyun-Jong Roh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
VACUUM PRESSURE GAUGE
- Publication number 20170307459
- Publication date Oct 26, 2017
- Honeywell International Inc.
- Joshua Dorr
- G01 - MEASURING TESTING
Information Patent Application
Spark Gap Device And Method Of Measurement Of X-Ray Tube Vacuum Pre...
- Publication number 20170248485
- Publication date Aug 31, 2017
- GENERAL ELECTRIC COMPANY
- Richard Michael Roffers
- G01 - MEASURING TESTING
Information Patent Application
VACUUM PRESSURE GAUGE
- Publication number 20160320259
- Publication date Nov 3, 2016
- Honeywell International Inc.
- Joshua Dorr
- G01 - MEASURING TESTING
Information Patent Application
Method of Assessing Vacuum Conditions in a Mass Spectrometer
- Publication number 20150325424
- Publication date Nov 12, 2015
- Thermo Fisher Scientific (Bremen) GmbH
- Konstantin AIZIKOV
- G01 - MEASURING TESTING
Information Patent Application
IONIZATION GAUGE FOR HIGH PRESSURE OPERATION
- Publication number 20150300904
- Publication date Oct 22, 2015
- MKS Instruments, Inc.
- Gerardo A. Brucker
- G01 - MEASURING TESTING
Information Patent Application
Ionization Gauge With Emission Current and Bias Potential Control
- Publication number 20150108993
- Publication date Apr 23, 2015
- MKS Instruments, Inc.
- Larry K. Carmichael
- G01 - MEASURING TESTING
Information Patent Application
COLD CATHODE IONIZATION VACUUM GAUGE AND INNER WALL PROTECTION MEMBER
- Publication number 20140368210
- Publication date Dec 18, 2014
- Canon ANELVA Corporation
- ITARU ENOMOTO
- G01 - MEASURING TESTING
Information Patent Application
IONIZATION VACUUM MEASURING CELL
- Publication number 20140176150
- Publication date Jun 26, 2014
- INFICON GMBH
- Bernhard Andreaus
- G01 - MEASURING TESTING
Information Patent Application
IONIZATION GAUGE WITH OPERATIONAL PARAMETERS AND GEOMETRY DESIGNED...
- Publication number 20140152320
- Publication date Jun 5, 2014
- Brooks Automation, Inc.
- Gerardo A. Brucker
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR FUNCTIONALLY TESTING A LEAK DETECTOR
- Publication number 20120031162
- Publication date Feb 9, 2012
- Inficon gmbH
- Randolf Rolff
- G01 - MEASURING TESTING
Information Patent Application
Ionization Gauge With Emission Current And Bias Potential Control
- Publication number 20110163754
- Publication date Jul 7, 2011
- Brooks Automation, Inc.
- Larry K. Carmichael
- G01 - MEASURING TESTING
Information Patent Application
Ionization Gauge With Operational Parameters And Geometry Designed...
- Publication number 20110062961
- Publication date Mar 17, 2011
- Brooks Automation, Inc.
- Gerardo A. Brucker
- G01 - MEASURING TESTING
Information Patent Application
Ionization Vacume gauge
- Publication number 20090278436
- Publication date Nov 12, 2009
- Tsinghua University
- Lin Xiao
- G01 - MEASURING TESTING
Information Patent Application
PRESSURE SENSOR USING FIELD EMISSION OF CARBON NANO-TUBE
- Publication number 20090072836
- Publication date Mar 19, 2009
- In Mook Choi
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for storing vacuum gauge calibration parameter...
- Publication number 20070251293
- Publication date Nov 1, 2007
- Paul C. Arnold
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for storing vacuum gauge calibration parameter...
- Publication number 20060123915
- Publication date Jun 15, 2006
- Helix Technology Corporation
- Paul C. Arnold
- G01 - MEASURING TESTING
Information Patent Application
Emission spectroscopic processing apparatus and plasma processing m...
- Publication number 20050155952
- Publication date Jul 21, 2005
- Tetsunori Kaji
- G01 - MEASURING TESTING
Information Patent Application
Device to detect pressure in an x-ray tube
- Publication number 20040240617
- Publication date Dec 2, 2004
- Josef Deuringer
- G01 - MEASURING TESTING
Information Patent Application
Plasma processing method using spectroscopic processing unit
- Publication number 20040045933
- Publication date Mar 11, 2004
- Tetsunori Kaji
- G01 - MEASURING TESTING
Information Patent Application
Emission spectroscopic processing apparatus and plasma processing m...
- Publication number 20030098290
- Publication date May 29, 2003
- Tetsunori Kaji
- G01 - MEASURING TESTING
Information Patent Application
Apparatus for measuring total pressure and partial pressure with co...
- Publication number 20020153820
- Publication date Oct 24, 2002
- Inficon Inc.
- Robert E. Ellefson
- G01 - MEASURING TESTING

by making use of ionisation effects

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Techniques for measuring collision rate with spatial filtering of s...

Polymer composite vacuum components

Quantum pressure standard and methods for determining and using same

Fast pressure sensing system

Polymer composite vacuum components

Device for detecting faults in rails by measuring impedance

Spark gap device and method of measurement of X-ray tube vacuum pre...

Ground based systems and methods for testing reaction thrusters

Apparatus and method for preventing malfunction in an electronic de...

Polymer composite vacuum components

Cold cathode ionization vacuum gauge with multiple cathodes

Ionization gauge for high pressure operation

Apparatus and method for preventing malfunction in an electronic de...

Ionization pressure gauge with bias voltage and emission current co...

Impedance-based measurement device with a two-dimensional array of...

Vacuum pressure gauge

Ionized gas detector and ionized gas detecting method

System and method for identifying operating temperatures and modify...

Ionization gauge for high pressure operation

Long lifetime cold cathode ionization vacuum gauge design

Method of assessing vacuum conditions in a mass spectrometer with t...

Ionization gauge with operational parameters and geometry designed...

Ionization gauge with emission current and bias potential control

Cold cathode ionization vacuum gauge and inner wall protection member

Ionization vacuum measuring cell

Ionization gauge with emission current and bias potential control

Method for functionally testing a leak detector

Ionization gauge with operational parameters and geometry designed...

Ionization vacuum gauge

Method and apparatus for storing vacuum gauge calibration parameter...

Patents Applicationslast 30 patents

CHAMBER FOR AN IONIZATION VACUUM GAUGE

METHOD FOR CONTROLLING THE RADIOTHERAPY TREATMENT OF CANCER PATIENT...

TECHNIQUES FOR MEASURING COLLISION RATE WITH SPATIAL FILTERING OF S...

Polymer Composite Vacuum Components

FAST PRESSURE SENSING SYSTEM

QUANTUM PRESSURE STANDARD AND METHODS FOR DETERMINING AND USING SAME

Polymer Composite Vacuum Components

APPARATUS AND METHOD FOR PREVENTING MALFUNCTION IN AN ELECTRONIC DE...

VACUUM PRESSURE GAUGE

Spark Gap Device And Method Of Measurement Of X-Ray Tube Vacuum Pre...

VACUUM PRESSURE GAUGE

Method of Assessing Vacuum Conditions in a Mass Spectrometer

IONIZATION GAUGE FOR HIGH PRESSURE OPERATION

Ionization Gauge With Emission Current and Bias Potential Control

COLD CATHODE IONIZATION VACUUM GAUGE AND INNER WALL PROTECTION MEMBER

IONIZATION VACUUM MEASURING CELL

IONIZATION GAUGE WITH OPERATIONAL PARAMETERS AND GEOMETRY DESIGNED...

METHOD FOR FUNCTIONALLY TESTING A LEAK DETECTOR

Ionization Gauge With Emission Current And Bias Potential Control

Ionization Gauge With Operational Parameters And Geometry Designed...

Ionization Vacume gauge

PRESSURE SENSOR USING FIELD EMISSION OF CARBON NANO-TUBE

Method and apparatus for storing vacuum gauge calibration parameter...

Method and apparatus for storing vacuum gauge calibration parameter...

Emission spectroscopic processing apparatus and plasma processing m...

Device to detect pressure in an x-ray tube

Plasma processing method using spectroscopic processing unit

Emission spectroscopic processing apparatus and plasma processing m...

Apparatus for measuring total pressure and partial pressure with co...