by spectrometry

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H05H1/0037

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Parent Industries

HELECTRICITY H05Electric techniques H05HPLASMA TECHNIQUE PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS H05H1/00Generating plasma Handling plasma

Current Industry

H05H1/0037by spectrometry

Industries

Patents Grantslast 30 patents

Information Patent Grant
Glow plasma gas measurement signal processing
- Patent number 11,948,774
- Issue date Apr 2, 2024
- Servomex Group Limited
- Bahram Alizadeh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for Thomson scattering background interference...
- Patent number 11,924,956
- Issue date Mar 5, 2024
- The Texas A&M University System
- Richard B. Miles
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Probe for measuring plasma parameters
- Patent number 11,800,627
- Issue date Oct 24, 2023
- Ruhr-Universität Bochum
- Dennis Pohle
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Air leak detection in plasma processing apparatus with separation grid
- Patent number 11,039,527
- Issue date Jun 15, 2021
- Mattson Technology, Inc.
- Shuang Meng
- G01 - MEASURING TESTING
Information Patent Grant
Microwave plasma source
- Patent number 10,923,324
- Issue date Feb 16, 2021
- Verity Instruments, Inc.
- Mark A. Meloni
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for lowering the reduction of iron ore energy
- Patent number 10,704,121
- Issue date Jul 7, 2020
- CAPITAL ONE SERVICES, LLC
- David Wurmfeld
- C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...
Information Patent Grant
Laser surface treatment and spectroscopic analysis system
- Patent number 10,677,741
- Issue date Jun 9, 2020
- UNITED STATES OF AMERICA AS REPRESENTED BY THE ADMINISTRATOR OF NASA.
- John W. Connell
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Plasma generation apparatus including measurement device and plasma...
- Patent number 10,616,989
- Issue date Apr 7, 2020
- Mitsubishi Heavy Industries, Ltd.
- Tatsufumi Aoi
- F03 - MACHINES OR ENGINES FOR LIQUIDS WIND, SPRING WEIGHT AND MISCELLANEOUS M...
Information Patent Grant
ICP analyzer
- Patent number 10,490,395
- Issue date Nov 26, 2019
- Shimadzu Corporation
- Naoki Yasuda
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Plasma torch
- Patent number 10,390,417
- Issue date Aug 20, 2019
- Glass Expansion PTY. Limited
- Danny Brezni
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Asymmetric induction devices and systems and methods using them
- Patent number 10,375,811
- Issue date Aug 6, 2019
- PerkinElmer Health Sciences, Inc.
- Peter J Morrisroe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Counterflow sample introduction and devices, systems and methods us...
- Patent number 10,327,319
- Issue date Jun 18, 2019
- PerkinElmer Health Sciences, Inc.
- Peter Morrisroe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for determining the type, density and temperat...
- Patent number 9,930,766
- Issue date Mar 27, 2018
- Nanyang Technological University
- Chia Sern Chan
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-frequency power supply device
- Patent number 9,648,719
- Issue date May 9, 2017
- Shimadzu Corporation
- Toshiya Habu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for analyzing particles in cold plasma
- Patent number 9,506,868
- Issue date Nov 29, 2016
- Centre National de la Recherche Scientifique
- Laïfa Boufendi
- G01 - MEASURING TESTING
Information Patent Grant
Device and use of the device for measuring the density and/or the e...
- Patent number 9,113,543
- Issue date Aug 18, 2015
- Ruhr-Universität Bochum
- Ralf Peter Brinkmann
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method and apparatus for control of a plasma for spectrometry
- Patent number 8,822,948
- Issue date Sep 2, 2014
- Thermo Electron Manufacturing Limited
- Stephen Hartwell
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Light emission analyzing device
- Patent number 8,781,793
- Issue date Jul 15, 2014
- CREV Inc.
- Masaki Yamashita
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Etching apparatus, analysis apparatus, etching treatment method, an...
- Patent number 8,486,290
- Issue date Jul 16, 2013
- Hitachi High-Technologies Corporation
- Toshihiro Morisawa
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Apparatus and use of the apparatus for the determination of the den...
- Patent number 7,878,045
- Issue date Feb 1, 2011
- Ralf-Peter Brinkmann
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Partial pressure measuring method and partial pressure measuring ap...
- Patent number 7,814,796
- Issue date Oct 19, 2010
- Panasonic Corporation
- Masahiro Yamamoto
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Particle density measuring probe and particle density measuring equ...
- Patent number 7,782,463
- Issue date Aug 24, 2010
- NU Eco Engineering Co., Ltd.
- Masanu Hori
- G01 - MEASURING TESTING
Information Patent Grant
System and method for determining at least one constituent in an am...
- Patent number 7,733,482
- Issue date Jun 8, 2010
- Harry E. Ruda
- F24 - HEATING RANGES VENTILATING
Information Patent Grant
Arrangement for monitoring thermal spray processes
- Patent number 7,688,441
- Issue date Mar 30, 2010
- MTU Aero Engines GmbH
- Manuel Hertter
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Optical monitoring and control system and method for plasma reactors
- Patent number 7,462,335
- Issue date Dec 9, 2008
- Tokyo Electron Limited
- Lianjun Liu
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Energy spectrum measuring apparatus, electron energy loss spectrome...
- Patent number 7,250,601
- Issue date Jul 31, 2007
- Hitachi High-Technologies Corporation
- Kazutoshi Kaji
- G01 - MEASURING TESTING
Information Patent Grant
Plasma processing method
- Patent number 7,147,748
- Issue date Dec 12, 2006
- Hitachi High-Technologies Corporation
- Go Miya
- G01 - MEASURING TESTING
Information Patent Grant
Plasma processing apparatus and plasma processing method
- Patent number 7,147,747
- Issue date Dec 12, 2006
- Hitachi High-Technologies Corporation
- Go Miya
- G01 - MEASURING TESTING
Information Patent Grant
Energy spectrum measuring apparatus, electron energy loss spectrome...
- Patent number 7,067,805
- Issue date Jun 27, 2006
- Hitachi High-Technologies Corporation
- Kazutoshi Kajl
- G01 - MEASURING TESTING
Information Patent Grant
Optical monitoring and control system and method for plasma reactors
- Patent number 7,018,553
- Issue date Mar 28, 2006
- Tokyo Electron Limited
- Lianjun Liu
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

Information Patent Application
PLASMA TORCH DEVICE COMPONENT MONITORING
- Publication number 20240179826
- Publication date May 30, 2024
- Edwards Limited
- Gary Peter Knight
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
MULTIPLE PLASMA ION SOURCE FOR INLINE SECONDARY ION MASS SPECTROMETRY
- Publication number 20240090111
- Publication date Mar 14, 2024
- Ming Hong YANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
A SPARK STAND AND METHOD OF MAINTENANCE
- Publication number 20220333990
- Publication date Oct 20, 2022
- Thermo Fisher Scientific (Ecublens)
- Fabio Demarco
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Systems and Methods for Thomson Scattering Background Interference...
- Publication number 20210410263
- Publication date Dec 30, 2021
- THE TEXAS A&M UNIVERSITY SYSTEM
- Richard B. Miles
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
PROCESS CONTROL FOR ATMOSPHERIC PLASMA TREATMENT OF SURFACES
- Publication number 20210339034
- Publication date Nov 4, 2021
- Steven R. Walther
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
Air Leak Detection In Plasma Processing Apparatus With Separation Grid
- Publication number 20210307151
- Publication date Sep 30, 2021
- Mattson Technology, Inc.
- Shuang Meng
- G01 - MEASURING TESTING
Information Patent Application
PLASMA MEASURING APPARATUS AND PLASMA MEASURING METHOD
- Publication number 20210289612
- Publication date Sep 16, 2021
- TOKYO ELECTRON LIMITED
- Shinji KUBOTA
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Probe for Measuring Plasma Parameters
- Publication number 20210251067
- Publication date Aug 12, 2021
- RUHR-UNIVERSITÄT BOCHUM
- Dennis Pohle
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Air Leak Detection In Plasma Processing Apparatus With Separation Grid
- Publication number 20200245444
- Publication date Jul 30, 2020
- Mattson Technology, Inc.
- Shuang Meng
- G01 - MEASURING TESTING
Information Patent Application
Water Vapor Quantification Methodology During Drying of Spent Nucle...
- Publication number 20200135350
- Publication date Apr 30, 2020
- University of South Carolina
- Tanvir Farouk
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Laser Surface Treatment and Spectroscopic Analysis System
- Publication number 20190033231
- Publication date Jan 31, 2019
- United States of America as represented by the Administrator of NASA
- John W. Connell
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
PLASMA TORCH
- Publication number 20180168023
- Publication date Jun 14, 2018
- Glass Expansion Pty. Limited
- Danny Brezni
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
ASYMMETRIC INDUCTION DEVICES AND SYSTEMS AND METHODS USING THEM
- Publication number 20170231077
- Publication date Aug 10, 2017
- PerkinElmer Health Sciences, Inc.
- Peter J. Morrisroe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AN APPARATUS AND METHOD FOR DIAGNOSTICS OF NETURAL RADICALS IN PLASMA
- Publication number 20160198558
- Publication date Jul 7, 2016
- Chia Sern CHAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND SYSTEM FOR ANALYSING PARTICLES IN COLD PLASMA
- Publication number 20150241357
- Publication date Aug 27, 2015
- Centre National de la Recherche Scientifique
- Laïfa Boufendi
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR CONTROL OF A PLASMA FOR SPECTROMETRY
- Publication number 20140264000
- Publication date Sep 18, 2014
- THERMO ELECTRON MANUFACTURING LIMITED
- Stephen HARTWELL
- G01 - MEASURING TESTING
Information Patent Application
LIGHT EMISSION ANALYZING DEVICE
- Publication number 20140107980
- Publication date Apr 17, 2014
- Masaki Yamashita
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND USE OF THE DEVICE FOR MEASURING THE DENSITY AND/OR THE E...
- Publication number 20130160523
- Publication date Jun 27, 2013
- RUHR-UNIVERSITÄT BOCHUM
- Ralf Peter Brinkmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ETCHING APPARATUS, ANALYSIS APPARATUS, ETCHING TREATMENT METHOD, AN...
- Publication number 20110315661
- Publication date Dec 29, 2011
- Toshihiro Morisawa
- G01 - MEASURING TESTING
Information Patent Application
Particle density measuring probe and particle density measuring equ...
- Publication number 20090237667
- Publication date Sep 24, 2009
- NU Eco Engineering Co., Ltd.
- Masanu Hori
- G01 - MEASURING TESTING
Information Patent Application
Apparatus and Use of the Apparatus for the Determination of the Den...
- Publication number 20090133471
- Publication date May 28, 2009
- Ralf-Peter Brinkmann
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Arrangement for Monitoring Thermal Spray Processes
- Publication number 20090051915
- Publication date Feb 26, 2009
- MTU Aero EnginesGmbH
- Manuel Hertter
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
PARTIAL PRESSURE MEASURING METHOD AND PARTIAL PRESSURE MEASURING AP...
- Publication number 20080257014
- Publication date Oct 23, 2008
- Masahiro Yamamoto
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
System and Method For Measuring Air Quality Using A Micro-Optical M...
- Publication number 20080239309
- Publication date Oct 2, 2008
- Harry E. Ruda
- F24 - HEATING RANGES VENTILATING
Information Patent Application
Energy spectrum measuring apparatus, electron energy loss spectrome...
- Publication number 20060163479
- Publication date Jul 27, 2006
- Kazutoshi Kaji
- G01 - MEASURING TESTING
Information Patent Application
Energy spectrum measuring apparatus, electron energy loss spectrome...
- Publication number 20040183011
- Publication date Sep 23, 2004
- Kazutoshi Kaji
- G01 - MEASURING TESTING
Information Patent Application
Plasma processing apparatus and plasma processing method
- Publication number 20040173309
- Publication date Sep 9, 2004
- Go Miya
- G01 - MEASURING TESTING
Information Patent Application
processing method
- Publication number 20040166598
- Publication date Aug 26, 2004
- Go Miya
- G01 - MEASURING TESTING
Information Patent Application
Optical monitoring and control system and method for plasma reactors
- Publication number 20030201162
- Publication date Oct 30, 2003
- Lianjun Liu
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Method for monitoring plasma or flame-spray processes
- Publication number 20030052259
- Publication date Mar 20, 2003
- Erwin Bayer
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

by spectrometry

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Glow plasma gas measurement signal processing

Systems and methods for Thomson scattering background interference...

Probe for measuring plasma parameters

Air leak detection in plasma processing apparatus with separation grid

Microwave plasma source

Systems and methods for lowering the reduction of iron ore energy

Laser surface treatment and spectroscopic analysis system

Plasma generation apparatus including measurement device and plasma...

ICP analyzer

Plasma torch

Asymmetric induction devices and systems and methods using them

Counterflow sample introduction and devices, systems and methods us...

Apparatus and method for determining the type, density and temperat...

High-frequency power supply device

Method and system for analyzing particles in cold plasma

Device and use of the device for measuring the density and/or the e...

Method and apparatus for control of a plasma for spectrometry

Light emission analyzing device

Etching apparatus, analysis apparatus, etching treatment method, an...

Apparatus and use of the apparatus for the determination of the den...

Partial pressure measuring method and partial pressure measuring ap...

Particle density measuring probe and particle density measuring equ...

System and method for determining at least one constituent in an am...

Arrangement for monitoring thermal spray processes

Optical monitoring and control system and method for plasma reactors

Energy spectrum measuring apparatus, electron energy loss spectrome...

Plasma processing method

Plasma processing apparatus and plasma processing method

Energy spectrum measuring apparatus, electron energy loss spectrome...

Optical monitoring and control system and method for plasma reactors

Patents Applicationslast 30 patents

PLASMA TORCH DEVICE COMPONENT MONITORING

MULTIPLE PLASMA ION SOURCE FOR INLINE SECONDARY ION MASS SPECTROMETRY

A SPARK STAND AND METHOD OF MAINTENANCE

Systems and Methods for Thomson Scattering Background Interference...

PROCESS CONTROL FOR ATMOSPHERIC PLASMA TREATMENT OF SURFACES

Air Leak Detection In Plasma Processing Apparatus With Separation Grid

PLASMA MEASURING APPARATUS AND PLASMA MEASURING METHOD

Probe for Measuring Plasma Parameters

Air Leak Detection In Plasma Processing Apparatus With Separation Grid

Water Vapor Quantification Methodology During Drying of Spent Nucle...

Laser Surface Treatment and Spectroscopic Analysis System

PLASMA TORCH

ASYMMETRIC INDUCTION DEVICES AND SYSTEMS AND METHODS USING THEM

AN APPARATUS AND METHOD FOR DIAGNOSTICS OF NETURAL RADICALS IN PLASMA

METHOD AND SYSTEM FOR ANALYSING PARTICLES IN COLD PLASMA

METHOD AND APPARATUS FOR CONTROL OF A PLASMA FOR SPECTROMETRY

LIGHT EMISSION ANALYZING DEVICE

DEVICE AND USE OF THE DEVICE FOR MEASURING THE DENSITY AND/OR THE E...

ETCHING APPARATUS, ANALYSIS APPARATUS, ETCHING TREATMENT METHOD, AN...

Particle density measuring probe and particle density measuring equ...

Apparatus and Use of the Apparatus for the Determination of the Den...

Arrangement for Monitoring Thermal Spray Processes

PARTIAL PRESSURE MEASURING METHOD AND PARTIAL PRESSURE MEASURING AP...

System and Method For Measuring Air Quality Using A Micro-Optical M...

Energy spectrum measuring apparatus, electron energy loss spectrome...

Energy spectrum measuring apparatus, electron energy loss spectrome...

Plasma processing apparatus and plasma processing method

processing method

Optical monitoring and control system and method for plasma reactors

Method for monitoring plasma or flame-spray processes