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CPC
G01N2030/8476
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Parent Industries
G
PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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G01N2030/8476
by thermal means
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Patents Grants
last 30 patents
Information
Patent Grant
Evaporative light scattering detector
Patent number
8,089,627
Issue date
Jan 3, 2012
Waters Technologies Corporation
Joseph A. Jarrell
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for concentrating and collecting analytes from...
Patent number
7,332,347
Issue date
Feb 19, 2008
Liang Li
G01 - MEASURING TESTING
Information
Patent Grant
Continuous flow apparatus and method for interfacing liquid chromat...
Patent number
5,538,643
Issue date
Jul 23, 1996
The Dow Chemical Company
George J. Kallos
G01 - MEASURING TESTING
Information
Patent Grant
Interface for separating an analyte of interest from a liquid solvent
Patent number
4,801,430
Issue date
Jan 31, 1989
Trustees of Tufts College
Jr. Albert Robbat
G01 - MEASURING TESTING
Information
Patent Grant
N-nitroso compound analyzer with sample atomization
Patent number
4,066,411
Issue date
Jan 3, 1978
Thermo Electron Corporation
David H. Fine
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Evaporative Light Scattering Detector
Publication number
20110134428
Publication date
Jun 9, 2011
WATERS TECHNOLOGIES CORPORATION
Joseph A. Jarrell
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and method for concentrating and collecting analytes from...
Publication number
20040203175
Publication date
Oct 14, 2004
Liang Li
G01 - MEASURING TESTING