by thermal means

Industry

CPC
G01N30/7253

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N30/00Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange

Current Industry

G01N30/7253by thermal means

Industries

Patents Grantslast 30 patents

Information Patent Grant
Chromatographic offline sample preparation and storage for sample a...
- Patent number 9,953,822
- Issue date Apr 24, 2018
- Elemental Scientific, Inc.
- Daniel R. Wiederin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for rapid evaporative ionization of liquid phase...
- Patent number 9,805,922
- Issue date Oct 31, 2017
- Micromass UK Limited
- Zoltan Takats
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
System and method for rapid evaporative ionization of liquid phase...
- Patent number 9,281,174
- Issue date Mar 8, 2016
- Micromass UK Limited
- Zoltan Takats
- G01 - MEASURING TESTING
Information Patent Grant
Probe
- Patent number 9,008,496
- Issue date Apr 14, 2015
- Shimadzu Corporation
- Tomohito Nakano
- F24 - HEATING RANGES VENTILATING
Information Patent Grant
Device and method for determining material properties by means of HPLC
- Patent number 8,187,539
- Issue date May 29, 2012
- Joint Analytical Systems GmbH
- Joachim Gerstel
- G01 - MEASURING TESTING
Information Patent Grant
Ion sampling for APPI mass spectrometry
- Patent number 7,309,859
- Issue date Dec 18, 2007
- Agilent Technologies, Inc.
- Steven M. Fischer
- G01 - MEASURING TESTING
Information Patent Grant
Ion sampling for APPI mass spectrometry
- Patent number 7,002,146
- Issue date Feb 21, 2006
- Agilent Technologies, Inc.
- Steven M. Fischer
- G01 - MEASURING TESTING
Information Patent Grant
Ion sampling for APPI mass spectrometry
- Patent number 6,812,459
- Issue date Nov 2, 2004
- Agilent Technologies, Inc.
- Steven M. Fischer
- G01 - MEASURING TESTING
Information Patent Grant
Orthogonal ion sampling for APCI mass spectrometry
- Patent number 6,797,946
- Issue date Sep 28, 2004
- Agilent Technologies, Inc.
- James A. Apffel
- G01 - MEASURING TESTING
Information Patent Grant
Ion sampling for APPI mass spectrometry
- Patent number 6,653,626
- Issue date Nov 25, 2003
- Agilent Technologies, Inc.
- Steven M. Fischer
- G01 - MEASURING TESTING
Information Patent Grant
Orthogonal ion sampling for APCI mass spectrometry
- Patent number 6,639,216
- Issue date Oct 28, 2003
- Agilent Technologies, Inc.
- James A. Apffel
- G01 - MEASURING TESTING
Information Patent Grant
Orthogonal ion sampling for APCI mass spectrometry
- Patent number 6,498,343
- Issue date Dec 24, 2002
- Agilent Technologies, Inc.
- James A. Apffel
- G01 - MEASURING TESTING
Information Patent Grant
Orthogonal ion sampling for APCI mass spectrometry
- Patent number 6,294,779
- Issue date Sep 25, 2001
- Agilent Technologies, Inc.
- James A. Apffel
- G01 - MEASURING TESTING
Information Patent Grant
Orthogonal ion sampling for APCI mass spectrometry
- Patent number 6,278,110
- Issue date Aug 21, 2001
- Hewlett-Packard Company
- James A. Apffel
- G01 - MEASURING TESTING
Information Patent Grant
Orthogonal ion sampling for APCI mass spectrometry
- Patent number 5,750,988
- Issue date May 12, 1998
- Hewlett-Packard Company
- James A. Apffel
- G01 - MEASURING TESTING
Information Patent Grant
Orthogonal ion sampling for electrospray LC/MS
- Patent number 5,495,108
- Issue date Feb 27, 1996
- Hewlett-Packard Company
- James A. Apffel
- G01 - MEASURING TESTING
Information Patent Grant
Liquid chromatograph mass spectrometer
- Patent number 5,368,727
- Issue date Nov 29, 1994
- Hitachi, Ltd.
- Toshiaki Takahashi
- G01 - MEASURING TESTING
Information Patent Grant
Probe for thermospray mass spectrometry
- Patent number 5,289,003
- Issue date Feb 22, 1994
- The United States of America as represented by the Secretary of the Departmen...
- Steven M. Musser
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for introduction of liquid effluent into mass...
- Patent number 5,285,064
- Issue date Feb 8, 1994
- Extrel Corporation
- Ross C. Willoughby
- G01 - MEASURING TESTING
Information Patent Grant
Liquid chromatograph-direct coupled mass spectrometer
- Patent number 5,240,616
- Issue date Aug 31, 1993
- Hitachi, Ltd.
- Yoshiaki Kato
- G01 - MEASURING TESTING
Information Patent Grant
Probe-based electrospray adapter for thermospray equipped quadrupol...
- Patent number 5,235,186
- Issue date Aug 10, 1993
- Finnigan Mat, Inc.
- Russell H. Robins
- G01 - MEASURING TESTING
Information Patent Grant
Mass spectrometer
- Patent number 5,162,651
- Issue date Nov 10, 1992
- Hitachi, Ltd.
- Yoshiaki Kato
- G01 - MEASURING TESTING
Information Patent Grant
Mass spectrometer
- Patent number 5,103,093
- Issue date Apr 7, 1992
- Hitachi, Ltd.
- Minoru Sakairi
- G01 - MEASURING TESTING
Information Patent Grant
Single port thermospray ion source with coaxial vapor flow
- Patent number 5,030,826
- Issue date Jul 9, 1991
- Hewlett-Packard Company
- Stuart C. Hansen
- G01 - MEASURING TESTING
Information Patent Grant
Vaporization device for continuous introduction of liquids into a m...
- Patent number 4,982,097
- Issue date Jan 1, 1991
- Battelle Memorial Institute
- Laurence E. Slivon
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for introduction of liquid effluent into mass...
- Patent number 4,968,885
- Issue date Nov 6, 1990
- Extrel Corporation
- Ross C. Willoughby
- G01 - MEASURING TESTING
Information Patent Grant
Method and means for vaporizing liquids by means of heating a sampl...
- Patent number 4,960,992
- Issue date Oct 2, 1990
- Research Corporation Technologies
- Marvin L. Vestal
- G01 - MEASURING TESTING
Information Patent Grant
Thermospray methods and apparatus for interfacing chromatography an...
- Patent number 4,902,891
- Issue date Feb 20, 1990
- Vestec Corporation
- Marvin L. Vestal
- G01 - MEASURING TESTING
Information Patent Grant
Interface for coupling liquid chromatography to solid or gas phase...
- Patent number 4,883,958
- Issue date Nov 28, 1989
- Vestec Corporation
- Marvin L. Vestal
- G01 - MEASURING TESTING
Information Patent Grant
Ion vapor source for mass spectrometry of liquids
- Patent number 4,861,989
- Issue date Aug 29, 1989
- Research Corporation Technologies, Inc.
- Marvin L. Vestal
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
In situ U-Pb dating method for calcite
- Publication number 20240151704
- Publication date May 9, 2024
- Institute of Geology and Geophysics, Chinese Academy of Sciences
- Shitou WU
- G01 - MEASURING TESTING
Information Patent Application
SAMPLING FOR MOLECULAR ROTATIONAL RESONANCE SPECTROSCOPY
- Publication number 20240085286
- Publication date Mar 14, 2024
- BrightSpec, Inc.
- Voislav Blagojevic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System for Monitoring and Controlling the Composition of Charged Dr...
- Publication number 20220139690
- Publication date May 5, 2022
- DH Technologies Development Pte. Ltd.
- Thomas R. Covey
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR RAPID EVAPORATIVE IONIZATION OF LIQUID PHASE...
- Publication number 20140353488
- Publication date Dec 4, 2014
- MediMass, Kft.
- Zoltan Takats
- G01 - MEASURING TESTING
Information Patent Application
PROBE
- Publication number 20130243412
- Publication date Sep 19, 2013
- Shimadzu Corporation
- Tomohito NAKANO
- G01 - MEASURING TESTING
Information Patent Application
Device and Method for Determining Material Properties by Means of Hplc
- Publication number 20080089809
- Publication date Apr 17, 2008
- JOINT ANALYTICAL SYSTEMS GMBH
- Joachim Gerstel
- G01 - MEASURING TESTING
Information Patent Application
Ion sampling for APPI mass spectrometry
- Publication number 20060076505
- Publication date Apr 13, 2006
- Steven M. Fischer
- G01 - MEASURING TESTING
Information Patent Application
Ion sampling for APPI mass spectrometry
- Publication number 20050045833
- Publication date Mar 3, 2005
- Steven M. Fischer
- G01 - MEASURING TESTING
Information Patent Application
Orthogonal ion sampling for apci mass spectrometry
- Publication number 20040046118
- Publication date Mar 11, 2004
- James A. Apffel
- G01 - MEASURING TESTING
Information Patent Application
Ion sampling for APPI mass spectrometry
- Publication number 20040046126
- Publication date Mar 11, 2004
- Steven M. Fisher
- G01 - MEASURING TESTING
Information Patent Application
Orthogonal ion sampling for APCI mass spectrometry
- Publication number 20030075680
- Publication date Apr 24, 2003
- James A. Apffel
- G01 - MEASURING TESTING
Information Patent Application
Ion sampling for APPI mass spectrometry
- Publication number 20020179832
- Publication date Dec 5, 2002
- Steven M. Fischer
- G01 - MEASURING TESTING
Information Patent Application
Orthogonal ion sampling for APCI mass spectrometry
- Publication number 20010042829
- Publication date Nov 22, 2001
- James A. Apffel
- G01 - MEASURING TESTING

by thermal means

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Chromatographic offline sample preparation and storage for sample a...

System and method for rapid evaporative ionization of liquid phase...

System and method for rapid evaporative ionization of liquid phase...

Probe

Device and method for determining material properties by means of HPLC

Ion sampling for APPI mass spectrometry

Ion sampling for APPI mass spectrometry

Ion sampling for APPI mass spectrometry

Orthogonal ion sampling for APCI mass spectrometry

Ion sampling for APPI mass spectrometry

Orthogonal ion sampling for APCI mass spectrometry

Orthogonal ion sampling for APCI mass spectrometry

Orthogonal ion sampling for APCI mass spectrometry

Orthogonal ion sampling for APCI mass spectrometry

Orthogonal ion sampling for APCI mass spectrometry

Orthogonal ion sampling for electrospray LC/MS

Liquid chromatograph mass spectrometer

Probe for thermospray mass spectrometry

Method and apparatus for introduction of liquid effluent into mass...

Liquid chromatograph-direct coupled mass spectrometer

Probe-based electrospray adapter for thermospray equipped quadrupol...

Mass spectrometer

Mass spectrometer

Single port thermospray ion source with coaxial vapor flow

Vaporization device for continuous introduction of liquids into a m...

Method and apparatus for introduction of liquid effluent into mass...

Method and means for vaporizing liquids by means of heating a sampl...

Thermospray methods and apparatus for interfacing chromatography an...

Interface for coupling liquid chromatography to solid or gas phase...

Ion vapor source for mass spectrometry of liquids

Patents Applicationslast 30 patents

In situ U-Pb dating method for calcite

SAMPLING FOR MOLECULAR ROTATIONAL RESONANCE SPECTROSCOPY

System for Monitoring and Controlling the Composition of Charged Dr...

SYSTEM AND METHOD FOR RAPID EVAPORATIVE IONIZATION OF LIQUID PHASE...

PROBE

Device and Method for Determining Material Properties by Means of Hplc

Ion sampling for APPI mass spectrometry

Ion sampling for APPI mass spectrometry

Orthogonal ion sampling for apci mass spectrometry

Ion sampling for APPI mass spectrometry

Orthogonal ion sampling for APCI mass spectrometry

Ion sampling for APPI mass spectrometry

Orthogonal ion sampling for APCI mass spectrometry