by using microwaves

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H05H1/0062

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HELECTRICITY H05Electric techniques H05HPLASMA TECHNIQUE PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS H05H1/00Generating plasma Handling plasma

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H05H1/0062by using microwaves

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Patents Grantslast 30 patents

Information Patent Grant
Ignition apparatus including spark plug that generates plasma
- Patent number 11,129,268
- Issue date Sep 21, 2021
- Denso Corporation
- Shota Kinoshita
- F02 - COMBUSTION ENGINES HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
Information Patent Grant
Method for plasma dynamic cancellation for hypersonic vehicles
- Patent number 9,972,907
- Issue date May 15, 2018
- Raytheon Company
- Glafkos K. Stratis
- F42 - AMMUNITION BLASTING
Information Patent Grant
Harmonic derived arc detector
- Patent number 8,890,537
- Issue date Nov 18, 2014
- MKS Instruments, Inc.
- John Valcore
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Planar type frequency shift probe for measuring plasma electron den...
- Patent number 8,040,138
- Issue date Oct 18, 2011
- National University Corporation Nagoya University
- Hideo Sugai
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Harmonic derived arc detector
- Patent number 7,728,602
- Issue date Jun 1, 2010
- MKS Instruments, Inc.
- John Valcore
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Plasma electron density measuring and monitoring device
- Patent number 7,061,184
- Issue date Jun 13, 2006
- Korea Research Institute of Standards of Science
- Jung Hyung Kim
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Electron density measurement and plasma process control system usin...
- Patent number 6,861,844
- Issue date Mar 1, 2005
- Tokyo Electron Limited
- Joseph T. Verdeyen
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Structure and the method for measuring the spectral content of an e...
- Patent number 6,806,650
- Issue date Oct 19, 2004
- Tokyo Electron Limited
- Wayne L. Johnson
- G01 - MEASURING TESTING
Information Patent Grant
Plasma density information measuring method, probe used for measuri...
- Patent number 6,744,211
- Issue date Jun 1, 2004
- Nissin Inc.
- Hideo Sugai
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method and apparatus for determination and control of plasma state
- Patent number 6,713,969
- Issue date Mar 30, 2004
- Tokyo Electron Limited
- Murray Sirkis
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Plasma density measuring method and apparatus, and plasma processin...
- Patent number 6,541,982
- Issue date Apr 1, 2003
- Canon Kabushiki Kaisha
- Hideo Kitagawa
- G01 - MEASURING TESTING
Information Patent Grant
Plasma density information measuring method, probe used for measuri...
- Patent number 6,339,297
- Issue date Jan 15, 2002
- Nissin Inc.
- Hideo Sugai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for determining of absolute plasma parameters
- Patent number 5,861,752
- Issue date Jan 19, 1999
- Michael Klick
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for generating high-density sheet plasma mirro...
- Patent number 5,814,942
- Issue date Sep 29, 1998
- The United States of America as represented by the Secretary of the Navy
- Joseph Mathew
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method for determining absolute plasma parameters
- Patent number 5,705,931
- Issue date Jan 6, 1998
- Adolph Slaby Instituut Forschungsgesellschaft fur Plasmatechnologie und Mikro...
- Michael Klick
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
3513382
- Patent number 3,513,382
- Issue date May 19, 1970
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
3473116
- Patent number 3,473,116
- Issue date Oct 14, 1969
- B64 - AIRCRAFT AVIATION COSMONAUTICS

Patents Applicationslast 30 patents

Information Patent Application
Harmonic Derived Arc Detector
- Publication number 20100201371
- Publication date Aug 12, 2010
- MKS Instruments, Inc.
- John Valcore
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
PLANAR TYPE FREQUENCY SHIFT PROBE FOR MEASURING PLASMA ELECTRON DEN...
- Publication number 20090230973
- Publication date Sep 17, 2009
- National University Corporation Nagoya University
- Hideo Sugai
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Harmonic Derived Arc Detector
- Publication number 20080197854
- Publication date Aug 21, 2008
- MKS Instruments, Inc.
- John Valcore
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
APPARATUS FOR MONITORING ELECTRON DENSITY AND ELECTRON TEMPERATURE...
- Publication number 20080000585
- Publication date Jan 3, 2008
- Korea Research Institute of Standards and Science
- Jung Hyung Kim
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Plasma electron density measuring and monitoring device
- Publication number 20050016683
- Publication date Jan 27, 2005
- Korea research Institute of Standards and Science
- Jung Hyung Kim
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Method and apparatus for determination and control of plasma state
- Publication number 20030141822
- Publication date Jul 31, 2003
- TOKYO ELECTRON LIMITED
- Murray Sirkis
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Structure and the method for measuring the spectral content of an e...
- Publication number 20030052664
- Publication date Mar 20, 2003
- Wayne L. Johnson
- G01 - MEASURING TESTING
Information Patent Application
Plasma density information measuring method, probe used for measuri...
- Publication number 20020047543
- Publication date Apr 25, 2002
- NISSIN INC.
- Hideo Sugai
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Plasma density measuring method and apparatus, and plasma processin...
- Publication number 20010024114
- Publication date Sep 27, 2001
- Hideo Kitagawa
- G01 - MEASURING TESTING

by using microwaves

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Ignition apparatus including spark plug that generates plasma

Method for plasma dynamic cancellation for hypersonic vehicles

Harmonic derived arc detector

Planar type frequency shift probe for measuring plasma electron den...

Harmonic derived arc detector

Plasma electron density measuring and monitoring device

Electron density measurement and plasma process control system usin...

Structure and the method for measuring the spectral content of an e...

Plasma density information measuring method, probe used for measuri...

Method and apparatus for determination and control of plasma state

Plasma density measuring method and apparatus, and plasma processin...

Plasma density information measuring method, probe used for measuri...

Method and apparatus for determining of absolute plasma parameters

Method and apparatus for generating high-density sheet plasma mirro...

Method for determining absolute plasma parameters

3513382

3473116

Patents Applicationslast 30 patents

Harmonic Derived Arc Detector

PLANAR TYPE FREQUENCY SHIFT PROBE FOR MEASURING PLASMA ELECTRON DEN...

Harmonic Derived Arc Detector

APPARATUS FOR MONITORING ELECTRON DENSITY AND ELECTRON TEMPERATURE...

Plasma electron density measuring and monitoring device

Method and apparatus for determination and control of plasma state

Structure and the method for measuring the spectral content of an e...

Plasma density information measuring method, probe used for measuri...

Plasma density measuring method and apparatus, and plasma processin...