-
-
-
-
-
-
Illuminated level
-
Patent number 8,434,237
-
Issue date May 7, 2013
-
Denis Lafreniere
-
G01 - MEASURING TESTING
-
-
-
-
-
Plummet level
-
Patent number 6,167,631
-
Issue date Jan 2, 2001
-
Wen Chin Lin
-
G01 - MEASURING TESTING
-
Level controller
-
Patent number 5,822,870
-
Issue date Oct 20, 1998
-
Ro King-Yang
-
G01 - MEASURING TESTING
-
-
-
-
-
Inclinometer
-
Patent number 4,429,470
-
Issue date Feb 7, 1984
-
Jeco Co., Ltd.
-
Noboru Watanabe
-
G01 - MEASURING TESTING
-
Inclinometers
-
Patent number 4,426,788
-
Issue date Jan 24, 1984
-
Toyota Jidosha Kabushiki Kaisha
-
Hisashi Hirose
-
G01 - MEASURING TESTING
-
-
Sensitive tiltmeter
-
Patent number 3,997,976
-
Issue date Dec 21, 1976
-
Massachusetts Institute of Technology
-
Yao T. Li
-
G01 - MEASURING TESTING
-
3889627
-
Patent number 3,889,627
-
Issue date Jun 17, 1975
-
G01 - MEASURING TESTING
-
3707772
-
Patent number 3,707,772
-
Issue date Jan 2, 1973
-
G01 - MEASURING TESTING
-
3587176
-
Patent number 3,587,176
-
Issue date Jun 28, 1971
-
E21 - EARTH DRILLING MINING
-
3490153
-
Patent number 3,490,153
-
Issue date Jan 20, 1970
-
G01 - MEASURING TESTING
-
3238631
-
Patent number 3,238,631
-
Issue date Mar 8, 1966
-
G01 - MEASURING TESTING
-
2499737
-
Patent number 2,499,737
-
Issue date Mar 7, 1950
-
G01 - MEASURING TESTING
-
2181444
-
Patent number 2,181,444
-
Issue date Nov 28, 1939
-
G01 - MEASURING TESTING
-
2113062
-
Patent number 2,113,062
-
Issue date Apr 5, 1938
-
G01 - MEASURING TESTING
-
2111673
-
Patent number 2,111,673
-
Issue date Mar 22, 1938
-
G01 - MEASURING TESTING
-
1966714
-
Patent number 1,966,714
-
Issue date Jul 17, 1934
-
G01 - MEASURING TESTING