by using radiation

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H05H1/0012

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HELECTRICITY H05Electric techniques H05HPLASMA TECHNIQUE PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS H05H1/00Generating plasma Handling plasma

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H05H1/0012by using radiation

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Patents Grantslast 30 patents

Information Patent Grant
Target structure for enhanced electron screening
- Patent number 10,264,661
- Issue date Apr 16, 2019
- Google Inc.
- David K. Fork
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Unignited plasma state discrimination device and unignited plasma s...
- Patent number 9,699,878
- Issue date Jul 4, 2017
- Kyosan Electric Mfg. Co., Ltd.
- Itsuo Yuzurihara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and technique to control laser effects through tuning of par...
- Patent number 9,268,194
- Issue date Feb 23, 2016
- PM & AM Research
- Kevin Kremeyer
- F41 - WEAPONS
Information Patent Grant
Device and use of the device for measuring the density and/or the e...
- Patent number 9,113,543
- Issue date Aug 18, 2015
- Ruhr-Universität Bochum
- Ralf Peter Brinkmann
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Capacitively-coupled electrostatic (CCE) probe arrangement for dete...
- Patent number 8,164,349
- Issue date Apr 24, 2012
- Lam Research Corporation
- Jean-Paul Booth
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method and apparatus for photon-assisted evaluation of a plasma
- Patent number 7,982,187
- Issue date Jul 19, 2011
- Alvaro Garcia de Gorordo
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Beam profile monitor with accurate horizontal and vertical beam pro...
- Patent number 6,972,551
- Issue date Dec 6, 2005
- UT-Battelle, LLC
- Charles C. Havener
- G01 - MEASURING TESTING
Information Patent Grant
Device for measuring plasma properties
- Patent number 4,707,147
- Issue date Nov 17, 1987
- Hokkaido University
- Yoshiaki Aoki
- G01 - MEASURING TESTING
Information Patent Grant
Radiative opacity and emissivity measuring device
- Patent number 4,597,933
- Issue date Jul 1, 1986
- The United States of America as represented by the Secretary of the Navy
- Barrett H. Ripin
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Plasma monitor
- Patent number 4,569,592
- Issue date Feb 11, 1986
- Hitachi, Ltd.
- Hisajiro Osada
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Apparatus for recording emissions from a rapidly generated plasma f...
- Patent number 4,542,290
- Issue date Sep 17, 1985
- The United States of America as represented by the United States Department o...
- Tai Ho Tan
- G01 - MEASURING TESTING
Information Patent Grant
Proximity focused streak tube and camera using the same
- Patent number 4,310,857
- Issue date Jan 12, 1982
- Albert J. Lieber
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Target Structure For Enhanced Electron Screening
- Publication number 20190045617
- Publication date Feb 7, 2019
- Google Inc.
- David K. Fork
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
UNIGNITED PLASMA STATE DISCRIMINATION DEVICE AND UNIGNITED PLASMA S...
- Publication number 20160295675
- Publication date Oct 6, 2016
- KYOSAN ELECTRIC MFG. CO., LTD.
- Itsuo Yuzurihara
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Method and Technique to Control Laser Effects Through Tuning of Par...
- Publication number 20140231679
- Publication date Aug 21, 2014
- PM & AM Research
- Kevin Kremeyer
- G02 - OPTICS
Information Patent Application
DEVICE AND USE OF THE DEVICE FOR MEASURING THE DENSITY AND/OR THE E...
- Publication number 20130160523
- Publication date Jun 27, 2013
- RUHR-UNIVERSITÄT BOCHUM
- Ralf Peter Brinkmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR PHOTON-ASSISTED EVALUATION OF A PLASMA
- Publication number 20100090106
- Publication date Apr 15, 2010
- Alvaro Garcia de Gorordo
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
CAPACITIVELY-COUPLED ELECTROSTATIC (CCE) PROBE ARRANGEMENT FOR DETE...
- Publication number 20100006417
- Publication date Jan 14, 2010
- Jean-Paul Booth
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
SYSTEM FOR DETECTING PLASMA REACTION AND METHOD FOR USING THE SAME
- Publication number 20080223299
- Publication date Sep 18, 2008
- Cheng-Jer Yang
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
Beam profile monitor with accurate horizontal and vertical beam pro...
- Publication number 20050068048
- Publication date Mar 31, 2005
- Charles C. Havener
- G01 - MEASURING TESTING

by using radiation

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Target structure for enhanced electron screening

Unignited plasma state discrimination device and unignited plasma s...

Method and technique to control laser effects through tuning of par...

Device and use of the device for measuring the density and/or the e...

Capacitively-coupled electrostatic (CCE) probe arrangement for dete...

Method and apparatus for photon-assisted evaluation of a plasma

Beam profile monitor with accurate horizontal and vertical beam pro...

Device for measuring plasma properties

Radiative opacity and emissivity measuring device

Plasma monitor

Apparatus for recording emissions from a rapidly generated plasma f...

Proximity focused streak tube and camera using the same

Patents Applicationslast 30 patents

Target Structure For Enhanced Electron Screening

UNIGNITED PLASMA STATE DISCRIMINATION DEVICE AND UNIGNITED PLASMA S...

Method and Technique to Control Laser Effects Through Tuning of Par...

DEVICE AND USE OF THE DEVICE FOR MEASURING THE DENSITY AND/OR THE E...

METHOD AND APPARATUS FOR PHOTON-ASSISTED EVALUATION OF A PLASMA

CAPACITIVELY-COUPLED ELECTROSTATIC (CCE) PROBE ARRANGEMENT FOR DETE...

SYSTEM FOR DETECTING PLASMA REACTION AND METHOD FOR USING THE SAME

Beam profile monitor with accurate horizontal and vertical beam pro...